Munehiro Kozuka

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Sample milling apparatus and method of adjustment therefor
- Patent number 12,266,502
- Issue date Apr 1, 2025
- Jeol Ltd.
- Munehiro Kozuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam processing apparatus and method for controlling operation...
- Patent number 11,929,238
- Issue date Mar 12, 2024
- Jeol Ltd.
- Tatsuhito Kimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Specimen machining device and information provision method
- Patent number 11,837,437
- Issue date Dec 5, 2023
- Jeol Ltd.
- Tatsuhito Kimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for measuring ion beam current, sample preparation appara...
- Patent number 10,861,672
- Issue date Dec 8, 2020
- Jeol Ltd.
- Munehiro Kozuka
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Sample Milling System and Apparatus and Method for Image Generation
- Publication number 20250006458
- Publication date Jan 2, 2025
- JEOL Ltd.
- Munehiro Kozuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and Method for Fabrication of Shield Plate
- Publication number 20240208762
- Publication date Jun 27, 2024
- JEOL Ltd.
- Tsutomu Negishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sample Milling Apparatus, Shield Plate, and Sample Milling Method
- Publication number 20240096584
- Publication date Mar 21, 2024
- JEOL Ltd.
- Munehiro Kozuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and Method for Milling Sample
- Publication number 20230197401
- Publication date Jun 22, 2023
- JEOL Ltd.
- Munehiro Kozuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Specimen Machining Device and Specimen Machining Method
- Publication number 20230015109
- Publication date Jan 19, 2023
- JEOL Ltd.
- Tatsuhito Kimura
- G02 - OPTICS
Information Patent Application
Specimen Machining Device and Specimen Machining Method
- Publication number 20220392739
- Publication date Dec 8, 2022
- JEOL Ltd.
- Munehiro Kozuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Specimen Machining Device and Information Provision Method
- Publication number 20220392744
- Publication date Dec 8, 2022
- JEOL Ltd.
- Tatsuhito Kimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sample Milling Apparatus and Method of Adjustment Therefor
- Publication number 20220285125
- Publication date Sep 8, 2022
- JEOL Ltd.
- Munehiro Kozuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Beam Processing Apparatus and Method for Controlling Operation...
- Publication number 20220238310
- Publication date Jul 28, 2022
- JEOL Ltd.
- Tatsuhito Kimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus for Measuring Ion Beam Current, Sample Preparation Appara...
- Publication number 20200266028
- Publication date Aug 20, 2020
- JEOL Ltd.
- Munehiro Kozuka
- H01 - BASIC ELECTRIC ELEMENTS

Munehiro Kozuka

Person

Patents Grantslast 30 patents

Sample milling apparatus and method of adjustment therefor

Ion beam processing apparatus and method for controlling operation...

Specimen machining device and information provision method

Apparatus for measuring ion beam current, sample preparation appara...

Patents Applicationslast 30 patents

Sample Milling System and Apparatus and Method for Image Generation

Apparatus and Method for Fabrication of Shield Plate

Sample Milling Apparatus, Shield Plate, and Sample Milling Method

Apparatus and Method for Milling Sample

Specimen Machining Device and Specimen Machining Method

Specimen Machining Device and Specimen Machining Method

Specimen Machining Device and Information Provision Method

Sample Milling Apparatus and Method of Adjustment Therefor

Ion Beam Processing Apparatus and Method for Controlling Operation...

Apparatus for Measuring Ion Beam Current, Sample Preparation Appara...