Morgan Johnson

Person

Beaverton, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Stacked and folded above motherboard interposer
- Patent number 10,884,955
- Issue date Jan 5, 2021
- Morgan/Weiss Technologies Inc.
- Morgan Johnson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wafer testing system and associated methods of use and manufacture
- Patent number 10,571,489
- Issue date Feb 25, 2020
- Aaron Durbin
- G01 - MEASURING TESTING
Information Patent Grant
Interposer with high bandwidth connections between a central proces...
- Patent number 10,423,544
- Issue date Sep 24, 2019
- MORGAN / WEISS TECHNOLOGIES INC.
- Morgan Johnson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Designed asperity contactors, including nanospikes, for semiconduct...
- Patent number 9,733,272
- Issue date Aug 15, 2017
- Translarity, Inc.
- Douglas A. Preston
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer prober integrated with full-wafer contacter
- Patent number 9,612,278
- Issue date Apr 4, 2017
- Translarity, Inc.
- Morgan T. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Wafer testing system and associated methods of use and manufacture
- Patent number 9,612,259
- Issue date Apr 4, 2017
- Translarity, Inc.
- Aaron Durbin
- G01 - MEASURING TESTING
Information Patent Grant
Designed asperity contactors, including nanospikes, for semiconduct...
- Patent number 9,494,618
- Issue date Nov 15, 2016
- Translarity, Inc.
- Douglas A. Preston
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Full-water test and burn-in mechanism
- Patent number RE46075
- Issue date Jul 19, 2016
- Translarity, Inc.
- Morgan T. Johnson
- 001 -
Information Patent Grant
Above motherboard interposer with quarter wavelength electrical paths
- Patent number 9,357,648
- Issue date May 31, 2016
- Morgan/Weiss Technologies Inc.
- Morgan Johnson
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Translators coupleable to opposing surfaces of microelectronic subs...
- Patent number 9,222,965
- Issue date Dec 29, 2015
- Translarity, Inc.
- Morgan T. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Maintaining a wafer/wafer translator pair in an attached state free...
- Patent number 9,176,186
- Issue date Nov 3, 2015
- Translarity, Inc.
- Aaron Durbin
- G01 - MEASURING TESTING
Information Patent Grant
Maintaining a wafer/wafer translator pair in an attached state free...
- Patent number 9,146,269
- Issue date Sep 29, 2015
- Translarity, Inc.
- Aaron Durbin
- G01 - MEASURING TESTING
Information Patent Grant
Above motherboard interposer with quarter wavelength electrical paths
- Patent number 9,086,874
- Issue date Jul 21, 2015
- Morgan/Weiss Technologies Inc.
- Morgan Johnson
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Wafer prober integrated with full-wafer contactor
- Patent number 9,052,355
- Issue date Jun 9, 2015
- Translarity, Inc.
- Morgan T. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Motherboard substrate having no memory interconnects
- Patent number 8,908,384
- Issue date Dec 9, 2014
- Morgan/Weiss Technologies Inc.
- Morgan Johnson
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Apparatus for thinning, testing and singulating a semiconductor wafer
- Patent number 8,889,526
- Issue date Nov 18, 2014
- Advanced Inquiry Systems, Inc.
- Morgan T. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Wafer testing system and associated methods of use and manufacture
- Patent number 8,872,533
- Issue date Oct 28, 2014
- Advanced Inquiry Systems, Inc.
- Aaron Durbin
- G01 - MEASURING TESTING
Information Patent Grant
Translators coupleable to opposing surfaces of microelectronic subs...
- Patent number 8,779,789
- Issue date Jul 15, 2014
- Advanced Inquiry Systems, Inc.
- Morgan T. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for multi-planar edge-extended wafer translator
- Patent number 8,704,544
- Issue date Apr 22, 2014
- Advanced Inquiry Systems, Inc.
- Morgan T. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Methods of adding pads and one or more interconnect layers to the p...
- Patent number 8,697,456
- Issue date Apr 15, 2014
- Advanced Inquiry Systems, Inc.
- Morgan T Johnson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of adding pads and one or more interconnect layers to the p...
- Patent number 8,476,630
- Issue date Jul 2, 2013
- Advanced Inquiry Systems, Inc.
- Morgan T. Johnson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and apparatus for thinning, testing and singulating a semic...
- Patent number 8,461,024
- Issue date Jun 11, 2013
- Advanced Inquiry Systems, Inc.
- Morgan T. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Wafer testing systems and associated methods of use and manufacture
- Patent number 8,405,414
- Issue date Mar 26, 2013
- Advanced Inquiry Systems, Inc.
- Aaron Durbin
- G01 - MEASURING TESTING
Information Patent Grant
Maintaining a wafer/wafer translator pair in an attached state free...
- Patent number 8,362,797
- Issue date Jan 29, 2013
- Advanced Inquiry Systems, Inc.
- Aaron Durbin
- G01 - MEASURING TESTING
Information Patent Grant
Above motherboard interposer with peripheral circuits
- Patent number 8,363,418
- Issue date Jan 29, 2013
- Morgan/Weiss Technologies Inc.
- Morgan Johnson
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Methods of adding pads and one or more interconnect layers to the p...
- Patent number 8,088,634
- Issue date Jan 3, 2012
- Morgan T. Johnson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and apparatus for thinning, testing and singulating a semic...
- Patent number 8,076,216
- Issue date Dec 13, 2011
- Advanced Inquiry Systems, Inc.
- Morgan T. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for multi-modal wafer testing
- Patent number 7,960,986
- Issue date Jun 14, 2011
- Advanced Inquiry Systems, Inc.
- Morgan T. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Variable width conductive lines having substantially constant imped...
- Patent number 7,875,826
- Issue date Jan 25, 2011
- Efficere, Inc.
- William A. Miller
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Wafer translator having a silicon core isolated from signal paths b...
- Patent number 7,791,174
- Issue date Sep 7, 2010
- Advanced Inquiry Systems, Inc.
- Morgan T. Johnson
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
STACKED AND FOLDED ABOVE MOTHERBOARD INTERPOSER
- Publication number 20200019519
- Publication date Jan 16, 2020
- MORGAN / WEISS TECHNOLOGIES INC.
- Morgan Johnson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTERPOSER WITH HIGH BANDWIDTH CONNECTIONS BETWEEN A CENTRAL PROCES...
- Publication number 20190196985
- Publication date Jun 27, 2019
- MORGAN / WEISS TECHNOLOGIES INC.
- Morgan Johnson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DESIGNED ASPERITY CONTACTORS, INCLUDING NANOSPIKES, FOR SEMICONDUCT...
- Publication number 20180003737
- Publication date Jan 4, 2018
- TRANSLARITY, INC.
- Douglas A. Preston
- G01 - MEASURING TESTING
Information Patent Application
WAFER TESTING SYSTEM AND ASSOCIATED METHODS OF USE AND MANUFACTURE
- Publication number 20170219629
- Publication date Aug 3, 2017
- TRANSLARITY, INC.
- Aaron Durbin
- G01 - MEASURING TESTING
Information Patent Application
WAFER PROBER INTEGRATED WITH FULL-WAFER CONTACTOR
- Publication number 20170219627
- Publication date Aug 3, 2017
- TRANSLARITY, INC.
- Morgan T. Johnson
- G01 - MEASURING TESTING
Information Patent Application
DESIGNED ASPERITY CONTACTORS, INCLUDING NANOSPIKES, FOR SEMICONDUCT...
- Publication number 20170074904
- Publication date Mar 16, 2017
- TRANSLARITY, INC.
- Douglas A. Preston
- G01 - MEASURING TESTING
Information Patent Application
INTERDIGITIZED POLYSYMMETRIC FANOUTS, AND ASSOCIATED SYSTEMS AND ME...
- Publication number 20170023616
- Publication date Jan 26, 2017
- TRANSLARITY, INC.
- Morgan T. Johnson
- G01 - MEASURING TESTING
Information Patent Application
LOST MOTION GASKET FOR SEMICONDUCTOR TEST, AND ASSOCIATED SYSTEMS A...
- Publication number 20170023642
- Publication date Jan 26, 2017
- TRANSLARITY, INC.
- Douglas A. Preston
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR GENERATING AND PRESERVING VACUUM BETWEEN SE...
- Publication number 20170016954
- Publication date Jan 19, 2017
- TRANSLARITY, INC.
- Nikolai Kalnin
- G01 - MEASURING TESTING
Information Patent Application
ABOVE MOTHERBOARD INTERPOSER WITH QUARTER WAVELENGTH ELECTRICAL PATHS
- Publication number 20160259738
- Publication date Sep 8, 2016
- MORGAN / WEISS TECHNOLOGIES INC.
- Morgan Johnson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WAFER PROBER INTEGRATED WITH FULL-WAFER CONTACTER
- Publication number 20160033569
- Publication date Feb 4, 2016
- TRANSLARITY, INC.
- Morgan T. Johnson
- G01 - MEASURING TESTING
Information Patent Application
ABOVE MOTHERBOARD INTERPOSER WITH QUARTER WAVELENGTH ELECTRICAL PATHS
- Publication number 20150313017
- Publication date Oct 29, 2015
- MORGAN / WEISS TECHNOLOGIES INC.
- Morgan Johnson
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
METHODS AND APPARATUS FOR THINNING, TESTING AND SINGULATING A SEMIC...
- Publication number 20150293171
- Publication date Oct 15, 2015
- ADVANCED INQUIRY SYSTEMS, INC.
- Morgan T. Johnson
- G01 - MEASURING TESTING
Information Patent Application
WAFER TESTING SYSTEM AND ASSOCIATED METHODS OF USE AND MANUFACTURE
- Publication number 20150015292
- Publication date Jan 15, 2015
- ADVANCED INQUIRY SYSTEMS, INC.
- Aaron Durbin
- G01 - MEASURING TESTING
Information Patent Application
TRANSLATORS COUPLEABLE TO OPPOSING SURFACES OF MICROELECTRONIC SUBS...
- Publication number 20150015299
- Publication date Jan 15, 2015
- ADVANCED INQUIRY SYSTEMS, INC.
- Morgan T. Johnson
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MULTI-PLANAR EDGE-EXTENDED WAFER TRANSLATOR
- Publication number 20140347086
- Publication date Nov 27, 2014
- ADVANCED INQUIRY SYSTEMS, INC.
- Morgan T. Johnson
- G01 - MEASURING TESTING
Information Patent Application
MAINTAINING A WAFER/WAFER TRANSLATOR PAIR IN AN ATTACHED STATE FREE...
- Publication number 20140197858
- Publication date Jul 17, 2014
- ADVANCED INQUIRY SYSTEMS, INC.
- Aaron Durbin
- G01 - MEASURING TESTING
Information Patent Application
DESIGNED ASPERITY CONTACTORS, INCLUDING NANOSPIKES, FOR SEMICONDUCT...
- Publication number 20140179031
- Publication date Jun 26, 2014
- ADVANCED INQUIRY SYSTEMS, INC.
- Douglas A. Preston
- G01 - MEASURING TESTING
Information Patent Application
DESIGNED ASPERITY CONTACTORS, INCLUDING NANOSPIKES FOR SEMICONDUCTO...
- Publication number 20140176174
- Publication date Jun 26, 2014
- ADVANCED INQUIRY SYSTEMS, INC.
- Douglas A. Preston
- G01 - MEASURING TESTING
Information Patent Application
METHODS OF ADDING PADS AND ONE OR MORE INTERCONNECT LAYERS TO THE P...
- Publication number 20130337587
- Publication date Dec 19, 2013
- ADVANCED INQUIRY SYSTEMS, INC.
- Morgan T. Johnson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER TESTING SYSTEM AND ASSOCIATED METHODS OF USE AND MANUFACTURE
- Publication number 20130314115
- Publication date Nov 28, 2013
- ADVANCED INQUIRY SYSTEMS, INC.
- Aaron Durbin
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS FOR THINNING, TESTING AND SINGULATING A SEMIC...
- Publication number 20130271174
- Publication date Oct 17, 2013
- Morgan T. Johnson
- G01 - MEASURING TESTING
Information Patent Application
TRANSLATORS COUPLEABLE TO OPPOSING SURFACES OF MICROELECTRONIC SUBS...
- Publication number 20130265071
- Publication date Oct 10, 2013
- ADVANCED INQUIRY SYSTEMS, INC.
- Morgan Johnson
- G01 - MEASURING TESTING
Information Patent Application
MAINTAINING A WAFER/WAFER TRANSLATOR PAIR IN AN ATTACHED STATE FREE...
- Publication number 20130187675
- Publication date Jul 25, 2013
- ADVANCED INQUIRY SYSTEMS, INC.
- Aaron Durbin
- G01 - MEASURING TESTING
Information Patent Application
Wafer prober integrated with full-wafer contacter
- Publication number 20130021052
- Publication date Jan 24, 2013
- Advanced Inquiry Systems, Inc.
- Morgan T. Johnson
- G01 - MEASURING TESTING
Information Patent Application
HEAT MANAGEMENT IN AN ABOVE MOTHERBOARD INTERPOSER WITH PERIPHERAL...
- Publication number 20120300392
- Publication date Nov 29, 2012
- Morgan Johnson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ABOVE MOTHERBOARD INTERPOSER WITH PERIPHERAL CIRCUITS
- Publication number 20120262875
- Publication date Oct 18, 2012
- Morgan Johnson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ABOVE MOTHERBOARD INTERPOSER WITH QUARTER WAVELENGTH ELECTICAL PATHS
- Publication number 20120262862
- Publication date Oct 18, 2012
- Morgan Johnson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MOTHERBOARD SUBSTRATE HAVING NO MEMORY INTERCONNECTS
- Publication number 20120262863
- Publication date Oct 18, 2012
- Morgan Johnson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS OF ADDING PADS AND ONE OR MORE INTERCONNECT LAYERS TO THE P...
- Publication number 20120156811
- Publication date Jun 21, 2012
- Advanced Inquiry Systems, Inc.
- Morgan T. Johnson
- H01 - BASIC ELECTRIC ELEMENTS

Morgan Johnson

Person

Patents Grantslast 30 patents

Stacked and folded above motherboard interposer

Wafer testing system and associated methods of use and manufacture

Interposer with high bandwidth connections between a central proces...

Designed asperity contactors, including nanospikes, for semiconduct...

Wafer prober integrated with full-wafer contacter

Wafer testing system and associated methods of use and manufacture

Designed asperity contactors, including nanospikes, for semiconduct...

Full-water test and burn-in mechanism

Above motherboard interposer with quarter wavelength electrical paths

Translators coupleable to opposing surfaces of microelectronic subs...

Maintaining a wafer/wafer translator pair in an attached state free...

Maintaining a wafer/wafer translator pair in an attached state free...

Above motherboard interposer with quarter wavelength electrical paths

Wafer prober integrated with full-wafer contactor

Motherboard substrate having no memory interconnects

Apparatus for thinning, testing and singulating a semiconductor wafer

Wafer testing system and associated methods of use and manufacture

Translators coupleable to opposing surfaces of microelectronic subs...

Method and apparatus for multi-planar edge-extended wafer translator

Methods of adding pads and one or more interconnect layers to the p...

Methods of adding pads and one or more interconnect layers to the p...

Methods and apparatus for thinning, testing and singulating a semic...

Wafer testing systems and associated methods of use and manufacture

Maintaining a wafer/wafer translator pair in an attached state free...

Above motherboard interposer with peripheral circuits

Methods of adding pads and one or more interconnect layers to the p...

Methods and apparatus for thinning, testing and singulating a semic...

Methods and apparatus for multi-modal wafer testing

Variable width conductive lines having substantially constant imped...

Wafer translator having a silicon core isolated from signal paths b...

Patents Applicationslast 30 patents

STACKED AND FOLDED ABOVE MOTHERBOARD INTERPOSER

INTERPOSER WITH HIGH BANDWIDTH CONNECTIONS BETWEEN A CENTRAL PROCES...

DESIGNED ASPERITY CONTACTORS, INCLUDING NANOSPIKES, FOR SEMICONDUCT...

WAFER TESTING SYSTEM AND ASSOCIATED METHODS OF USE AND MANUFACTURE

WAFER PROBER INTEGRATED WITH FULL-WAFER CONTACTOR

DESIGNED ASPERITY CONTACTORS, INCLUDING NANOSPIKES, FOR SEMICONDUCT...

INTERDIGITIZED POLYSYMMETRIC FANOUTS, AND ASSOCIATED SYSTEMS AND ME...

LOST MOTION GASKET FOR SEMICONDUCTOR TEST, AND ASSOCIATED SYSTEMS A...

SYSTEMS AND METHODS FOR GENERATING AND PRESERVING VACUUM BETWEEN SE...

ABOVE MOTHERBOARD INTERPOSER WITH QUARTER WAVELENGTH ELECTRICAL PATHS

WAFER PROBER INTEGRATED WITH FULL-WAFER CONTACTER

ABOVE MOTHERBOARD INTERPOSER WITH QUARTER WAVELENGTH ELECTRICAL PATHS

METHODS AND APPARATUS FOR THINNING, TESTING AND SINGULATING A SEMIC...

WAFER TESTING SYSTEM AND ASSOCIATED METHODS OF USE AND MANUFACTURE

TRANSLATORS COUPLEABLE TO OPPOSING SURFACES OF MICROELECTRONIC SUBS...

METHOD AND APPARATUS FOR MULTI-PLANAR EDGE-EXTENDED WAFER TRANSLATOR

MAINTAINING A WAFER/WAFER TRANSLATOR PAIR IN AN ATTACHED STATE FREE...

DESIGNED ASPERITY CONTACTORS, INCLUDING NANOSPIKES, FOR SEMICONDUCT...

DESIGNED ASPERITY CONTACTORS, INCLUDING NANOSPIKES FOR SEMICONDUCTO...

METHODS OF ADDING PADS AND ONE OR MORE INTERCONNECT LAYERS TO THE P...

WAFER TESTING SYSTEM AND ASSOCIATED METHODS OF USE AND MANUFACTURE

METHODS AND APPARATUS FOR THINNING, TESTING AND SINGULATING A SEMIC...

TRANSLATORS COUPLEABLE TO OPPOSING SURFACES OF MICROELECTRONIC SUBS...

MAINTAINING A WAFER/WAFER TRANSLATOR PAIR IN AN ATTACHED STATE FREE...

Wafer prober integrated with full-wafer contacter

HEAT MANAGEMENT IN AN ABOVE MOTHERBOARD INTERPOSER WITH PERIPHERAL...

ABOVE MOTHERBOARD INTERPOSER WITH PERIPHERAL CIRCUITS

ABOVE MOTHERBOARD INTERPOSER WITH QUARTER WAVELENGTH ELECTICAL PATHS

MOTHERBOARD SUBSTRATE HAVING NO MEMORY INTERCONNECTS

METHODS OF ADDING PADS AND ONE OR MORE INTERCONNECT LAYERS TO THE P...