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Moshe Sarfaty
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Cupertino, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Optical system for detection and characterization of abnormal tissu...
Patent number
9,566,030
Issue date
Feb 14, 2017
LS BIOPATH, INC.
Moshe Sarfaty
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Methods for optical identification and characterization of abnormal...
Patent number
9,554,743
Issue date
Jan 31, 2017
LS BIOPATH, INC.
Moshe Sarfaty
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Methods for detection and characterization of abnormal tissue and c...
Patent number
8,865,076
Issue date
Oct 21, 2014
LS Biopath, Inc.
Moshe Sarfaty
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Electrical methods for detection and characterization of abnormal t...
Patent number
8,437,845
Issue date
May 7, 2013
LS Biopath, Inc.
Moshe Sarfaty
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Electrical systems for detection and characterization of abnormal t...
Patent number
8,417,328
Issue date
Apr 9, 2013
LS Biopath, Inc.
Moshe Sarfaty
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Method, system and medium for controlling manufacturing process usi...
Patent number
7,970,588
Issue date
Jun 28, 2011
Applied Materials, Inc.
Yuri Kokotov
G05 - CONTROLLING REGULATING
Information
Patent Grant
Method, system and medium for controlling manufacturing process usi...
Patent number
7,668,702
Issue date
Feb 23, 2010
Applied Materials, Inc.
Yuri Kokotov
G05 - CONTROLLING REGULATING
Information
Patent Grant
Material composition analysis system and method
Patent number
7,358,494
Issue date
Apr 15, 2008
KLA-Tencor Technologies Corporation
Ying Gao
G01 - MEASURING TESTING
Information
Patent Grant
Direct non contact measurement
Patent number
7,046,019
Issue date
May 16, 2006
KLA-Tencor Technologies Corporation
Moshe Sarfaty
G01 - MEASURING TESTING
Information
Patent Grant
Eddy-optic sensor for object inspection
Patent number
7,042,558
Issue date
May 9, 2006
Applied Materials
Moshe Sarfaty
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for process monitoring
Patent number
6,936,842
Issue date
Aug 30, 2005
Applied Materials, Inc.
Suraj Rengarajan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for monitoring a process by employing principa...
Patent number
6,896,763
Issue date
May 24, 2005
Lalitha Balasubramhanya
G01 - MEASURING TESTING
Information
Patent Grant
In-situ film thickness measurement using spectral interference at g...
Patent number
6,888,639
Issue date
May 3, 2005
Applied Materials, Inc.
Andreas Goebel
G01 - MEASURING TESTING
Information
Patent Grant
Current leakage measurement
Patent number
6,855,569
Issue date
Feb 15, 2005
KLA-Tencor Technologies Corporation
Moshe Sarfaty
G01 - MEASURING TESTING
Information
Patent Grant
Detecting chemiluminescent radiation in the cleaning of a substrate...
Patent number
6,843,881
Issue date
Jan 18, 2005
Applied Materials, Inc.
Bok Hoen Kim
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Detection of process endpoint through monitoring fluctuation of out...
Patent number
6,745,095
Issue date
Jun 1, 2004
Applied Materials, Inc.
Yuval Ben-Dov
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Monitoring of film characteristics during plasma-based semi-conduct...
Patent number
6,633,391
Issue date
Oct 14, 2003
Applied Materials, Inc.
Hakeem Oluseyi
G01 - MEASURING TESTING
Information
Patent Grant
Situ measurement of film nitridation using optical emission spectro...
Patent number
6,627,463
Issue date
Sep 30, 2003
Applied Materials, Inc.
Moshe Sarfaty
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Eddy-optic sensor for object inspection
Patent number
6,608,495
Issue date
Aug 19, 2003
Applied Materials, Inc.
Moshe Sarfaty
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus employing optical emission spectroscopy to det...
Patent number
6,603,538
Issue date
Aug 5, 2003
Applied Materials, Inc.
Hakeem Oluseyi
G01 - MEASURING TESTING
Information
Patent Grant
Film thickness control using spectral interferometry
Patent number
6,589,869
Issue date
Jul 8, 2003
Applied Materials, Inc.
Moshe Sarfaty
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for monitoring a process by employing principa...
Patent number
6,521,080
Issue date
Feb 18, 2003
Applied Materials Inc.
Lalitha Balasubramhanya
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for monitoring the process state of a semicond...
Patent number
6,455,437
Issue date
Sep 24, 2002
Applied Materials Inc.
Jed Davidow
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Film thickness control using spectral interferometry
Patent number
6,413,867
Issue date
Jul 2, 2002
Applied Materials, Inc.
Moshe Sarfaty
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for monitoring a process by employing principa...
Patent number
6,368,975
Issue date
Apr 9, 2002
Applied Materials, Inc.
Lalitha Balasubramhanya
G05 - CONTROLLING REGULATING
Patents Applications
last 30 patents
Information
Patent Application
METHODS FOR DETECTION AND CHARACTERIZATION OF ABNORMAL TISSUE AND C...
Publication number
20130230883
Publication date
Sep 5, 2013
LS Biopath, Inc.
Moshe Sarfaty
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL SYSTEM FOR DETECTION AND CHARACTERIZATION OF ABNORMAL TISSU...
Publication number
20100179436
Publication date
Jul 15, 2010
Moshe Sarfaty
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
ELECTRICAL SYSTEMS FOR DETECTION AND CHARACTERIZATION OF ABNORMAL T...
Publication number
20100121173
Publication date
May 13, 2010
Moshe Sarfaty
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
ELECTRICAL METHODS FOR DETECTION AND CHARACTERIZATION OF ABNORMAL T...
Publication number
20100106047
Publication date
Apr 29, 2010
LS Biopath, Inc.
Moshe Sarfaty
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
METHODS FOR OPTICAL IDENTIFICATION AND CHARACTERIZATION OF ABNORMAL...
Publication number
20100106025
Publication date
Apr 29, 2010
LS Biopath, Inc., a Delaware Corporation
Moshe Sarfaty
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
Method, system and medium for controlling manufacturing process usi...
Publication number
20080177408
Publication date
Jul 24, 2008
Yuri Kokotov
G05 - CONTROLLING REGULATING
Information
Patent Application
Integrated equipment set for forming a low K dielectric interconnec...
Publication number
20060246683
Publication date
Nov 2, 2006
APPLIED MATERIALS, INC.
Judon Tony Pan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Eddy current-capacitance sensor for conducting film characterization
Publication number
20040207395
Publication date
Oct 21, 2004
Moshe Sarfaty
G01 - MEASURING TESTING
Information
Patent Application
Differential measurement method using eddy-current sensing to resol...
Publication number
20040070393
Publication date
Apr 15, 2004
Moshe Sarfaty
G01 - MEASURING TESTING
Information
Patent Application
Method, system and medium for controlling manufacturing process usi...
Publication number
20040015335
Publication date
Jan 22, 2004
Applied Materials Israel Ltd.
Yuri Kokotov
G05 - CONTROLLING REGULATING
Information
Patent Application
Integrated equipment set for forming a low K dielectric interconnec...
Publication number
20040007325
Publication date
Jan 15, 2004
APPLIED MATERIALS, INC.
Judon Tony Pan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Detecting chemiluminescent radiation in the cleaning of a substrate...
Publication number
20030185966
Publication date
Oct 2, 2003
APPLIED MATERIALS, INC.
Bok Hoen Kim
B08 - CLEANING
Information
Patent Application
Method and apparatus for monitoring a process by employing principa...
Publication number
20030136511
Publication date
Jul 24, 2003
Lalitha Balasubramhanya
G05 - CONTROLLING REGULATING
Information
Patent Application
Spectral reflectance for in-situ film characteristic measurements
Publication number
20030133126
Publication date
Jul 17, 2003
Applied Materials, Inc.
Moshe Sarfaty
G01 - MEASURING TESTING
Information
Patent Application
In-situ film thickness measurement using spectral interference at g...
Publication number
20030090676
Publication date
May 15, 2003
Andreas Goebel
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for process monitoring
Publication number
20030032207
Publication date
Feb 13, 2003
Suraj Rengarajan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Eddy-optic sensor for object inspection
Publication number
20020130651
Publication date
Sep 19, 2002
APPLIED MATERIALS, INC.
Moshe Sarfaty
G01 - MEASURING TESTING
Information
Patent Application
Film thickness control using spectral interferometry
Publication number
20020119660
Publication date
Aug 29, 2002
Applied Materials, Inc.
Moshe Sarfaty
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method and apparatus for monitoring a process by employing principa...
Publication number
20020055259
Publication date
May 9, 2002
Lalitha Balasubramhanya
G01 - MEASURING TESTING