Moshe Finarov

Person

Rechovot, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Pattern transfer printing systems and methods
- Patent number 11,910,537
- Issue date Feb 20, 2024
- Wuhan DR Laser Technology Corp,. LTD
- Gad Igra
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Grant
Solar cell bus bars
- Patent number 9,960,286
- Issue date May 1, 2018
- Utilight Ltd.
- Moshe Finarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Lateral shift measurement using an optical technique
- Patent number 9,785,059
- Issue date Oct 10, 2017
- Nova Measuring Instruments Ltd.
- Boaz Brill
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Light induced patterning
- Patent number 9,616,524
- Issue date Apr 11, 2017
- Utilight Ltd.
- Mikhael Matusovsky
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Lateral shift measurement using an optical technique
- Patent number 9,310,192
- Issue date Apr 12, 2016
- Nova Measuring Instruments, Ltd.
- Boaz Brill
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring apparatus and method particularly useful in photolithogr...
- Patent number 9,291,911
- Issue date Mar 22, 2016
- Nova Measuring Instruments Ltd.
- Giora Dishon
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for measuring patterned structures
- Patent number 9,184,102
- Issue date Nov 10, 2015
- Nova Measuring Instruments Ltd.
- Moshe Finarov
- G01 - MEASURING TESTING
Information Patent Grant
Lateral shift measurement using an optical technique
- Patent number 8,941,832
- Issue date Jan 27, 2015
- Nova Measuring Instruments, Ltd.
- Boaz Brill
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for endpoint detection
- Patent number 8,858,296
- Issue date Oct 14, 2014
- Nova Measuring Instruments Ltd.
- Moshe Finarov
- B24 - GRINDING POLISHING
Information Patent Grant
Monitoring apparatus and method particularly useful in photolithogr...
- Patent number 8,780,320
- Issue date Jul 15, 2014
- Nova Measuring Instuments Ltd.
- Giora Dishon
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Solar cells and method of manufacturing thereof
- Patent number 8,652,872
- Issue date Feb 18, 2014
- Utilight Ltd.
- Moshe Finarov
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Thin films measurement method and system
- Patent number 8,564,793
- Issue date Oct 22, 2013
- Nova Measuring Instruments Ltd.
- Yoel Cohen
- G01 - MEASURING TESTING
Information Patent Grant
Vacuum UV based optical measuring method and system
- Patent number 8,552,394
- Issue date Oct 8, 2013
- Nova Measuring Instruments Ltd.
- Moshe Finarov
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for measuring patterned structures
- Patent number 8,531,678
- Issue date Sep 10, 2013
- Nova Measuring Instruments, Ltd.
- Moshe Finarov
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring apparatus and method particularly useful in photolithogr...
- Patent number 8,482,715
- Issue date Jul 9, 2013
- Nova Measuring Instruments Ltd.
- Giora Dishon
- G01 - MEASURING TESTING
Information Patent Grant
Lateral shift measurement using an optical technique
- Patent number 8,363,219
- Issue date Jan 29, 2013
- Nova Measuring Instruments Ltd.
- Boaz Brill
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for endpoint detection
- Patent number 8,277,281
- Issue date Oct 2, 2012
- Nova Measuring Instruments Ltd.
- Moshe Finarov
- B24 - GRINDING POLISHING
Information Patent Grant
Spectrometric optical method and system providing required signal-t...
- Patent number 8,049,882
- Issue date Nov 1, 2011
- Nova Measuring Instruments Ltd.
- Moshe Finarov
- G01 - MEASURING TESTING
Information Patent Grant
Thin films measurement method and system
- Patent number 8,040,532
- Issue date Oct 18, 2011
- Nova Measuring Instruments Ltd.
- Yoel Cohen
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for measuring patterned structures
- Patent number 8,023,122
- Issue date Sep 20, 2011
- Nova Measuring Instruments Ltd.
- Moshe Finarov
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for endpoint detection
- Patent number 7,927,184
- Issue date Apr 19, 2011
- Nova Measuring Instruments Ltd.
- Moshe Finarov
- B24 - GRINDING POLISHING
Information Patent Grant
Method and system for measuring patterned structures
- Patent number 7,864,343
- Issue date Jan 4, 2011
- Nova Measuring Instruments Ltd.
- Moshe Finarov
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for measuring patterned structures
- Patent number 7,864,344
- Issue date Jan 4, 2011
- Nova Measuring Instruments Ltd.
- Moshe Finarov
- G01 - MEASURING TESTING
Information Patent Grant
Two dimensional beam deflector
- Patent number RE41906
- Issue date Nov 2, 2010
- Nova Measuring Instruments, Ltd.
- Moshe Finarov
- 356 - Optics: measuring and testing
Information Patent Grant
Monitoring apparatus and method particularly useful in photolithogr...
- Patent number 7,821,614
- Issue date Oct 26, 2010
- Nova Measuring Instruments Ltd.
- Giora Dishon
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for measuring patterned structures
- Patent number 7,791,740
- Issue date Sep 7, 2010
- Nova Measuring Instruments Ltd.
- Moshe Finarov
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for measuring patterned structures
- Patent number 7,760,368
- Issue date Jul 20, 2010
- Nova Measuring Instruments Ltd.
- Moshe Finarov
- G01 - MEASURING TESTING
Information Patent Grant
Lateral shift measurement using an optical technique
- Patent number 7,715,007
- Issue date May 11, 2010
- Nova Measuring Instruments, Ltd.
- Boaz Brill
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for measuring patterned structures
- Patent number 7,663,768
- Issue date Feb 16, 2010
- Nova Measuring Instruments Ltd.
- Moshe Finarov
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for measuring patterned structures
- Patent number 7,626,710
- Issue date Dec 1, 2009
- Nova Measuring Instruments Ltd.
- Moshe Finarov
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PATTERN TRANSFER PRINTING SYSTEMS AND METHODS
- Publication number 20240208242
- Publication date Jun 27, 2024
- Wuhan DR Laser Technology Corp,. LTD
- Gad IGRA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PATTERN TRANSFER PRINTING OF MULTI-LAYERED FEATURES
- Publication number 20230207720
- Publication date Jun 29, 2023
- WUHAN DR LASER TECHNOLOGY CORP.,LTD
- Eyal Cohen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PATTERN TRANSFER PRINTING SYSTEMS AND METHODS
- Publication number 20230148357
- Publication date May 11, 2023
- Wuhan Dr Laser Technology Corp., Ltd.
- Gad IGRA
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Application
DYNAMIC PATTERN TRANSFER PRINTING AND PATTERN TRANSFER SHEETS WITH...
- Publication number 20230071007
- Publication date Mar 9, 2023
- Wuhan Dr Laser Technology Corp., Ltd.
- Amir Noy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LATERAL SHIFT MEASUREMENT USING AN OPTICAL TECHNIQUE
- Publication number 20180031983
- Publication date Feb 1, 2018
- NOVA MEASURING INSTRUMENTS LTD.
- Boaz BRILL
- G01 - MEASURING TESTING
Information Patent Application
LATERAL SHIFT MEASUREMENT USING AN OPTICAL TECHNIQUE
- Publication number 20160327384
- Publication date Nov 10, 2016
- NOVA MEASURING INSTRUMENTS LTD.
- Boaz BRILL
- G01 - MEASURING TESTING
Information Patent Application
Solar Cell Bus Bars
- Publication number 20160254394
- Publication date Sep 1, 2016
- Utilight Ltd.
- Moshe FINAROV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR MEASURING PATTERNED STRUCTURES
- Publication number 20160109225
- Publication date Apr 21, 2016
- Nova Measuring Instruments Ltd.
- Moshe Finarov
- G01 - MEASURING TESTING
Information Patent Application
LATERAL SHIFT MEASUREMENT USING AN OPTICAL TECHNIQUE
- Publication number 20150124255
- Publication date May 7, 2015
- NOVA MEASURING INSTRUMENTS LTD.
- Boaz BRILL
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR MEASURING PATTERNED STRUCTURES
- Publication number 20150009504
- Publication date Jan 8, 2015
- NOVA MEASURING INSTRUMENTS LTD.
- Moshe FINAROV
- G01 - MEASURING TESTING
Information Patent Application
MONITORING APPARATUS AND METHOD PARTICULARLY USEFUL IN PHOTOLITHOGR...
- Publication number 20140320837
- Publication date Oct 30, 2014
- Giora DISHON
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR MEASURING PATTERNED STRUCTURES
- Publication number 20140009760
- Publication date Jan 9, 2014
- NOVA MEASURING INSTRUMENTS LTD.
- Moshe FINAROV
- G01 - MEASURING TESTING
Information Patent Application
MONITORING APPARATUS AND METHOD PARTICULARLY USEFUL IN PHOTOLITHOGR...
- Publication number 20130293872
- Publication date Nov 7, 2013
- Giora DISHON
- G01 - MEASURING TESTING
Information Patent Application
LATERAL SHIFT MEASUREMENT USING AN OPTICAL TECHNIQUE
- Publication number 20130128270
- Publication date May 23, 2013
- NOVA MEASURING INSTRUMENTS LTD.
- Boaz BRILL
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR ENDPOINT DETECTION
- Publication number 20130087098
- Publication date Apr 11, 2013
- NOVA MEASURING INSTRUMENTS LTD.
- Moshe Finarov
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Application
METHOD OF LASER PROCESSING
- Publication number 20120268939
- Publication date Oct 25, 2012
- Moshe Finarov
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
THIN FILMS MEASUREMENT METHOD AND SYSTEM
- Publication number 20120044506
- Publication date Feb 23, 2012
- NOVA MEASURING INSTRUMENTS LTD.
- Yoel Cohen
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR MEASURING PATTERNED STRUCTURES
- Publication number 20120008147
- Publication date Jan 12, 2012
- NOVA MEASURING INSTRUMENTS LTD. of Weizmann Scientific Park
- Moshe FINAROV
- G01 - MEASURING TESTING
Information Patent Application
SOLAR CELLS AND METHOD OF MANUFACTURING THEREOF
- Publication number 20110197965
- Publication date Aug 18, 2011
- Utilight Ltd.
- Moshe Finarov
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METHOD AND SYSTEM FOR ENDPOINT DETECTION
- Publication number 20110189926
- Publication date Aug 4, 2011
- NOVA MEASURING INSTRUMENTS LTD.
- Moshe Finarov
- B24 - GRINDING POLISHING
Information Patent Application
LIGHT INDUCED PATTERNING
- Publication number 20110097550
- Publication date Apr 28, 2011
- Utillight Ltd.
- Mikhael Matusovsky
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
METHOD AND APPARATUS FOR THIN FILM QUALITY CONTROL
- Publication number 20110089348
- Publication date Apr 21, 2011
- Moshe Finarov
- G01 - MEASURING TESTING
Information Patent Application
MONITORING APPARATUS AND METHOD PARTICULARLY USEFUL IN PHOTOLITHOGR...
- Publication number 20110037957
- Publication date Feb 17, 2011
- NOVA MEASURING INSTRUMENTS LTD.
- Giora Dishon
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR MEASURING PATTERNED STRUCTURES
- Publication number 20100324865
- Publication date Dec 23, 2010
- NOVA MEASURING INSTRUMENTS LTD. of Weizmann Scientific Park
- Moshe Finarov
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR MEASURING PATTERNED STRUCTURES
- Publication number 20100280807
- Publication date Nov 4, 2010
- NOVA MEASURING INSTRUMENTS LTD.
- Moshe Finarov
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR MEASURING PATTERNED STRUCTURES
- Publication number 20100280808
- Publication date Nov 4, 2010
- NOVA MEASURING INSTRUMENTS LTD. of Weizmann Scientific Park
- Moshe Finarov
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR THIN FILM QUALITY CONTROL
- Publication number 20100220316
- Publication date Sep 2, 2010
- Moshe Finarov
- G01 - MEASURING TESTING
Information Patent Application
LATERAL SHIFT MEASUREMENT USING AN OPTICAL TECHNIQUE
- Publication number 20100214566
- Publication date Aug 26, 2010
- Nova Measuring Instruments, Ltd.
- Boaz Brill
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR SUBSTRATE HANDLING
- Publication number 20100204820
- Publication date Aug 12, 2010
- Moshe Finarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR MEASURING PATTERNED STRUCTURES
- Publication number 20100121627
- Publication date May 13, 2010
- NOVA MEASURING INSTRUMENTS LTD. of Weizmann Scientific Park
- Moshe Finarov
- G01 - MEASURING TESTING

Moshe Finarov

Person

Patents Grantslast 30 patents

Pattern transfer printing systems and methods

Solar cell bus bars

Lateral shift measurement using an optical technique

Light induced patterning

Lateral shift measurement using an optical technique

Monitoring apparatus and method particularly useful in photolithogr...

Method and system for measuring patterned structures

Lateral shift measurement using an optical technique

Method and system for endpoint detection

Monitoring apparatus and method particularly useful in photolithogr...

Solar cells and method of manufacturing thereof

Thin films measurement method and system

Vacuum UV based optical measuring method and system

Method and system for measuring patterned structures

Monitoring apparatus and method particularly useful in photolithogr...

Lateral shift measurement using an optical technique

Method and system for endpoint detection

Spectrometric optical method and system providing required signal-t...

Thin films measurement method and system

Method and system for measuring patterned structures

Method and system for endpoint detection

Method and system for measuring patterned structures

Method and system for measuring patterned structures

Two dimensional beam deflector

Monitoring apparatus and method particularly useful in photolithogr...

Method and system for measuring patterned structures

Method and system for measuring patterned structures

Lateral shift measurement using an optical technique

Method and system for measuring patterned structures

Method and system for measuring patterned structures

Patents Applicationslast 30 patents

PATTERN TRANSFER PRINTING SYSTEMS AND METHODS

PATTERN TRANSFER PRINTING OF MULTI-LAYERED FEATURES

PATTERN TRANSFER PRINTING SYSTEMS AND METHODS

DYNAMIC PATTERN TRANSFER PRINTING AND PATTERN TRANSFER SHEETS WITH...

LATERAL SHIFT MEASUREMENT USING AN OPTICAL TECHNIQUE

LATERAL SHIFT MEASUREMENT USING AN OPTICAL TECHNIQUE

Solar Cell Bus Bars

METHOD AND SYSTEM FOR MEASURING PATTERNED STRUCTURES

LATERAL SHIFT MEASUREMENT USING AN OPTICAL TECHNIQUE

METHOD AND SYSTEM FOR MEASURING PATTERNED STRUCTURES

MONITORING APPARATUS AND METHOD PARTICULARLY USEFUL IN PHOTOLITHOGR...

METHOD AND SYSTEM FOR MEASURING PATTERNED STRUCTURES

MONITORING APPARATUS AND METHOD PARTICULARLY USEFUL IN PHOTOLITHOGR...

LATERAL SHIFT MEASUREMENT USING AN OPTICAL TECHNIQUE

METHOD AND SYSTEM FOR ENDPOINT DETECTION

METHOD OF LASER PROCESSING

THIN FILMS MEASUREMENT METHOD AND SYSTEM

METHOD AND SYSTEM FOR MEASURING PATTERNED STRUCTURES

SOLAR CELLS AND METHOD OF MANUFACTURING THEREOF

METHOD AND SYSTEM FOR ENDPOINT DETECTION

LIGHT INDUCED PATTERNING

METHOD AND APPARATUS FOR THIN FILM QUALITY CONTROL

MONITORING APPARATUS AND METHOD PARTICULARLY USEFUL IN PHOTOLITHOGR...

METHOD AND SYSTEM FOR MEASURING PATTERNED STRUCTURES

METHOD AND SYSTEM FOR MEASURING PATTERNED STRUCTURES

METHOD AND SYSTEM FOR MEASURING PATTERNED STRUCTURES

METHOD AND APPARATUS FOR THIN FILM QUALITY CONTROL

LATERAL SHIFT MEASUREMENT USING AN OPTICAL TECHNIQUE

APPARATUS AND METHOD FOR SUBSTRATE HANDLING

METHOD AND SYSTEM FOR MEASURING PATTERNED STRUCTURES