Nikolay Voznesenskiy

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Tartu, EE

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Patents Grantslast 30 patents

Information Patent Grant
Two-channel point-diffraction interferometer
- Patent number 10,247,539
- Issue date Apr 2, 2019
- DIFROTEC OÜ
- Nikolay Voznesenskiy
- G01 - MEASURING TESTING
Information Patent Grant
Coupled-domains disturbance matrix generation for fast simulation o...
- Patent number 10,204,197
- Issue date Feb 12, 2019
- Synopsys, Inc.
- Nikolay B. Voznesenskiy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Large numerical aperture phase-shifting dual pinhole diffraction in...
- Patent number 10,012,491
- Issue date Jul 3, 2018
- Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of...
- Nikolay Voznesenskiy
- G01 - MEASURING TESTING
Information Patent Grant
Compact and accurate wafer topography proximity effect modeling for...
- Patent number 8,719,736
- Issue date May 6, 2014
- Synopsys, Inc.
- Hongbo Zhang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
Coupled-Domains Disturbance Matrix Generation For Fast Simulation O...
- Publication number 20180121586
- Publication date May 3, 2018
- Nikolay B. Voznesenskiy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Two-channel point-diffraction interferometer
- Publication number 20170191820
- Publication date Jul 6, 2017
- Difrotec OÜ
- Nikolay VOZNESENSKIY
- G01 - MEASURING TESTING
Information Patent Application
LARGE NUMERICAL APERTURE PHASE-SHIFTING DUAL PINHOLE DIFFRACTION IN...
- Publication number 20170184391
- Publication date Jun 29, 2017
- CHANGCHUN INSTITUTE OF OPTICS, FINE MECHANICS AND PHYSICS, CHINESE ACADEMY OF...
- Nikolay VOZNESENSKIY
- G01 - MEASURING TESTING