Moran Zaberchik

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Ahuzat Barak, IL

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Patents Grantslast 30 patents

Information Patent Grant
Selection of regions of interest for measurement of misregistration...
- Patent number 11,640,117
- Issue date May 2, 2023
- KLA Corporation
- Roie Volkovich
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for measuring and correcting misregistration between layers...
- Patent number 11,302,544
- Issue date Apr 12, 2022
- KLA-Tencor Corporation
- Roie Volkovich
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Overlay measurement using phase and amplitude modeling
- Patent number 10,622,238
- Issue date Apr 14, 2020
- KLA-Tencor Corporation
- Nadav Gutman
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR MEASURING AND CORRECTING MISREGISTRATION BETWEEN LAYERS...
- Publication number 20220199437
- Publication date Jun 23, 2022
- KLA-Tencor Corporation
- Roie Volkovich
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SELECTION OF REGIONS OF INTEREST FOR MEASUREMENT OF MISREGISTRATION...
- Publication number 20210364932
- Publication date Nov 25, 2021
- Roie Volkovich
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD FOR MEASURING AND CORRECTING MISREGISTRATION BETWEEN LAYERS...
- Publication number 20200312687
- Publication date Oct 1, 2020
- KLA-Tencor Corporation
- Roie Volkovich
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Overlay Measurement Using Phase and Amplitude Modeling
- Publication number 20190378737
- Publication date Dec 12, 2019
- KLA-Tencor Corporation
- Nadav Gutman
- G06 - COMPUTING CALCULATING COUNTING