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Nickolai S. Belov
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Fremont, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Semiconductor sensor chips
Patent number
9,391,002
Issue date
Jul 12, 2016
Amphenol Thermometrics, Inc.
Nickolai S. Belov
G01 - MEASURING TESTING
Information
Patent Grant
Method of testing of MEMS devices on a wafer level
Patent number
9,034,666
Issue date
May 19, 2015
Vladimir Vaganov
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Seek scan probe (SSP) cantilever to mover wafer bond stop
Patent number
8,644,125
Issue date
Feb 4, 2014
Intel Corporation
Tsung-Kuan Allen Chou
G11 - INFORMATION STORAGE
Information
Patent Grant
Autonomous sensing module, a system and a method of long-term condi...
Patent number
8,618,934
Issue date
Dec 31, 2013
Kolos International LLC
Nickolai S Belov
G01 - MEASURING TESTING
Information
Patent Grant
Force input control device and method of fabrication
Patent number
8,183,077
Issue date
May 22, 2012
Vladimir Vaganov
G01 - MEASURING TESTING
Information
Patent Grant
Arrangements for and fabrication of mechanical suspension of a mova...
Patent number
7,928,522
Issue date
Apr 19, 2011
Intel Corporation
Terry Zhu
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Semiconductor input control device
Patent number
7,880,247
Issue date
Feb 1, 2011
Vladimir Vaganov
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Force input control device and method of fabrication
Patent number
7,791,151
Issue date
Sep 7, 2010
Vladimir Vaganov
G01 - MEASURING TESTING
Information
Patent Grant
Method of wafer-to-wafer bonding
Patent number
7,659,182
Issue date
Feb 9, 2010
Vladimir Vaganov
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Semiconductor input control device
Patent number
7,476,952
Issue date
Jan 13, 2009
Vladimir Vaganov
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Patterned media for a high density data storage device
Patent number
7,463,573
Issue date
Dec 9, 2008
Nanochip, Inc.
Zhaohui Fan
G11 - INFORMATION STORAGE
Information
Patent Grant
System and method for a three-axis MEMS accelerometer
Patent number
7,367,232
Issue date
May 6, 2008
Vladimir Vaganov
G01 - MEASURING TESTING
Information
Patent Grant
Method for forming a reinforced tip for a probe storage device
Patent number
7,367,119
Issue date
May 6, 2008
Nanochip, Inc.
Nickolai Belov
G11 - INFORMATION STORAGE
Information
Patent Grant
Three-axis integrated MEMS accelerometer
Patent number
7,318,349
Issue date
Jan 15, 2008
Vladimir Vaganov
G01 - MEASURING TESTING
Information
Patent Grant
Method for forming patterned media for a high density data storage...
Patent number
7,309,630
Issue date
Dec 18, 2007
Nanochip, Inc.
Zhaohui Fan
G11 - INFORMATION STORAGE
Patents Applications
last 30 patents
Information
Patent Application
Low Pressure Sensor and Flow Sensor
Publication number
20150276533
Publication date
Oct 1, 2015
Amphenol Thermometrics, Inc.
Nickolai S. Belov
G01 - MEASURING TESTING
Information
Patent Application
LOW PRESSURE SENSORS AND FLOW SENSORS
Publication number
20150192487
Publication date
Jul 9, 2015
GENERAL ELECTRIC COMPANY
Nickolai S. Belov
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
SEMICONDUCTOR SENSOR CHIPS
Publication number
20150137277
Publication date
May 21, 2015
GENERAL ELECTRIC COMPANY
Nickolai S. Belov
G01 - MEASURING TESTING
Information
Patent Application
SEEK SCAN PROBE (SSP) CANTILEVER TO MOVER WAFER BOND STOP
Publication number
20130058202
Publication date
Mar 7, 2013
Tsung-Kuan Allen Chou
C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information
Patent Application
METHOD AND SYSTEM FOR TESTING OF MEMS DEVICES
Publication number
20120194207
Publication date
Aug 2, 2012
Vladimir Vaganov
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Wireless Sensing Module and Method of Operation
Publication number
20110248846
Publication date
Oct 13, 2011
Green SHM Systems, Inc, Incorporated
Nickolai Belov
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
FORCE INPUT CONTROL DEVICE AND METHOD OF FABRICATION
Publication number
20100323467
Publication date
Dec 23, 2010
Vladimir Vaganov
G01 - MEASURING TESTING
Information
Patent Application
Autonomous Module with Extended Operational Life and Method Fabrica...
Publication number
20100315035
Publication date
Dec 16, 2010
Nickolai S. Belov
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Autonomous Sensing Module, a System and a Method of Long-Term Condi...
Publication number
20100271199
Publication date
Oct 28, 2010
Kolos International LLC
Nickolai Belov
G01 - MEASURING TESTING
Information
Patent Application
PACKAGE WITH INTEGRATED MAGNETS FOR ELECTROMAGNETICALLY-ACTUATED PR...
Publication number
20100039729
Publication date
Feb 18, 2010
Nanochip, Inc.
John Heck
G11 - INFORMATION STORAGE
Information
Patent Application
PROCESS FOR FABRICATING HIGH DENSITY STORAGE DEVICE WITH HIGH-TEMPE...
Publication number
20090294028
Publication date
Dec 3, 2009
Nanochip, Inc.
John Heck
B32 - LAYERED PRODUCTS
Information
Patent Application
SEMICONDUCTOR INPUT CONTROL DEVICE
Publication number
20090212377
Publication date
Aug 27, 2009
Vladimir Vaganov
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND SYSTEM FOR IMPROVING DOMAIN FORMATION IN A FERROELECTRIC...
Publication number
20090129247
Publication date
May 21, 2009
Nanochip, Inc.
Quan A. Tran
G01 - MEASURING TESTING
Information
Patent Application
Arrangements for a micro-electro-mechanical system
Publication number
20090084946
Publication date
Apr 2, 2009
Terry Zhu
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Method of wafer-to-wafer bonding
Publication number
20080070376
Publication date
Mar 20, 2008
Vladimir Vaganov
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
MEMORY STAGE FOR A PROBE STORAGE DEVICE
Publication number
20080001075
Publication date
Jan 3, 2008
Nanochip, Inc.
Peter David Ascanio
G11 - INFORMATION STORAGE
Information
Patent Application
CANTILEVER WITH CONTROL OF VERTICAL AND LATERAL POSITION OF CONTACT...
Publication number
20070291623
Publication date
Dec 20, 2007
Nanochip, Inc.
Nickolai Belov
G01 - MEASURING TESTING
Information
Patent Application
BONDED CHIP ASSEMBLY WITH A MICRO-MOVER FOR MICROELECTROMECHANICAL...
Publication number
20070290282
Publication date
Dec 20, 2007
Nanochip, Inc.
Nickolai Belov
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Semiconductor input control device
Publication number
20070264743
Publication date
Nov 15, 2007
Vladimir Vaganov
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
CANTILEVER WITH CONTROL OF VERTICAL AND LATERAL POSITION OF CONTACT...
Publication number
20070121477
Publication date
May 31, 2007
Nanochip, Inc.
Nickolai Belov
G11 - INFORMATION STORAGE
Information
Patent Application
High density data storage devices with read/write probes with hollo...
Publication number
20070041238
Publication date
Feb 22, 2007
Nanochip, Inc.
Nickolai Belov
G11 - INFORMATION STORAGE
Information
Patent Application
Methods for forming high density data storage devices with read/wri...
Publication number
20070006455
Publication date
Jan 11, 2007
Nanochip, Inc.
Nickolai Belov
G01 - MEASURING TESTING
Information
Patent Application
Patterned media for a high density data storage device
Publication number
20070008864
Publication date
Jan 11, 2007
Nanochip, Inc.
Zhaohui Fan
G01 - MEASURING TESTING
Information
Patent Application
Method for forming patterned media for a high density data storage...
Publication number
20070010054
Publication date
Jan 11, 2007
Nanochip, Inc.
Zhaohui Fan
G11 - INFORMATION STORAGE
Information
Patent Application
THREE-AXIS INTEGRATED MEMS ACCELEROMETER
Publication number
20060272413
Publication date
Dec 7, 2006
Vladimir Vaganov
G01 - MEASURING TESTING
Information
Patent Application
System and method for a three-axis MEMS accelerometer
Publication number
20050160814
Publication date
Jul 28, 2005
Vladimir Vaganov
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus of optical components having improved optical...
Publication number
20040008967
Publication date
Jan 15, 2004
Ching Chu
G02 - OPTICS