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Motohiro Kouno
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Kyoto, JP
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last 30 patents
Information
Patent Grant
Method and apparatus for measuring insulation film thickness of sem...
Patent number
5,568,252
Issue date
Oct 22, 1996
Dainippon Screen Manufacturing Co., Ltd.
Tatsufumi Kusuda
G01 - MEASURING TESTING
Information
Patent Grant
Non-destructive measuring sensor for semiconductor wafer and method...
Patent number
5,554,939
Issue date
Sep 10, 1996
Dainippon Screen Manufacturing Co., Ltd.
Sadao Hirae
G01 - MEASURING TESTING
Information
Patent Grant
Method of measuring electric charge of semiconductor wafer
Patent number
5,475,319
Issue date
Dec 12, 1995
Dainippon Screen Mfg. Co., Ltd.
Sadao Hirae
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for measuring lifetime of minority carriers in...
Patent number
5,444,389
Issue date
Aug 22, 1995
Dainippon Screen Mfg. Co., Ltd.
Sadao Hirae
G01 - MEASURING TESTING
Information
Patent Grant
Optical gap measuring device using frustrated internal reflection
Patent number
5,239,183
Issue date
Aug 24, 1993
Dainippon Screen Mfg. Co., Ltd.
Motohiro Kouno
G01 - MEASURING TESTING
Information
Patent Grant
Method of and apparatus for measuring electric characteristics of s...
Patent number
5,233,291
Issue date
Aug 3, 1993
Dainippon Screen Mfg. Co., Ltd.
Motohiro Kouno
G01 - MEASURING TESTING
Information
Patent Grant
Gap measuring device and method using frustrated internal reflection
Patent number
5,225,690
Issue date
Jul 6, 1993
Dainippon Screen Mfg. Co., Ltd.
Takamasa Sakai
G01 - MEASURING TESTING