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Nick Doe
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San Jose, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Method for determining hardness of a material with implementation o...
Patent number
11,988,642
Issue date
May 21, 2024
Vishal Khosla
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Universal material tester with several consecutively arranged test...
Patent number
11,579,056
Issue date
Feb 14, 2023
Gautam Char
G01 - MEASURING TESTING
Information
Patent Grant
Adjustable digital microscope display
Patent number
10,802,264
Issue date
Oct 13, 2020
Bio-Rad Laboratories, Inc.
Zuo Cheng Shen
G02 - OPTICS
Information
Patent Grant
Capacitive shift-force sensor
Patent number
10,775,247
Issue date
Sep 15, 2020
Vishal Khosla
G01 - MEASURING TESTING
Information
Patent Grant
Method for in-line testing and surface analysis of test material wi...
Patent number
10,258,239
Issue date
Apr 16, 2019
Vishal Khosla
G01 - MEASURING TESTING
Information
Patent Grant
Universal material tester with quick-release test probe and with re...
Patent number
10,215,675
Issue date
Feb 26, 2019
Vishal Khosla
G01 - MEASURING TESTING
Information
Patent Grant
Torque measurement tester for a hole treating rotary tool
Patent number
10,179,386
Issue date
Jan 15, 2019
Vishal Khosla
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Method of determining optimal operation conditions for treating hol...
Patent number
10,180,367
Issue date
Jan 15, 2019
Vishal Khosla
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Universal mechanical tester for measuring friction and wear charact...
Patent number
10,132,733
Issue date
Nov 20, 2018
Michael Vinogradov-Nurenberg
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for in-line testing and surface analysis on a mechanical...
Patent number
10,024,776
Issue date
Jul 17, 2018
RTEC-INSTRUMENTS, INC.
Vishal Khosla
G01 - MEASURING TESTING
Information
Patent Grant
Adjustable digital microscope display
Patent number
9,829,696
Issue date
Nov 28, 2017
Bio-Rad Laboratories, Inc.
Zuo Cheng Shen
G02 - OPTICS
Information
Patent Grant
Integrated scanning probe microscope and confocal microscope
Patent number
7,692,138
Issue date
Apr 6, 2010
David James Ray
G01 - MEASURING TESTING
Information
Patent Grant
Measurement of photolithographic features
Patent number
6,847,464
Issue date
Jan 25, 2005
Zygo Corporation
Nicholas G. Doe
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Patents Applications
last 30 patents
Information
Patent Application
METHOD FOR DETERMINING HARDNESS OF A MATERIAL WITH IMPLEMENTATION O...
Publication number
20220373442
Publication date
Nov 24, 2022
Vishal Khosla
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND APPARATUS FOR MAINTAINING CONSTANCY OF FORCE IN CONTACT...
Publication number
20220196525
Publication date
Jun 23, 2022
Vishal Khosla
G01 - MEASURING TESTING
Information
Patent Application
UNIVERSAL MATERIAL TESTER WITH SEVERAL CONSECUTIVELY ARRANGED TEST...
Publication number
20210389218
Publication date
Dec 16, 2021
Gautam Char
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and Method for In-Line Testing and Surface Analysis of Te...
Publication number
20180344166
Publication date
Dec 6, 2018
Vishal Khosla
G01 - MEASURING TESTING
Information
Patent Application
UNIVERSAL MECHANICAL TESTER FOR MEASURING FRICTION AND WEAR CHARACT...
Publication number
20180202912
Publication date
Jul 19, 2018
Rtec Instruments, Inc.
Michael Vinogradov-Nurenberg
G01 - MEASURING TESTING
Information
Patent Application
TORQUE MEASUREMENT TESTER FOR A HOLE TREATING ROTARY TOOL
Publication number
20180178340
Publication date
Jun 28, 2018
Vishal Khosla
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
METHOD OF DETERMINING OPTIMAL OPERATION CONDITIONS FOR TREATING HOL...
Publication number
20180178341
Publication date
Jun 28, 2018
Vishal Khosla
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
UNIVERSAL MATERIAL TESTER WITH QUICK-RELEASE TEST PROBE AND WITH RE...
Publication number
20180067031
Publication date
Mar 8, 2018
Vishal Khosla
G01 - MEASURING TESTING
Information
Patent Application
ADJUSTABLE DIGITAL MICROSCOPE DISPLAY
Publication number
20180031819
Publication date
Feb 1, 2018
Bio-Rad Laboratories, Inc.
Zuo Cheng SHEN
G02 - OPTICS
Information
Patent Application
Apparatus for In-Line Testing and Surface Analysis on a Mechanical...
Publication number
20180024035
Publication date
Jan 25, 2018
Vishal Khosla
G01 - MEASURING TESTING
Information
Patent Application
Apparatus for In-Line Test and Surface Analysis on a Mechanical Pro...
Publication number
20170067735
Publication date
Mar 9, 2017
Vishal Khosla
G01 - MEASURING TESTING
Information
Patent Application
ANNULAR ILLUMINATION STRUCTURE
Publication number
20150286043
Publication date
Oct 8, 2015
Bio-Rad Laboratories, Inc.
NICHOLAS DOE
G02 - OPTICS
Information
Patent Application
ADJUSTABLE DIGITAL MICROSCOPE DISPLAY
Publication number
20140327757
Publication date
Nov 6, 2014
Bio-Rad Laboratories, Inc.
Zuo Cheng SHEN
G02 - OPTICS