Nicolas Bright

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Process integration scheme to lower overall dielectric constant in...
- Patent number 9,076,844
- Issue date Jul 7, 2015
- Lam Research Corporation
- Nicolas Bright
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automatic dynamic baseline creation and adjustment
- Patent number 7,899,627
- Issue date Mar 1, 2011
- Lam Research Corporation
- Chung-Ho Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and arrangement for creating recipes using best-known methods
- Patent number 7,542,820
- Issue date Jun 2, 2009
- Lam Research Corporation
- Chung-Ho Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Computer readable mask shrink control processor
- Patent number 7,539,969
- Issue date May 26, 2009
- Lam Research Corporation
- S. M. Reza Sadjadi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Process integration scheme to lower overall dielectric constant in...
- Patent number 7,521,358
- Issue date Apr 21, 2009
- Lam Research Corporation
- Nicolas Bright
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for making dual-damascene dielectric structures
- Patent number 7,501,339
- Issue date Mar 10, 2009
- Lam Research Corporation
- Jay E. Uglow
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reticle alignment and overlay for multiple reticle process
- Patent number 7,465,525
- Issue date Dec 16, 2008
- Lam Research Corporation
- S. M. Reza Sadjadi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for real time metal film thickness measurement
- Patent number 7,309,618
- Issue date Dec 18, 2007
- Lam Research Corporation
- Yehiel Gotkis
- B24 - GRINDING POLISHING
Information Patent Grant
Smart component-based management techniques in a substrate processi...
- Patent number 7,254,510
- Issue date Aug 7, 2007
- Lam Research Corporation
- Neil Benjamin
- G01 - MEASURING TESTING
Information Patent Grant
Smart component-based management techniques in a substrate processi...
- Patent number 7,152,011
- Issue date Dec 19, 2006
- Lam Research Corporation
- Neil Benjamin
- G01 - MEASURING TESTING
Information Patent Grant
Enhancement of eddy current based measurement capabilities
- Patent number 7,084,621
- Issue date Aug 1, 2006
- Lam Research Corporation
- Yehiel Gotkis
- G01 - MEASURING TESTING
Information Patent Grant
Methods for making dual-damascene dielectric structures
- Patent number 7,060,605
- Issue date Jun 13, 2006
- Lam Research Corporation
- Jay E. Uglow
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for controlling wafer temperature in chemical mechanical...
- Patent number 7,029,368
- Issue date Apr 18, 2006
- Lam Research Corporation
- Nicolas Bright
- B24 - GRINDING POLISHING
Information Patent Grant
Method and apparatus for slope to threshold conversion for process...
- Patent number 7,010,468
- Issue date Mar 7, 2006
- Lam Research Corporation
- Yehiel Gotkis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus methods for controlling wafer temperature in chemical mec...
- Patent number 6,984,162
- Issue date Jan 10, 2006
- Lam Research Corporation
- Nicolas Bright
- B24 - GRINDING POLISHING
Information Patent Grant
Method and apparatus of arrayed sensors for metrological control
- Patent number 6,951,624
- Issue date Oct 4, 2005
- Lam Research Corporation
- Yehiel Gotkis
- G01 - MEASURING TESTING
Information Patent Grant
System and method for metal residue detection and mapping within a...
- Patent number 6,929,531
- Issue date Aug 16, 2005
- Lam Research Corporation
- Yehiel Gotkis
- B24 - GRINDING POLISHING
Information Patent Grant
Complementary sensors metrological process and method and apparatus...
- Patent number 6,922,053
- Issue date Jul 26, 2005
- Lam Research Corporation
- Yehiel Gotkis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dual-damascene dielectric structures
- Patent number 6,909,190
- Issue date Jun 21, 2005
- Lam Research Corporation
- Jay E. Uglow
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for metrological process control implementing...
- Patent number 6,894,491
- Issue date May 17, 2005
- Lam Research Corporation
- Yehiel Gotkis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for slope to threshold conversion for process...
- Patent number 6,859,765
- Issue date Feb 22, 2005
- Lam Research Corporation
- Yehiel Gotkis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus of arrayed sensors for metrological control
- Patent number 6,808,590
- Issue date Oct 26, 2004
- Lam Research Corporation
- Yehiel Gotkis
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and methods for controlling wafer temperature in chemical...
- Patent number 6,736,720
- Issue date May 18, 2004
- Lam Research Corporation
- Nicolas Bright
- B24 - GRINDING POLISHING
Information Patent Grant
Method and apparatus for controlling the volume of a plasma
- Patent number 6,322,661
- Issue date Nov 27, 2001
- Lam Research Corporation
- Andrew D. Bailey
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor processing platform architecture having processing mo...
- Patent number 6,267,545
- Issue date Jul 31, 2001
- Lam Research Corporation
- Benjamin W. Mooring
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Dual-damascene dielectric structures and methods for making the same
- Patent number 6,251,770
- Issue date Jun 26, 2001
- LAM Research Corp.
- Jay E. Uglow
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dual sided slot valve and method for implementing the same
- Patent number 6,095,741
- Issue date Aug 1, 2000
- Lam Research Corporation
- Tony R. Kroeker
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...

Patents Applicationslast 30 patents

Information Patent Application
PROCESS INTEGRATION SCHEME TO LOWER OVERALL DIELECTRIC CONSTANT IN...
- Publication number 20090134520
- Publication date May 28, 2009
- Lam Research Corporation
- Nicolas Bright
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods and Arrangement for Creating Recipes Using Best-Known Methods
- Publication number 20080188970
- Publication date Aug 7, 2008
- Chung-Ho Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Process integration scheme to lower overall dielectric constant in...
- Publication number 20080150138
- Publication date Jun 26, 2008
- Lam Research Corporation
- Nicolas Bright
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATIC DYNAMIC BASELINE CREATION AND ADJUSTMENT
- Publication number 20080079918
- Publication date Apr 3, 2008
- Chung-Ho Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Smart component-based management techniques in a substrate processi...
- Publication number 20060271325
- Publication date Nov 30, 2006
- Lam Research Corporation
- Neil Benjamin
- G05 - CONTROLLING REGULATING
Information Patent Application
Reticle alignment and overlay for multiple reticle process
- Publication number 20060257750
- Publication date Nov 16, 2006
- Lam Research Corporation
- S.M. Reza Sadjadi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Computer readable mask shrink control processor
- Publication number 20060259886
- Publication date Nov 16, 2006
- Lam Research Corporation
- S.M. Reza Sadjadi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Methods for making dual-damascene dielectric structures
- Publication number 20060166485
- Publication date Jul 27, 2006
- LAM RESEARCH CORPORATION, AND NOVELLUS SYSTEMS, INC.
- Jay E. Uglow
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Smart component-based management techniques in a substrate processi...
- Publication number 20060047458
- Publication date Mar 2, 2006
- Neil Benjamin
- G05 - CONTROLLING REGULATING
Information Patent Application
Method and apparatus for slope to threshold conversion for process...
- Publication number 20050125202
- Publication date Jun 9, 2005
- Lam Research Corporation
- Yehiel Gotkis
- G05 - CONTROLLING REGULATING
Information Patent Application
Method and apparatus for wafer mechanical stress monitoring and waf...
- Publication number 20050066739
- Publication date Mar 31, 2005
- Lam Research Corporation
- Yehiel Gotkis
- B24 - GRINDING POLISHING
Information Patent Application
Complementary sensors metrological process and method and apparatus...
- Publication number 20050007107
- Publication date Jan 13, 2005
- Lam Research Corp.
- Yehiel Gotkis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus of arrayed sensors for metrological control
- Publication number 20050000653
- Publication date Jan 6, 2005
- Lam Research Corporation
- Yehiel Gotkis
- G01 - MEASURING TESTING
Information Patent Application
Apparatus methods for controlling wafer temperature in chemical mec...
- Publication number 20040242124
- Publication date Dec 2, 2004
- Lam Research Corporation
- Nicolas Bright
- B24 - GRINDING POLISHING
Information Patent Application
METHOD AND APPARATUS FOR METROLOGICAL PROCESS CONTROL IMPLEMENTING...
- Publication number 20040119468
- Publication date Jun 24, 2004
- Lam Research Corp.
- Yehiel Gotkis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for slope to threshold conversion for process...
- Publication number 20040117054
- Publication date Jun 17, 2004
- Lam Research Corporation
- Yehiel Gotkis
- G05 - CONTROLLING REGULATING
Information Patent Application
Apparatus methods for controlling wafer temperature in chemical mec...
- Publication number 20040108065
- Publication date Jun 10, 2004
- Lam Research Corporation
- Nicolas Bright
- B24 - GRINDING POLISHING
Information Patent Application
Enhancement of eddy current based measurement capabilities
- Publication number 20040058545
- Publication date Mar 25, 2004
- Lam Research Corporation
- Yehiel Gotkis
- G01 - MEASURING TESTING
Information Patent Application
System and method for metal residue detection and mapping within a...
- Publication number 20040058620
- Publication date Mar 25, 2004
- LAM RESEARCH CORPORATION
- Yehiel Gotkis
- B24 - GRINDING POLISHING
Information Patent Application
Method and apparatus for applying differential removal rates to a s...
- Publication number 20040011462
- Publication date Jan 22, 2004
- Lam Research Corporation
- Yehiel Gotkis
- B24 - GRINDING POLISHING
Information Patent Application
Method and apparatus for real time metal film thickness measurement
- Publication number 20040002171
- Publication date Jan 1, 2004
- Lam Research Corporation
- Yehiel Gotkis
- B24 - GRINDING POLISHING
Information Patent Application
Apparatus and methods for controlling wafer temperature in chemical...
- Publication number 20030119429
- Publication date Jun 26, 2003
- Lam Research Corporation
- Nicolas Bright
- B24 - GRINDING POLISHING
Information Patent Application
DUAL - DAMASCENE DIELECTRIC STRUCTURES
- Publication number 20010010970
- Publication date Aug 2, 2001
- Jay E. Uglow
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods for making dual-damascene dielectric structures
- Publication number 20010009803
- Publication date Jul 26, 2001
- Jay E. Uglow
- H01 - BASIC ELECTRIC ELEMENTS

Nicolas Bright

Person

Patents Grantslast 30 patents

Process integration scheme to lower overall dielectric constant in...

Automatic dynamic baseline creation and adjustment

Methods and arrangement for creating recipes using best-known methods

Computer readable mask shrink control processor

Process integration scheme to lower overall dielectric constant in...

Methods for making dual-damascene dielectric structures

Reticle alignment and overlay for multiple reticle process

Method and apparatus for real time metal film thickness measurement

Smart component-based management techniques in a substrate processi...

Smart component-based management techniques in a substrate processi...

Enhancement of eddy current based measurement capabilities

Methods for making dual-damascene dielectric structures

Apparatus for controlling wafer temperature in chemical mechanical...

Method and apparatus for slope to threshold conversion for process...

Apparatus methods for controlling wafer temperature in chemical mec...

Method and apparatus of arrayed sensors for metrological control

System and method for metal residue detection and mapping within a...

Complementary sensors metrological process and method and apparatus...

Dual-damascene dielectric structures

Method and apparatus for metrological process control implementing...

Method and apparatus for slope to threshold conversion for process...

Method and apparatus of arrayed sensors for metrological control

Apparatus and methods for controlling wafer temperature in chemical...

Method and apparatus for controlling the volume of a plasma

Semiconductor processing platform architecture having processing mo...

Dual-damascene dielectric structures and methods for making the same

Dual sided slot valve and method for implementing the same

Patents Applicationslast 30 patents

PROCESS INTEGRATION SCHEME TO LOWER OVERALL DIELECTRIC CONSTANT IN...

Methods and Arrangement for Creating Recipes Using Best-Known Methods

Process integration scheme to lower overall dielectric constant in...

AUTOMATIC DYNAMIC BASELINE CREATION AND ADJUSTMENT

Smart component-based management techniques in a substrate processi...

Reticle alignment and overlay for multiple reticle process

Computer readable mask shrink control processor

Methods for making dual-damascene dielectric structures

Smart component-based management techniques in a substrate processi...

Method and apparatus for slope to threshold conversion for process...

Method and apparatus for wafer mechanical stress monitoring and waf...

Complementary sensors metrological process and method and apparatus...

Method and apparatus of arrayed sensors for metrological control

Apparatus methods for controlling wafer temperature in chemical mec...

METHOD AND APPARATUS FOR METROLOGICAL PROCESS CONTROL IMPLEMENTING...

Method and apparatus for slope to threshold conversion for process...

Apparatus methods for controlling wafer temperature in chemical mec...

Enhancement of eddy current based measurement capabilities

System and method for metal residue detection and mapping within a...

Method and apparatus for applying differential removal rates to a s...

Method and apparatus for real time metal film thickness measurement

Apparatus and methods for controlling wafer temperature in chemical...

DUAL - DAMASCENE DIELECTRIC STRUCTURES

Methods for making dual-damascene dielectric structures