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Mohsen Hossein Mardi
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San Jose, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Micro device with adaptable thermal management device
Patent number
12,048,083
Issue date
Jul 23, 2024
Xilinx, Inc.
Mohsen H. Mardi
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Remote active cooling heat exchanger and antenna system with the same
Patent number
11,476,556
Issue date
Oct 18, 2022
Xilinx, Inc.
Mohsen H. Mardi
F28 - HEAT EXCHANGE IN GENERAL
Information
Patent Grant
Method and apparatus of package enabled ESD protection
Patent number
11,043,484
Issue date
Jun 22, 2021
Xilinx, Inc.
Hong Shi
G01 - MEASURING TESTING
Information
Patent Grant
Multiple insertion testing of test socket
Patent number
10,838,018
Issue date
Nov 17, 2020
Xilinx, Inc.
David M. Mahoney
G01 - MEASURING TESTING
Information
Patent Grant
Test system and method of testing a wafer for integrated circuit de...
Patent number
10,823,759
Issue date
Nov 3, 2020
Xilinx, Inc.
Lik Huay Lim
G01 - MEASURING TESTING
Information
Patent Grant
Method of assigning contact elements associated with an integrated...
Patent number
10,783,308
Issue date
Sep 22, 2020
Xilinix, Inc.
Lik Huay Lim
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Chip package assembly with power management integrated circuit and...
Patent number
10,665,579
Issue date
May 26, 2020
Xilinx, Inc.
Stephen M. Trimberger
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Probe head securing mechanism for probe assembly
Patent number
10,613,137
Issue date
Apr 7, 2020
Xilinx, Inc.
Mohsen H. Mardi
G01 - MEASURING TESTING
Information
Patent Grant
Probe head assembly
Patent number
10,571,517
Issue date
Feb 25, 2020
Xilinx, Inc.
Mohsen H. Mardi
G01 - MEASURING TESTING
Information
Patent Grant
Integrated circuit package testing system
Patent number
10,564,212
Issue date
Feb 18, 2020
Xilinx, Inc.
Mohsen H. Mardi
G01 - MEASURING TESTING
Information
Patent Grant
Chip package test system
Patent number
10,539,610
Issue date
Jan 21, 2020
Xilinx, Inc.
Mohsen H. Mardi
G01 - MEASURING TESTING
Information
Patent Grant
Testing system for lid-less integrated circuit packages
Patent number
10,527,670
Issue date
Jan 7, 2020
Xilinx, Inc.
Gamal Refai-Ahmed
G01 - MEASURING TESTING
Information
Patent Grant
Versatile testing system
Patent number
10,520,544
Issue date
Dec 31, 2019
Xilinx, Inc.
Mohsen H. Mardi
G01 - MEASURING TESTING
Information
Patent Grant
Pusher pin having a non-electrically conductive portion
Patent number
10,367,279
Issue date
Jul 30, 2019
Xilinx, Inc.
Mohsen H. Mardi
G01 - MEASURING TESTING
Information
Patent Grant
Modular testing system with versatile robot
Patent number
10,168,384
Issue date
Jan 1, 2019
Xilinx, Inc.
Mohsen H. Mardi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and apparatus for assembling and testing a multi-integrated...
Patent number
10,096,502
Issue date
Oct 9, 2018
Xilinx, Inc.
Gamal Refai-Ahmed
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Integrated circuit package, and methods and tools for fabricating t...
Patent number
9,947,560
Issue date
Apr 17, 2018
Xilinx, Inc.
Mohsen H. Mardi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for tracking interposer dies in a silicon stac...
Patent number
9,236,367
Issue date
Jan 12, 2016
Xilinx, Inc.
Cinti X. Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Transmission line via structure
Patent number
9,123,738
Issue date
Sep 1, 2015
Xilinx, Inc.
David M. Mahoney
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for tracking interposer dies in a silicon stac...
Patent number
8,987,009
Issue date
Mar 24, 2015
Xilinx, Inc.
Cinti X. Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Corner structure for IC die
Patent number
8,659,169
Issue date
Feb 25, 2014
Xilinx, Inc.
Mohsen H. Mardi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods and apparatus for testing of integrated circuits
Patent number
8,542,029
Issue date
Sep 24, 2013
Xilinx, Inc.
Mohsen Hossein Mardi
G05 - CONTROLLING REGULATING
Information
Patent Grant
Shorted test structure
Patent number
8,493,071
Issue date
Jul 23, 2013
Xilinx, Inc.
Mohsen H. Mardi
G01 - MEASURING TESTING
Information
Patent Grant
Hybrid probe card
Patent number
8,310,253
Issue date
Nov 13, 2012
Xilinx, Inc.
Mohsen H. Mardi
G01 - MEASURING TESTING
Information
Patent Grant
High-speed contactor interconnect with circuitry
Patent number
8,269,516
Issue date
Sep 18, 2012
Xilinx, Inc.
Mohsen H. Mardi
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for testing of integrated circuits
Patent number
8,269,519
Issue date
Sep 18, 2012
Xilinx, Inc.
Mohsen Hossein Mardi
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for preventing probe card oxidation
Patent number
8,269,518
Issue date
Sep 18, 2012
Xilinx, Inc.
Elvin P. Dang
G01 - MEASURING TESTING
Information
Patent Grant
Method of utilizing an interposer in an automated test system and a...
Patent number
7,888,954
Issue date
Feb 15, 2011
Xilinx, Inc.
Mohsen H. Mardi
G01 - MEASURING TESTING
Information
Patent Grant
Socket for an integrated circuit and a method of providing a connec...
Patent number
7,837,481
Issue date
Nov 23, 2010
Xilinx, Inc.
David M. Mahoney
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor component having test pads and method and apparatus f...
Patent number
7,737,439
Issue date
Jun 15, 2010
Xilinx, Inc.
Mohsen Hossein Mardi
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Patents Applications
last 30 patents
Information
Patent Application
MICRO DEVICE WITH ADAPTABLE THERMAL MANAGEMENT DEVICE
Publication number
20230180379
Publication date
Jun 8, 2023
Xilinx, Inc.
Mohsen H. MARDI
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
TEST SYSTEM AND METHOD OF TESTING A WAFER FOR INTEGRATED CIRCUIT DE...
Publication number
20200141976
Publication date
May 7, 2020
Xilinx, Inc.
Lik Huay Lim
G01 - MEASURING TESTING
Information
Patent Application
PROBE HEAD SECURING MECHANISM FOR PROBE ASSEMBLY
Publication number
20190170816
Publication date
Jun 6, 2019
Xilinx, Inc.
Mohsen H. Mardi
G01 - MEASURING TESTING
Information
Patent Application
PUSHER PIN HAVING A NON-ELECTRICALLY CONDUCTIVE PORTION
Publication number
20190131728
Publication date
May 2, 2019
Xilinx, Inc.
Mohsen H. Mardi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
BALANCED CONFORMING FORCE MECHANISM FOR INTEGRATED CIRCUIT PACKAGE...
Publication number
20190128950
Publication date
May 2, 2019
Xilinx, Inc.
Mohsen H. Mardi
G01 - MEASURING TESTING
Information
Patent Application
UNIVERSAL CONFORMING WORKPRESS MECHANISM FOR SEMICONDUCTOR AND OTHE...
Publication number
20190128956
Publication date
May 2, 2019
Xilinx, Inc.
Mohsen H. Mardi
G01 - MEASURING TESTING
Information
Patent Application
TESTING SYSTEM FOR LID-LESS INTEGRATED CIRCUIT PACKAGES
Publication number
20180284187
Publication date
Oct 4, 2018
Xilinx, Inc.
Gamal Refai-Ahmed
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR ASSEMBLING AND TESTING A MULTI-INTEGRATED...
Publication number
20180144963
Publication date
May 24, 2018
Xilinx, Inc.
Gamal Refai-Ahmed
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
VERSATILE TESTING SYSTEM
Publication number
20180059174
Publication date
Mar 1, 2018
Xilinx, Inc.
Mohsen H. Mardi
G01 - MEASURING TESTING
Information
Patent Application
MODULAR TESTING SYSTEM WITH VERSATILE ROBOT
Publication number
20180017619
Publication date
Jan 18, 2018
Xilinx, Inc.
Mohsen H. Mardi
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Application
CHIP PACKAGE ASSEMBLY WITH POWER MANAGEMENT INTEGRATED CIRCUIT AND...
Publication number
20170236809
Publication date
Aug 17, 2017
Xilinx, Inc.
Stephen M. Trimberger
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CORNER STRUCTURE FOR IC DIE
Publication number
20120074589
Publication date
Mar 29, 2012
Xilinx, Inc.
Mohsen H. Mardi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Semiconductor component having test pads and method and apparatus f...
Publication number
20070221920
Publication date
Sep 27, 2007
Xilinx, Inc.
Mohsen Hossein Mardi
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Semiconductor component having test pads and method and apparatus f...
Publication number
20070218573
Publication date
Sep 20, 2007
Xilinx, Inc.
Mohsen Hossein Mardi
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
MULTI-SOCKET BOARD FOR OPEN/SHORT TESTER
Publication number
20040017216
Publication date
Jan 29, 2004
Xilinx, Inc.
Mohsen Hossein Mardi
G01 - MEASURING TESTING