Nariyuki Fukuda

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Kanagawa-ken, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device and semiconductor device examination method
- Patent number 11,740,287
- Issue date Aug 29, 2023
- Kioxia Corporation
- Isao Ooigawa
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor circuit
- Patent number 10,311,965
- Issue date Jun 4, 2019
- TOSHIBA MEMORY CORPORATION
- Tsutomu Miyamae
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit deciding a power-supply voltage ba...
- Patent number 8,598,944
- Issue date Dec 3, 2013
- Kabushiki Kaisha Toshiba
- Nariyuki Fukuda
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE AND SEMICONDUTOR DEVCE EXAMINATION METHOD
- Publication number 20230079823
- Publication date Mar 16, 2023
- KIOXIA Corporation
- Isao OOIGAWA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR CIRCUIT
- Publication number 20180233213
- Publication date Aug 16, 2018
- Toshiba Memory Corporation
- Tsutomu MIYAMAE
- G11 - INFORMATION STORAGE
Information Patent Application
TIMING MEASURING CIRCUIT
- Publication number 20150256164
- Publication date Sep 10, 2015
- KABUSHIKI KAISHA TOSHIBA
- Yasushi EBATO
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT
- Publication number 20130207692
- Publication date Aug 15, 2013
- Kabushiki Kaisha Toshiba
- Nariyuki Fukuda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT FOR DISPLAYING IMAGE
- Publication number 20110032262
- Publication date Feb 10, 2011
- Kabushiki Kaisha Toshiba
- Toshiyuki Furusawa
- G06 - COMPUTING CALCULATING COUNTING