Naoya Watanabe

Person

Chiba, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Cell detachment method
- Patent number 8,859,279
- Issue date Oct 14, 2014
- Hitachi High-Tech Science Corporation
- Amiko Nihei
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Cantilever, cantilever system, scanning probe microscope, mass sens...
- Patent number 8,214,915
- Issue date Jul 3, 2012
- SII NanoTechnology Inc.
- Masatsugu Shigeno
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Self displacement sensing cantilever and scanning probe microscope
- Patent number 8,161,568
- Issue date Apr 17, 2012
- SII NanoTechnology Inc.
- Masato Iyoki
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Sensor for observations in liquid environments and observation appa...
- Patent number 7,945,965
- Issue date May 17, 2011
- SII NanoTechnology Inc.
- Naoya Watanabe
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Cantilever and cantilever manufacturing method
- Patent number 7,823,470
- Issue date Nov 2, 2010
- Seiko Instruments Inc.
- Masatsugu Shigeno
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope and scanning method
- Patent number 7,456,400
- Issue date Nov 25, 2008
- Seiko Instruments Inc.
- Masatsugu Shigeno
- G01 - MEASURING TESTING
Information Patent Grant
Working method using scanning probe
- Patent number 7,442,925
- Issue date Oct 28, 2008
- SII NanoTechnology Inc.
- Masatoshi Yasutake
- G01 - MEASURING TESTING
Information Patent Grant
Scratch repairing processing method and scanning probe microscope (...
- Patent number 7,285,792
- Issue date Oct 23, 2007
- SII NanoTechnology Inc.
- Naoya Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Method of processing vertical cross-section using atomic force micr...
- Patent number 7,278,299
- Issue date Oct 9, 2007
- SII NanoTechnology Inc.
- Osamu Takaoka
- G01 - MEASURING TESTING
Information Patent Grant
Processing method using probe of scanning probe microscope
- Patent number 7,259,372
- Issue date Aug 21, 2007
- SII NanoTechnology Inc.
- Osamu Takaoka
- G01 - MEASURING TESTING
Information Patent Grant
Method of removing particle of photomask using atomic force microscope
- Patent number 7,232,995
- Issue date Jun 19, 2007
- SII NanoTechnology Inc.
- Osamu Takaoka
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe device and processing method by scanning probe
- Patent number 7,107,826
- Issue date Sep 19, 2006
- SII NanoTechnology Inc.
- Naoya Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Part fabricating method
- Patent number 6,770,188
- Issue date Aug 3, 2004
- Seiko Instruments Inc.
- Masayuki Suda
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
Self displacement sensing cantilever and scanning probe microscope
- Publication number 20100132075
- Publication date May 27, 2010
- Masato Iyoki
- G01 - MEASURING TESTING
Information Patent Application
Cantilever, cantilever system, scanning probe microscope, mass sens...
- Publication number 20100107284
- Publication date Apr 29, 2010
- Masatsugu Shigeno
- G01 - MEASURING TESTING
Information Patent Application
SENSOR FOR OBSERVATIONS IN LIQUID ENVIRONMENTS AND OBSERVATION APPA...
- Publication number 20090265819
- Publication date Oct 22, 2009
- Naoya Watanabe
- G01 - MEASURING TESTING
Information Patent Application
Cell detachment method
- Publication number 20070292946
- Publication date Dec 20, 2007
- Amiko Nihei
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
Cantilever and cantilever manufacturing method
- Publication number 20070214875
- Publication date Sep 20, 2007
- Masatsugu Shigeno
- G01 - MEASURING TESTING
Information Patent Application
Living cell observing cell
- Publication number 20070134787
- Publication date Jun 14, 2007
- Yoshiharu Shirakawabe
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Scanning probe device and processing method by scanning probe
- Publication number 20060254347
- Publication date Nov 16, 2006
- Naoya Watanabe
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe device and processing method of scanning probe
- Publication number 20060254348
- Publication date Nov 16, 2006
- Naoya Watanabe
- G01 - MEASURING TESTING
Information Patent Application
Working method using scanning probe
- Publication number 20060219901
- Publication date Oct 5, 2006
- Masatoshi Yasutake
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe microscope and scanning method
- Publication number 20060113472
- Publication date Jun 1, 2006
- Masatsugu Shigeno
- G01 - MEASURING TESTING
Information Patent Application
Method of removing particle of photomask using atomic force microscope
- Publication number 20060022134
- Publication date Feb 2, 2006
- Osamu Takaoka
- G01 - MEASURING TESTING
Information Patent Application
Method of processing vertical cross-section using atomic force micr...
- Publication number 20050262685
- Publication date Dec 1, 2005
- Osamu Takaoka
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe device and processing method by scanning probe
- Publication number 20050223785
- Publication date Oct 13, 2005
- Naoya Watanabe
- G01 - MEASURING TESTING
Information Patent Application
Scratch repairing processing method and scanning probe microscope (...
- Publication number 20050205805
- Publication date Sep 22, 2005
- Naoya Watanabe
- G01 - MEASURING TESTING
Information Patent Application
Part fabricating method
- Publication number 20020092776
- Publication date Jul 18, 2002
- Masayuki Suda
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR

Naoya Watanabe

Person

Patents Grantslast 30 patents

Cell detachment method

Cantilever, cantilever system, scanning probe microscope, mass sens...

Self displacement sensing cantilever and scanning probe microscope

Sensor for observations in liquid environments and observation appa...

Cantilever and cantilever manufacturing method

Scanning probe microscope and scanning method

Working method using scanning probe

Scratch repairing processing method and scanning probe microscope (...

Method of processing vertical cross-section using atomic force micr...

Processing method using probe of scanning probe microscope

Method of removing particle of photomask using atomic force microscope

Scanning probe device and processing method by scanning probe

Part fabricating method

Patents Applicationslast 30 patents

Self displacement sensing cantilever and scanning probe microscope

Cantilever, cantilever system, scanning probe microscope, mass sens...

SENSOR FOR OBSERVATIONS IN LIQUID ENVIRONMENTS AND OBSERVATION APPA...

Cell detachment method

Cantilever and cantilever manufacturing method

Living cell observing cell

Scanning probe device and processing method by scanning probe

Scanning probe device and processing method of scanning probe

Working method using scanning probe

Scanning probe microscope and scanning method

Method of removing particle of photomask using atomic force microscope

Method of processing vertical cross-section using atomic force micr...

Scanning probe device and processing method by scanning probe

Scratch repairing processing method and scanning probe microscope (...

Part fabricating method