Naoma Ban

Person

Hitachinaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Beam irradiation device
- Patent number 11,239,042
- Issue date Feb 1, 2022
- HITACHI HIGH-TECH CORPORATION
- Akira Ikegami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Beam irradiation device
- Patent number 10,832,886
- Issue date Nov 10, 2020
- HITACHI HIGH-TECH CORPORATION
- Akira Ikegami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 9,177,757
- Issue date Nov 3, 2015
- Hitachi High-Technologies Corporation
- Naoma Ban
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Surface observation apparatus and surface observation method
- Patent number 9,136,189
- Issue date Sep 15, 2015
- Hitachi High-Technologies Corporation
- Takehiro Hirai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Observation method and observation device
- Patent number 8,878,925
- Issue date Nov 4, 2014
- Hitachi High-Technologies Corporation
- Naoma Ban
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope and sample observation method
- Patent number 8,519,334
- Issue date Aug 27, 2013
- Hitachi High-Technologies Corporation
- Satoshi Tadaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and displacement detecting circuit
- Patent number 8,125,647
- Issue date Feb 28, 2012
- Hitachi High-Technologies Corporation
- Hiroshi Tsuji
- G01 - MEASURING TESTING
Information Patent Grant
Review method and review device
- Patent number 8,013,299
- Issue date Sep 6, 2011
- Hitachi High-Technologies Corporation
- Kenji Obara
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Beam Irradiation Device
- Publication number 20210027976
- Publication date Jan 28, 2021
- HITACHI HIGH-TECH CORPORATION
- Akira IKEGAMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged-Particle Beam Device
- Publication number 20190393014
- Publication date Dec 26, 2019
- Hitachi High-Technologies Corporation
- Yuta KAWAMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Beam Irradiation Device
- Publication number 20190287754
- Publication date Sep 19, 2019
- Hitachi High-Technologies Corporation
- Akira IKEGAMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20150170875
- Publication date Jun 18, 2015
- Hitachi High-Technologies Corporation
- Naoma Ban
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE AND SAMPLE OBSERVATION METHOD
- Publication number 20130037716
- Publication date Feb 14, 2013
- Hitachi High-Technologies Corporation
- Satoshi Tadaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OBSERVATION METHOD AND OBSERVATION DEVICE
- Publication number 20120300056
- Publication date Nov 29, 2012
- Hitachi High-Technologies Corporation
- Naoma Ban
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SURFACE OBSERVATION APPARATUS AND SURFACE OBSERVATION METHOD
- Publication number 20120044262
- Publication date Feb 23, 2012
- Takehiro Hirai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS AND DISPLACEMENT DETECTING CIRCUIT
- Publication number 20090225326
- Publication date Sep 10, 2009
- Hitachi High-Technologies Corporation
- Hiroshi Tsuji
- G01 - MEASURING TESTING
Information Patent Application
REVIEW METHOD AND REVIEW DEVICE
- Publication number 20090206259
- Publication date Aug 20, 2009
- Hitachi High-Technologies Corporation
- Kenji Obara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Report Search Method, Report Search System, and Reviewing Apparatus
- Publication number 20080263028
- Publication date Oct 23, 2008
- Hitachi High-Technologies Corporation
- Takehiro Hirai
- G06 - COMPUTING CALCULATING COUNTING

Person

Patents Grantslast 30 patents

Beam irradiation device

Beam irradiation device

Charged particle beam apparatus

Surface observation apparatus and surface observation method

Observation method and observation device

Scanning electron microscope and sample observation method

Charged particle beam apparatus and displacement detecting circuit

Review method and review device

Patents Applicationslast 30 patents

Beam Irradiation Device

Charged-Particle Beam Device

Beam Irradiation Device

CHARGED PARTICLE BEAM APPARATUS

SCANNING ELECTRON MICROSCOPE AND SAMPLE OBSERVATION METHOD

OBSERVATION METHOD AND OBSERVATION DEVICE

SURFACE OBSERVATION APPARATUS AND SURFACE OBSERVATION METHOD

CHARGED PARTICLE BEAM APPARATUS AND DISPLACEMENT DETECTING CIRCUIT

REVIEW METHOD AND REVIEW DEVICE

Report Search Method, Report Search System, and Reviewing Apparatus