Nassim Zahzam

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Palaiseau, FR

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Patents Grantslast 30 patents

Information Patent Grant
Measurement by atomic interferometry with multiple species of atoms
- Patent number 10,178,752
- Issue date Jan 8, 2019
- ONERA (OFFICE NATIONAL D'ETUDES ET DE RECHERCHES AEROSPATIALES)
- Nassim Zahzam
- G01 - MEASURING TESTING
Information Patent Grant
Laser source, and apparatus and method for simultaneously interacti...
- Patent number 10,153,610
- Issue date Dec 11, 2018
- ONERA (OFFICE NATIONAL D'ETUDES ET DE RECHERCHES AEROSPATIALES)
- Yannick Bidel
- G02 - OPTICS
Information Patent Grant
Measurement by means of atomic interferometry with multiple species...
- Patent number 10,090,073
- Issue date Oct 2, 2018
- ONERA (OFFICE NATIONAL D'ETUDES ET DE RECHERCHES AEROSPATIALES
- Nassim Zahzam
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Measurement by means of atom interferometry
- Patent number 9,046,368
- Issue date Jun 2, 2015
- Onera (Office National D'Etudes et de Recherches Aerospatiales)
- Yannick Bidel
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MEASUREMENT BY MEANS OF ATOMIC INTERFEROMETRY WITH MULTIPLE SPECIES...
- Publication number 20180040388
- Publication date Feb 8, 2018
- ONERA (OFFICE NATIONAL D'ETUDES ET DE RECHERCHES AEROSPATIALES)
- Nassim ZAHZAM
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
MEASUREMENT BY ATOMIC INTERFEROMETRY WITH MULTIPLE SPECIES OF ATOMS
- Publication number 20180020534
- Publication date Jan 18, 2018
- ONERA (OFFICE NATIONAL D'ETUDES ET DE RECHERCHES AÉROSPATIALES
- Nassim ZAHZAM
- G01 - MEASURING TESTING
Information Patent Application
LASER SOURCE, AND APPARATUS AND METHOD FOR SIMULTANEOUSLY INTERACTI...
- Publication number 20170222394
- Publication date Aug 3, 2017
- Yannick BIDEL
- G02 - OPTICS
Information Patent Application
Atom Interferometry Device for Differential Inertial Measurement
- Publication number 20150090028
- Publication date Apr 2, 2015
- ONERA (Office National d'Etudes et de Recherches Aerospatiales)
- Nassim Zahzam
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT BY MEANS OF ATOM INTERFEROMETRY
- Publication number 20140319329
- Publication date Oct 30, 2014
- Yannick Bidel
- G01 - MEASURING TESTING