Nicolas Bailey Cobb

Person

People

Patents Grantslast 30 patents

Information Patent Grant
Fragmentation point and simulation site adjustment for resolution e...
- Patent number 10,354,044
- Issue date Jul 16, 2019
- Mentor Graphics Corporation
- James Word
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Lithography model calibration via cache-based niching genetic algor...
- Patent number 9,857,693
- Issue date Jan 2, 2018
- Mentor Graphics Corporation
- Huikan Liu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Fragmentation point and simulation site adjustment for resolution e...
- Patent number 9,703,922
- Issue date Jul 11, 2017
- Mentor Graphics Corporation
- James Word
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Fragmentation point and simulation site adjustment for resolution e...
- Patent number 9,361,422
- Issue date Jun 7, 2016
- Mentor Graphics Corporation
- James Word
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Fragmentation point and simulation site adjustment for resolution e...
- Patent number 8,566,753
- Issue date Oct 22, 2013
- Mentor Graphics Corporation
- James Word
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Tolerable flare difference determination
- Patent number 8,533,636
- Issue date Sep 10, 2013
- Mentor Graphics Corporation
- Sergiy Komirenko
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Integrated OPC verification tool
- Patent number 7,945,871
- Issue date May 17, 2011
- Nicolas B. Cobb
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Selective optical proximity layout design data correction
- Patent number 7,926,002
- Issue date Apr 12, 2011
- Mentor Graphics Corporation
- James C. Word
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Fragmentation point and simulation site adjustment for resolution e...
- Patent number 7,861,207
- Issue date Dec 28, 2010
- Mentor Graphics Corporation
- James Word
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Dense OPC
- Patent number 7,434,199
- Issue date Oct 7, 2008
- Nicolas Bailey Cobb
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Integrated OPC verification tool
- Patent number 7,412,676
- Issue date Aug 12, 2008
- Nicolas B Cobb
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Convergence technique for model-based optical and process correction
- Patent number 7,367,009
- Issue date Apr 29, 2008
- Mentor Graphics Corporation
- Nicolas Bailey Cobb
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for performing OPC using model curvature
- Patent number 7,324,930
- Issue date Jan 29, 2008
- Nicolas B. Cobb
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Selective promotion for resolution enhancement techniques
- Patent number 7,240,321
- Issue date Jul 3, 2007
- Nicolas B. Cobb
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Matrix optical process correction
- Patent number 7,237,221
- Issue date Jun 26, 2007
- Yuri Granik
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Long range corrections in integrated circuit layout designs
- Patent number 7,234,130
- Issue date Jun 19, 2007
- James Word
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Streamlined IC mask layout optical and process correction through c...
- Patent number 7,155,699
- Issue date Dec 26, 2006
- Nicolas B. Cobb
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Site control for OPC
- Patent number 7,073,162
- Issue date Jul 4, 2006
- Mentor Graphics Corporation
- Nicolas B. Cobb
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Convergence technique for model-based optical and process correction
- Patent number 7,028,284
- Issue date Apr 11, 2006
- Nicolas Bailey Cobb
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Mixed-mode optical proximity correction
- Patent number 7,024,655
- Issue date Apr 4, 2006
- Nicolas B. Cobb
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Integrated verification and manufacturability tool
- Patent number 7,017,141
- Issue date Mar 21, 2006
- Leigh C. Anderson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Matrix optical process correction
- Patent number 6,928,634
- Issue date Aug 9, 2005
- Yuri Granik
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Streamlined IC mask layout optical and process correction through c...
- Patent number 6,748,578
- Issue date Jun 8, 2004
- Nicolas B. Cobb
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Selective promotion for resolution enhancement techniques
- Patent number 6,668,367
- Issue date Dec 23, 2003
- Nicolas B. Cobb
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Integrated device structure prediction based on model curvature
- Patent number 6,643,616
- Issue date Nov 4, 2003
- Yuri Granik
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for submicron IC design
- Patent number 6,467,076
- Issue date Oct 15, 2002
- Nicolas Bailey Cobb
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for determining phase shifts and trim masks fo...
- Patent number 6,455,205
- Issue date Sep 24, 2002
- Nicolas Bailey Cobb
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Convergence technique for model-based optical and process correction
- Patent number 6,430,737
- Issue date Aug 6, 2002
- Mentor Graphics Corp.
- Nicolas Bailey Cobb
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated verification and manufacturability tool
- Patent number 6,425,113
- Issue date Jul 23, 2002
- Leigh C. Anderson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated verification and manufacturability tool
- Patent number 6,415,421
- Issue date Jul 2, 2002
- Mentor Graphics Corporation
- Leigh C. Anderson
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Lithography Model Calibration Via Genetic Algorithms with Adaptive...
- Publication number 20180196349
- Publication date Jul 12, 2018
- Mentor Graphics Corporation
- Huikan Liu
- G05 - CONTROLLING REGULATING
Information Patent Application
FRAGMENTATION POINT AND SIMULATION SITE ADJUSTMENT FOR RESOLUTION E...
- Publication number 20170270235
- Publication date Sep 21, 2017
- Mentor Graphics Corporation
- James Word
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FRAGMENTATION POINT AND SIMULATION SITE ADJUSTMENT FOR RESOLUTION E...
- Publication number 20160283645
- Publication date Sep 29, 2016
- Mentor Graphics Corporation
- James Word
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FRAGMENTATION POINT AND SIMULATION SITE ADJUSTMENT FOR RESOLUTION E...
- Publication number 20140143741
- Publication date May 22, 2014
- Mentor Graphics Corporation
- James Word
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Tolerable Flare Difference Determination
- Publication number 20130104091
- Publication date Apr 25, 2013
- Mentor Graphics Corporation
- SERGIY KOMIRENKO
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Selective Optical Proximity Layout Design Data Correction
- Publication number 20110191726
- Publication date Aug 4, 2011
- James C. WORD
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
FRAGMENTATION POINT AND SIMULATION SITE ADJUSTMENT FOR RESOLUTION E...
- Publication number 20110161894
- Publication date Jun 30, 2011
- Mentor Graphics Corporation
- James Word
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED OPC VERIFICATION TOOL
- Publication number 20080256500
- Publication date Oct 16, 2008
- Nicolas B. Cobb
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Multiprocessor Architecture With Hierarchical Processor Organization
- Publication number 20080140989
- Publication date Jun 12, 2008
- Dragos Dudau
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Convergence technique for model-based optical and process correction
- Publication number 20060236298
- Publication date Oct 19, 2006
- Mentor Graphics Corporation
- Nicolas Bailey Cobb
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Integrated OPC verification tool
- Publication number 20060005154
- Publication date Jan 5, 2006
- Mentor Graphics Corporation
- Nicolas B. Cobb
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Fragmentation point and simulation site adjustment for resolution e...
- Publication number 20050278686
- Publication date Dec 15, 2005
- James Word
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Matrix optical process correction
- Publication number 20050278685
- Publication date Dec 15, 2005
- Mentor Graphics Corporation
- Yuri Granik
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Long range corrections in integrated circuit layout designs
- Publication number 20050216878
- Publication date Sep 29, 2005
- James Word
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Streamlined IC mask layout optical and process correction through c...
- Publication number 20050160388
- Publication date Jul 21, 2005
- Mentor Graphics Corporation
- Nicolas B. Cobb
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Site control for OPC
- Publication number 20050097501
- Publication date May 5, 2005
- Mentor Graphics Corporation
- Nicolas B. Cobb
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Selective promotion for resolution enhancement techniques
- Publication number 20040230936
- Publication date Nov 18, 2004
- Mentor Graphics Corporation
- Nicolas B. Cobb
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Mixed mode optical proximity correction
- Publication number 20040221254
- Publication date Nov 4, 2004
- Mentor Graphics Corporation
- Nicolas Bailey Cobb
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Convergence technique for model-based optical and process correction
- Publication number 20040216065
- Publication date Oct 28, 2004
- Nicolas Bailey Cobb
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Matrix optical process correction
- Publication number 20040133871
- Publication date Jul 8, 2004
- Mentor Graphics Corporation
- Yuri Granik
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method and apparatus for performing OPC using model curvature
- Publication number 20040088149
- Publication date May 6, 2004
- Mentor Graphics Corporation
- Nicolas B. Cobb
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Distribution of operations to remote computers
- Publication number 20040083475
- Publication date Apr 29, 2004
- Mentor Graphics Corp.
- Robert A. Todd
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Selective promotion for resolution enhancement techniques
- Publication number 20030140328
- Publication date Jul 24, 2003
- Nicolas B. Cobb
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Mixed-mode optical proximity correction
- Publication number 20020199157
- Publication date Dec 26, 2002
- Nicolas Bailey Cobb
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Integrated verification and manufacturability tool
- Publication number 20020100005
- Publication date Jul 25, 2002
- Mentor Graphics Corporation
- Leigh C. Anderson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for determining phase shifts and trim masks fo...
- Publication number 20020081500
- Publication date Jun 27, 2002
- Nicolas Bailey Cobb
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Streamlined IC mask layout optical and process correction through c...
- Publication number 20020026627
- Publication date Feb 28, 2002
- Nicolas B. Cobb
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Integrated verification and manufacturability tool
- Publication number 20010052107
- Publication date Dec 13, 2001
- Mentor Graphics Corporation
- Leigh C. Anderson
- G06 - COMPUTING CALCULATING COUNTING

Nicolas Bailey Cobb

Person

Patents Grantslast 30 patents

Fragmentation point and simulation site adjustment for resolution e...

Lithography model calibration via cache-based niching genetic algor...

Fragmentation point and simulation site adjustment for resolution e...

Fragmentation point and simulation site adjustment for resolution e...

Fragmentation point and simulation site adjustment for resolution e...

Tolerable flare difference determination

Integrated OPC verification tool

Selective optical proximity layout design data correction

Fragmentation point and simulation site adjustment for resolution e...

Dense OPC

Integrated OPC verification tool

Convergence technique for model-based optical and process correction

Method and apparatus for performing OPC using model curvature

Selective promotion for resolution enhancement techniques

Matrix optical process correction

Long range corrections in integrated circuit layout designs

Streamlined IC mask layout optical and process correction through c...

Site control for OPC

Convergence technique for model-based optical and process correction

Mixed-mode optical proximity correction

Integrated verification and manufacturability tool

Matrix optical process correction

Streamlined IC mask layout optical and process correction through c...

Selective promotion for resolution enhancement techniques

Integrated device structure prediction based on model curvature

Method and apparatus for submicron IC design

Method and apparatus for determining phase shifts and trim masks fo...

Convergence technique for model-based optical and process correction

Integrated verification and manufacturability tool

Integrated verification and manufacturability tool

Patents Applicationslast 30 patents

Lithography Model Calibration Via Genetic Algorithms with Adaptive...

FRAGMENTATION POINT AND SIMULATION SITE ADJUSTMENT FOR RESOLUTION E...

FRAGMENTATION POINT AND SIMULATION SITE ADJUSTMENT FOR RESOLUTION E...

FRAGMENTATION POINT AND SIMULATION SITE ADJUSTMENT FOR RESOLUTION E...

Tolerable Flare Difference Determination

Selective Optical Proximity Layout Design Data Correction

FRAGMENTATION POINT AND SIMULATION SITE ADJUSTMENT FOR RESOLUTION E...

INTEGRATED OPC VERIFICATION TOOL

Multiprocessor Architecture With Hierarchical Processor Organization

Convergence technique for model-based optical and process correction

Integrated OPC verification tool

Fragmentation point and simulation site adjustment for resolution e...

Matrix optical process correction

Long range corrections in integrated circuit layout designs

Streamlined IC mask layout optical and process correction through c...

Site control for OPC

Selective promotion for resolution enhancement techniques

Mixed mode optical proximity correction

Convergence technique for model-based optical and process correction

Matrix optical process correction

Method and apparatus for performing OPC using model curvature

Distribution of operations to remote computers

Selective promotion for resolution enhancement techniques

Mixed-mode optical proximity correction

Integrated verification and manufacturability tool

Method and apparatus for determining phase shifts and trim masks fo...

Streamlined IC mask layout optical and process correction through c...

Integrated verification and manufacturability tool