Motohisa Nishihara

Person

Katsuta, JP

People

Patents Grantslast 30 patents

Information Patent Grant
X-ray tube and method for generating X-rays in the X-ray tube
- Patent number 4,891,831
- Issue date Jan 2, 1990
- Hitachi, Ltd.
- Akira Tanaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Composite circuit of bipolar transistors and field effect transistors
- Patent number 4,808,850
- Issue date Feb 28, 1989
- Hitachi, Ltd.
- Ikuro Masuda
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Image sensor
- Patent number 4,689,652
- Issue date Aug 25, 1987
- Hitachi, Ltd.
- Satoshi Shimada
- G02 - OPTICS
Information Patent Grant
Composite circuit of bipolar transistors and field effect transistors
- Patent number 4,661,723
- Issue date Apr 28, 1987
- Hitachi, Ltd.
- Ikuro Masuda
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor pressure transducer
- Patent number 4,527,428
- Issue date Jul 9, 1985
- Hitachi, Ltd.
- Satoshi Shimada
- G01 - MEASURING TESTING
Information Patent Grant
Capacitive pressure sensor
- Patent number 4,495,820
- Issue date Jan 29, 1985
- Hitachi, Ltd.
- Satoshi Shimada
- G01 - MEASURING TESTING
Information Patent Grant
Pressure sensor employing semiconductor strain gauge
- Patent number 4,480,478
- Issue date Nov 6, 1984
- Hitachi, Ltd.
- Hideo Sato
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor strain gauge
- Patent number 4,404,539
- Issue date Sep 13, 1983
- Hitachi, Ltd.
- Kazuji Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor pressure detector apparatus with zero-point temperatu...
- Patent number 4,337,665
- Issue date Jul 6, 1982
- Hitachi, Ltd.
- Hideo Sato
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor pressure sensor having plural pressure sensitive diap...
- Patent number 4,322,980
- Issue date Apr 6, 1982
- Hitachi, Ltd.
- Seikou Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Method of producing semiconductor displacement transducer
- Patent number 4,319,397
- Issue date Mar 16, 1982
- Hitachi, Ltd.
- Masanori Tanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor absolute pressure transducer assembly and method
- Patent number 4,295,115
- Issue date Oct 13, 1981
- Hitachi, Ltd.
- Minoru Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor strain gauge with elastic load plate
- Patent number 4,292,618
- Issue date Sep 29, 1981
- Hitachi, Ltd.
- Masanori Tanabe
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor absolute pressure transducer assembly and method
- Patent number 4,291,293
- Issue date Sep 22, 1981
- Hitachi, Ltd.
- Kazuji Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Capacitive pressure sensor
- Patent number 4,257,274
- Issue date Mar 24, 1981
- Hitachi, Ltd.
- Satoshi Shimada
- G01 - MEASURING TESTING
Information Patent Grant
Strain gauge pressure transducer apparatus having an improved imped...
- Patent number 4,233,848
- Issue date Nov 18, 1980
- Hitachi, Ltd.
- Hideo Sato
- G01 - MEASURING TESTING
Information Patent Grant
Nozzle head of an ink-jet printing apparatus with built-in fluid di...
- Patent number 4,216,477
- Issue date Aug 5, 1980
- Hitachi, Ltd.
- Yasumasa Matsuda
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Grant
Semiconductor pressure transducer
- Patent number 4,173,900
- Issue date Nov 13, 1979
- Hitachi, Ltd.
- Masanori Tanabe
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor strain gauge with temperature compensator
- Patent number 4,173,148
- Issue date Nov 6, 1979
- Hitachi, Ltd.
- Kazuji Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor transducer
- Patent number 4,166,384
- Issue date Sep 4, 1979
- Hitachi, Ltd.
- Yasumasa Matsuda
- G01 - MEASURING TESTING

Motohisa Nishihara

Person

Patents Grantslast 30 patents

X-ray tube and method for generating X-rays in the X-ray tube

Composite circuit of bipolar transistors and field effect transistors

Image sensor

Composite circuit of bipolar transistors and field effect transistors

Semiconductor pressure transducer

Capacitive pressure sensor

Pressure sensor employing semiconductor strain gauge

Semiconductor strain gauge

Semiconductor pressure detector apparatus with zero-point temperatu...

Semiconductor pressure sensor having plural pressure sensitive diap...

Method of producing semiconductor displacement transducer

Semiconductor absolute pressure transducer assembly and method

Semiconductor strain gauge with elastic load plate

Semiconductor absolute pressure transducer assembly and method

Capacitive pressure sensor

Strain gauge pressure transducer apparatus having an improved imped...

Nozzle head of an ink-jet printing apparatus with built-in fluid di...

Semiconductor pressure transducer

Semiconductor strain gauge with temperature compensator

Semiconductor transducer