Neil J. Simpson

Follow

Person

Rockwall, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Re-programmable self-test
- Patent number 11,768,240
- Issue date Sep 26, 2023
- Texas Instruments Incorporated
- Neil John Simpson
- G11 - INFORMATION STORAGE
Information Patent Grant
Re-programmable self-test
- Patent number 11,092,650
- Issue date Aug 17, 2021
- Texas Instruments Incorporated
- Neil John Simpson
- G11 - INFORMATION STORAGE
Information Patent Grant
Re-programmable self-test
- Patent number 10,247,780
- Issue date Apr 2, 2019
- Texas Instruments Incorporated
- Neil John Simpson
- G01 - MEASURING TESTING
Information Patent Grant
Mechanism to enhance observability of integrated circuit failures d...
- Patent number 7,120,842
- Issue date Oct 10, 2006
- Texas Instruments Incorporated
- Gordhan Barevadia
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
RE-PROGRAMMABLE SELF-TEST
- Publication number 20210333324
- Publication date Oct 28, 2021
- TEXAS INSTRUMENTS INCORPORATED
- Neil John Simpson
- G01 - MEASURING TESTING
Information Patent Application
RE-PROGRAMMABLE SELF-TEST
- Publication number 20190227122
- Publication date Jul 25, 2019
- TEXAS INSTRUMENTS INCORPORATED
- Neil John Simpson
- G01 - MEASURING TESTING
Information Patent Application
RE-PROGRAMMABLE SELF-TEST
- Publication number 20190041459
- Publication date Feb 7, 2019
- TEXAS INSTRUMENTS INCORPORATED
- Neil John Simpson
- G01 - MEASURING TESTING
Information Patent Application
Simultaneous scan testing for identical modules
- Publication number 20060242508
- Publication date Oct 26, 2006
- TEXAS INSTRUMENTS INCORPORATION
- Neil John Simpson
- G01 - MEASURING TESTING
Information Patent Application
System and method for testing input and output characterization on...
- Publication number 20050246599
- Publication date Nov 3, 2005
- TEXAS INSTRUMENTS INCORPORATED
- Neil John Simpson
- G01 - MEASURING TESTING
Information Patent Application
Mechanism to enhance observability of integrated circuit failures d...
- Publication number 20050066243
- Publication date Mar 24, 2005
- Gordhan Barevadia
- G01 - MEASURING TESTING