Nital S. Patel

Person

Mesa, AZ, US

People

Patents Grantslast 30 patents

Information Patent Grant
Simultaneous control of deposition time and temperature of multi-zo...
- Patent number 7,517,141
- Issue date Apr 14, 2009
- Texas Instruments Incorporated
- Nital S. Patel
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Versatile system for controlling semiconductor topography
- Patent number 7,010,381
- Issue date Mar 7, 2006
- Texas Instruments Incorporated
- Nital S. Patel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Versatile system for variance-based data analysis
- Patent number 6,941,242
- Issue date Sep 6, 2005
- Texas Instruments Incorporated
- Nital S. Patel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for controlling a critical dimension (CD) in an etch process
- Patent number 6,808,942
- Issue date Oct 26, 2004
- Texas Instruments Incorporated
- Nital Patel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of estimation of wafer polish rates
- Patent number 6,799,136
- Issue date Sep 28, 2004
- Texas Instruments Incorporated
- Nital Patel
- B24 - GRINDING POLISHING
Information Patent Grant
System and method for self-tuning feedback control of a system
- Patent number 6,631,299
- Issue date Oct 7, 2003
- Texas Instruments Incorporated
- Nital S. Patel
- G05 - CONTROLLING REGULATING
Information Patent Grant
System and method for controlling a wafer polishing process
- Patent number 6,623,333
- Issue date Sep 23, 2003
- Texas Instruments Incorporated
- Nital S. Patel
- B24 - GRINDING POLISHING
Information Patent Grant
Method of estimation of wafer-to-wafer thickness
- Patent number 6,589,800
- Issue date Jul 8, 2003
- Texas Instruments Incorporated
- Nital Patel
- B24 - GRINDING POLISHING
Information Patent Grant
Method and system for dispatching semiconductor lots to manufacturi...
- Patent number 6,584,369
- Issue date Jun 24, 2003
- Texas Instruments Incorporated
- Nital S. Patel
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Simultaneous control of deposition time and temperature of multi-zo...
- Publication number 20080025369
- Publication date Jan 31, 2008
- TEXAS INSTRUMENTS INCORPORATED
- Nital S. Patel
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Simultaneous control of deposition time and temperature of multi-zo...
- Publication number 20050247266
- Publication date Nov 10, 2005
- Nital S. Patel
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Versatile system for variance-based data analysis
- Publication number 20050075834
- Publication date Apr 7, 2005
- Nital S. Patel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Versatile system for controlling semiconductor topography
- Publication number 20050064608
- Publication date Mar 24, 2005
- Nital S. Patel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of estimation of wafer-to-wafer thickness
- Publication number 20030059963
- Publication date Mar 27, 2003
- Nital Patel
- B24 - GRINDING POLISHING
Information Patent Application
Method of estimation of wafer polish rates
- Publication number 20030054644
- Publication date Mar 20, 2003
- Nital Patel
- B24 - GRINDING POLISHING
Information Patent Application
Method and system for dispatching semiconductor lots to manufacturi...
- Publication number 20020107599
- Publication date Aug 8, 2002
- Nital S. Patel
- G06 - COMPUTING CALCULATING COUNTING

Nital S. Patel

Person

Patents Grantslast 30 patents

Simultaneous control of deposition time and temperature of multi-zo...

Versatile system for controlling semiconductor topography

Versatile system for variance-based data analysis

Method for controlling a critical dimension (CD) in an etch process

Method of estimation of wafer polish rates

System and method for self-tuning feedback control of a system

System and method for controlling a wafer polishing process

Method of estimation of wafer-to-wafer thickness

Method and system for dispatching semiconductor lots to manufacturi...

Patents Applicationslast 30 patents

Simultaneous control of deposition time and temperature of multi-zo...

Simultaneous control of deposition time and temperature of multi-zo...

Versatile system for variance-based data analysis

Versatile system for controlling semiconductor topography

Method of estimation of wafer-to-wafer thickness

Method of estimation of wafer polish rates

Method and system for dispatching semiconductor lots to manufacturi...