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Naoji MORIYA
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Nara-city, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Fourier transform infrared spectrophotometer
Patent number
11,768,154
Issue date
Sep 26, 2023
Shimadzu Corporation
Hideaki Katsu
G01 - MEASURING TESTING
Information
Patent Grant
Gas absorption spectroscopic system and gas absorption spectroscopi...
Patent number
9,772,277
Issue date
Sep 26, 2017
Shimadzu Corporation
Takashi Muramatsu
G01 - MEASURING TESTING
Information
Patent Grant
Raman spectroscopic analyzer
Patent number
9,551,617
Issue date
Jan 24, 2017
Shimadzu Corporation
Takahide Hatahori
G01 - MEASURING TESTING
Information
Patent Grant
Resin type identification method and resin type identification appa...
Patent number
9,341,566
Issue date
May 17, 2016
Mitsubishi Electric Corporation
Masaru Kinugawa
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information
Patent Grant
Gas concentration measurement device
Patent number
8,508,739
Issue date
Aug 13, 2013
Shimadzu Corporation
Yousuke Hoshino
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for evaluating dielectrophoretic intensity of...
Patent number
8,313,628
Issue date
Nov 20, 2012
Shimadzu Corporation
Yoshio Tsunazawa
B03 - SEPARATION OF SOLID MATERIALS USING LIQUIDS OR USING PNEUMATIC TABLES O...
Information
Patent Grant
Optical measurement apparatus and electrode pair thereof
Patent number
8,164,749
Issue date
Apr 24, 2012
Shimadzu Corporation
Naoji Moriya
G01 - MEASURING TESTING
Information
Patent Grant
Analytical method for optical measurement
Patent number
8,107,074
Issue date
Jan 31, 2012
Shimadzu Corporation
Naoji Moriya
G01 - MEASURING TESTING
Information
Patent Grant
Optical measuring device
Patent number
7,911,610
Issue date
Mar 22, 2011
Shimadzu Corporation
Naoji Moriya
G01 - MEASURING TESTING
Information
Patent Grant
Optical measuring device and method, and nanoparticle measuring met...
Patent number
7,760,356
Issue date
Jul 20, 2010
Shimadzu Corporation
Naoji Moriya
G01 - MEASURING TESTING
Information
Patent Grant
Method of analysis in optical measurements
Patent number
7,626,698
Issue date
Dec 1, 2009
Shimadzu Corporation
Naoji Moriya
G01 - MEASURING TESTING
Information
Patent Grant
Optical sensor unit for measuring current and voltage of high frequ...
Patent number
7,057,792
Issue date
Jun 6, 2006
Oki Electric Industry Co., Ltd.
Yutaka Kadogawa
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic sensor with faraday element
Patent number
6,462,539
Issue date
Oct 8, 2002
Shimadzu Corporation
Naoji Moriya
G01 - MEASURING TESTING
Information
Patent Grant
Solid-state laser apparatus
Patent number
6,188,713
Issue date
Feb 13, 2001
Shimadzu Corporation
Masahiro Ihara
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Fourier Transform Infrared Spectrophotometer
Publication number
20220260485
Publication date
Aug 18, 2022
Shimadzu Corporation
Hideaki KATSU
G01 - MEASURING TESTING
Information
Patent Application
GAS ABSORPTION SPECTROSCOPIC DEVICE
Publication number
20210033528
Publication date
Feb 4, 2021
Shimadzu Corporation
Hideaki KATSU
G01 - MEASURING TESTING
Information
Patent Application
FIXED MIRROR, INTERFEROMETER, AND FOURIER TRANSFORM SPECTROPHOTOMETER
Publication number
20200400503
Publication date
Dec 24, 2020
Shimadzu Corporation
Hiromasa MARUNO
G01 - MEASURING TESTING
Information
Patent Application
FIXED MIRROR, INTERFEROMETER, AND FOURIER TRANSFORM SPECTROPHOTOMETER
Publication number
20200400504
Publication date
Dec 24, 2020
Shimadzu Corporation
Hiromasa MARUNO
G01 - MEASURING TESTING
Information
Patent Application
Solid-State Photodetector
Publication number
20200335542
Publication date
Oct 22, 2020
Tomohiro KARASAWA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
VOICE COIL MOTOR, AND MOVABLE MIRROR UNIT AND INTERFERENCE SPECTROP...
Publication number
20190186993
Publication date
Jun 20, 2019
Shimadzu Corporation
Hiromasa MARUNO
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
RAMAN SPECTROSCOPIC ANALYZER
Publication number
20160146668
Publication date
May 26, 2016
SHIMADZU CORPORATION
Takahide HATAHORI
G01 - MEASURING TESTING
Information
Patent Application
GAS ABSORPTION SPECTROSCOPIC SYSTEM AND GAS ABSORPTION SPECTROSCOPI...
Publication number
20150338342
Publication date
Nov 26, 2015
SHIMADZU CORPORATION
Takashi MURAMATSU
G01 - MEASURING TESTING
Information
Patent Application
RAMAN SPECTROSCOPIC ANALYZING APPARATUS
Publication number
20150015878
Publication date
Jan 15, 2015
Shimadzu Corporation
Naoji MORIYA
G01 - MEASURING TESTING
Information
Patent Application
RESIN TYPE IDENTIFICATION METHOD AND RESIN TYPE IDENTIFICATION APPA...
Publication number
20140203177
Publication date
Jul 24, 2014
Shimadzu Corporation
Masaru Kinugawa
G01 - MEASURING TESTING
Information
Patent Application
PLASTIC IDENTIFICATION DEVICE
Publication number
20140145083
Publication date
May 29, 2014
Shimadzu Corporation
Toru Yamaguchi
G01 - MEASURING TESTING
Information
Patent Application
FLOW CELL
Publication number
20140063494
Publication date
Mar 6, 2014
Takahide HATAHORI
G01 - MEASURING TESTING
Information
Patent Application
Gas Concentration Measurement Device
Publication number
20120188549
Publication date
Jul 26, 2012
Shimadzu Corporation
Yousuke Hoshino
G01 - MEASURING TESTING
Information
Patent Application
ANALYTICAL METHOD FOR OPTICAL MEASUREMENT
Publication number
20100201982
Publication date
Aug 12, 2010
Naoji Moriya
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL MEASUREMENT APPARATUS AND ELECTRODE PAIR THEREOF
Publication number
20100165342
Publication date
Jul 1, 2010
Naoji Moriya
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR OPTICAL MEASUREMENT
Publication number
20100149532
Publication date
Jun 17, 2010
Naoji Moriya
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR EVALUATING DIELECTROPHORETIC INTENSITY OF...
Publication number
20100012496
Publication date
Jan 21, 2010
Yoshio Tsunazawa
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL MEASURING DEVICE
Publication number
20090251695
Publication date
Oct 8, 2009
Naoji Moriya
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF ANALYSIS IN OPTICAL MEASUREMENTS
Publication number
20090128809
Publication date
May 21, 2009
Naoji Moriya
G01 - MEASURING TESTING
Information
Patent Application
Optical Measuring Device and Method, and Nanoparticle Measuring Met...
Publication number
20080192252
Publication date
Aug 14, 2008
Shimadzu Corporation
Naoji Moriya
G01 - MEASURING TESTING
Information
Patent Application
Optical sensor unit for measuring current and voltage of high frequ...
Publication number
20040041083
Publication date
Mar 4, 2004
Yutaka Kadogawa
G01 - MEASURING TESTING
Information
Patent Application
Magnetic sensor
Publication number
20020000804
Publication date
Jan 3, 2002
SHIMADZU CORPORATION
Naoji Moriya
G01 - MEASURING TESTING