Narain D. Arora

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Non-contact method and apparatus for on-line interconnect character...
- Patent number 7,088,121
- Issue date Aug 8, 2006
- Siprosys, Inc.
- Narain D. Arora
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of integrated circuit interconnect process parameters
- Patent number 7,089,516
- Issue date Aug 8, 2006
- Cadence Design Systems, Inc.
- Narain D. Arora
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of measuring interconnect coupling capacitance in an IC chip
- Patent number 5,999,010
- Issue date Dec 7, 1999
- Simplex Solutions, Inc.
- Narain D. Arora
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Measurement of integrated circuit interconnect process parameters
- Publication number 20050206394
- Publication date Sep 22, 2005
- Cadence Design Systems, Inc.
- Narain D. Arora
- G06 - COMPUTING CALCULATING COUNTING