Natarajan Mahadeva IYER

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Patents Grantslast 30 patents

Information Patent Grant
Method of measuring characteristic impedance of electrostatic disch...
- Patent number 7,609,076
- Issue date Oct 27, 2009
- Hanwa Electronic Ind. Co., Ltd.
- Toshiyuki Nakaie
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF MEASURING CHARACTERISTIC IMPEDANCE OF ELECTROSTATIC DISCH...
- Publication number 20080004820
- Publication date Jan 3, 2008
- HANWA ELECTRONIC IND. CO., LTD.
- Toshiyuki NAKAIE
- G01 - MEASURING TESTING