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Myungchul Jun
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San Jose, CA, US
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last 30 patents
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Patent Grant
Array testing method using electric bias stress for TFT array
Patent number
7,327,158
Issue date
Feb 5, 2008
Photon Dynamics, Inc.
Myungchul Jun
G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Patents Applications
last 30 patents
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Patent Application
ARRAY TESTING METHOD USING ELECTRIC BIAS STRESS FOR TFT ARRAY
Publication number
20080024157
Publication date
Jan 31, 2008
Photon Dynamics, Inc.
Myungchul Jun
G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS