Naoto Ban

Person

Sagamihara, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device and manufacturing method thereof including a p...
- Patent number 7,198,962
- Issue date Apr 3, 2007
- Hitachi, Ltd.
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing semiconductor apparatus
- Patent number 7,119,362
- Issue date Oct 10, 2006
- Renesas Technology Corp.
- Ryuji Kono
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device testing apparatus and semiconductor device man...
- Patent number 6,864,695
- Issue date Mar 8, 2005
- Renesas Technology Corp.
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device testing apparatus and method for manufacturing...
- Patent number 6,828,810
- Issue date Dec 7, 2004
- Renesas Technology Corp.
- Masatoshi Kanamaru
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor-device inspecting apparatus and a method for manufact...
- Patent number 6,774,654
- Issue date Aug 10, 2004
- Renesas Technology Corp.
- Masatoshi Kanamaru
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor inspection apparatus
- Patent number 6,714,030
- Issue date Mar 30, 2004
- Hitachi, Ltd.
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Fabrication method of semiconductor integrated circuit device and i...
- Patent number 6,696,849
- Issue date Feb 24, 2004
- Renesas Technology Corporation
- Naoto Ban
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device manufacturing method
- Patent number 6,573,112
- Issue date Jun 3, 2003
- Hitachi, Ltd.
- Ryuji Kono
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing substrate for inspecting semiconductor device
- Patent number 6,566,149
- Issue date May 20, 2003
- Hitachi, Ltd.
- Masatoshi Kanamaru
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and manufacturing method thereof including a p...
- Patent number 6,566,150
- Issue date May 20, 2003
- Hitachi, Ltd.
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Manufacture method for semiconductor inspection apparatus
- Patent number 6,548,315
- Issue date Apr 15, 2003
- Hitachi, Ltd.
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Process for manufacturing semiconductor device
- Patent number 6,511,857
- Issue date Jan 28, 2003
- Hitachi, Ltd.
- Ryuji Kono
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor-device inspecting apparatus and a method for manufact...
- Patent number 6,496,023
- Issue date Dec 17, 2002
- Hitachi, Ltd.
- Masatoshi Kanamaru
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device manufacturing method
- Patent number 6,479,305
- Issue date Nov 12, 2002
- Hitachi, Ltd.
- Ryuji Kono
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and manufacturing method thereof including a p...
- Patent number 6,455,335
- Issue date Sep 24, 2002
- Hitachi, Ltd.
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Manufacture method for semiconductor inspection apparatus
- Patent number 6,358,762
- Issue date Mar 19, 2002
- Hitachi, Ltd.
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and manufacturing method thereof including a p...
- Patent number 6,197,603
- Issue date Mar 6, 2001
- Hitachi, Ltd.
- Ryuji Kohno
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Fabrication method of semiconductor integrated circuit device and i...
- Publication number 20040135593
- Publication date Jul 15, 2004
- Naoto Ban
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device and manufacturing method thereof including a p...
- Publication number 20030203521
- Publication date Oct 30, 2003
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor inspection apparatus
- Publication number 20030189439
- Publication date Oct 9, 2003
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device testing apparatus and method for manufacturing...
- Publication number 20030122550
- Publication date Jul 3, 2003
- Masatoshi Kanamaru
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR-DEVICE INSPECTING APPARATUS AND A METHOD FOR MANUFACT...
- Publication number 20030102880
- Publication date Jun 5, 2003
- Masatoshi Kanamaru
- G01 - MEASURING TESTING
Information Patent Application
Method of manufacturing semiconductor apparatus
- Publication number 20030092206
- Publication date May 15, 2003
- Ryuji Kono
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device manufacturing method
- Publication number 20030027365
- Publication date Feb 6, 2003
- Hitachi, Ltd.
- Ryuji Kono
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and manufacturing method thereof including a p...
- Publication number 20020182796
- Publication date Dec 5, 2002
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Application
Manufacture method for semiconductor inspection apparatus
- Publication number 20020086451
- Publication date Jul 4, 2002
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE MANUFACTURING METHOD
- Publication number 20020064893
- Publication date May 30, 2002
- RYUJI KONO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Fabrication method of semiconductor integrated circuit device and i...
- Publication number 20020039802
- Publication date Apr 4, 2002
- Naoto Ban
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device testing apparatus and semiconductor device man...
- Publication number 20020033707
- Publication date Mar 21, 2002
- Ryuji Kohno
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Semiconductor device and manufacturing method thereof including a p...

Method of manufacturing semiconductor apparatus

Semiconductor device testing apparatus and semiconductor device man...

Semiconductor device testing apparatus and method for manufacturing...

Semiconductor-device inspecting apparatus and a method for manufact...

Semiconductor inspection apparatus

Fabrication method of semiconductor integrated circuit device and i...

Semiconductor device manufacturing method

Method for manufacturing substrate for inspecting semiconductor device

Semiconductor device and manufacturing method thereof including a p...

Manufacture method for semiconductor inspection apparatus

Process for manufacturing semiconductor device

Semiconductor-device inspecting apparatus and a method for manufact...

Semiconductor device manufacturing method

Semiconductor device and manufacturing method thereof including a p...

Manufacture method for semiconductor inspection apparatus

Semiconductor device and manufacturing method thereof including a p...

Patents Applicationslast 30 patents

Fabrication method of semiconductor integrated circuit device and i...

Semiconductor device and manufacturing method thereof including a p...

Semiconductor inspection apparatus

Semiconductor device testing apparatus and method for manufacturing...

SEMICONDUCTOR-DEVICE INSPECTING APPARATUS AND A METHOD FOR MANUFACT...

Method of manufacturing semiconductor apparatus

Semiconductor device manufacturing method

Semiconductor device and manufacturing method thereof including a p...

Manufacture method for semiconductor inspection apparatus

SEMICONDUCTOR DEVICE MANUFACTURING METHOD

Fabrication method of semiconductor integrated circuit device and i...

Semiconductor device testing apparatus and semiconductor device man...