Nobuaki Takeuchi

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Optical fiber temperature distribution measuring device
- Patent number 10,018,517
- Issue date Jul 10, 2018
- Yokogawa Electric Corporation
- Nobuaki Takeuchi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor test apparatus
- Patent number 6,766,483
- Issue date Jul 20, 2004
- Ando Electric Co., Ltd.
- Nobuaki Takeuchi
- G11 - INFORMATION STORAGE
Information Patent Grant
Electro-optic apparatus for measuring signal potentials
- Patent number 6,683,447
- Issue date Jan 27, 2004
- Ando Electric Co., Ltd.
- Yoshiki Yanagisawa
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor test apparatus with reduced power consumption and hea...
- Patent number 6,614,252
- Issue date Sep 2, 2003
- Ando Electric Co., Ltd.
- Nobuaki Takeuchi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor testing apparatus
- Patent number 6,566,896
- Issue date May 20, 2003
- Ando Electric Co., Ltd.
- Nobuaki Takeuchi
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optic sampling oscilloscope
- Patent number 6,567,760
- Issue date May 20, 2003
- Ando Electric Co., Ltd.
- Jun Kikuchi
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for testing of multi-branch optical network
- Patent number 6,512,610
- Issue date Jan 28, 2003
- Ando Electric Co., Ltd.
- Takao Minami
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit tester
- Patent number 6,505,312
- Issue date Jan 7, 2003
- Ando Electric Co., Ltd.
- Nobuaki Takeuchi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor test apparatus
- Patent number 6,486,952
- Issue date Nov 26, 2002
- Ando Electric Co., Ltd.
- Nobuaki Takeuchi
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for inspecting integrated circuits
- Patent number 6,473,556
- Issue date Oct 29, 2002
- Ando Electric Co., Ltd.
- Nobuaki Takeuchi
- G02 - OPTICS
Information Patent Grant
Light receiving circuit for use in electro-optic sampling oscilloscope
- Patent number 6,384,590
- Issue date May 7, 2002
- Ando Electric Co., Ltd.
- Jun Kikuchi
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optic sampling oscilloscope
- Patent number 6,377,036
- Issue date Apr 23, 2002
- Ando Electric Co., Ltd.
- Nobuaki Takeuchi
- G01 - MEASURING TESTING
Information Patent Grant
Timing generation circuit for electro-optic sampling oscilloscope
- Patent number 6,310,507
- Issue date Oct 30, 2001
- Ando Electric Co., Ltd.
- Nobuaki Takeuchi
- G01 - MEASURING TESTING
Information Patent Grant
Testing device for multistage multi-branch optical network
- Patent number 6,310,702
- Issue date Oct 30, 2001
- Ando Electric Co., Ltd.
- Takao Minami
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Timing generation circuit for an electro-optic oscilloscope
- Patent number 6,288,529
- Issue date Sep 11, 2001
- Ando Electric Co., Ltd.
- Nobuaki Takeuchi
- G01 - MEASURING TESTING
Information Patent Grant
Oscilloscope utilizing probe with electro-optic crystal
- Patent number 6,252,387
- Issue date Jun 26, 2001
- Ando Electric Co., Ltd.
- Nobuaki Takeuchi
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optical oscilloscope with improved sampling
- Patent number 6,232,765
- Issue date May 15, 2001
- Ando Electric Co., Ltd.
- Nobuaki Takeuchi
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optic sampling oscilloscope
- Patent number 6,201,235
- Issue date Mar 13, 2001
- Ando Electric Co., Ltd.
- Nobuaki Takeuchi
- G01 - MEASURING TESTING
Information Patent Grant
Signal processing circuit for electro-optic probe
- Patent number 6,087,838
- Issue date Jul 11, 2000
- Ando Electric Co., Ltd.
- Nobuaki Takeuchi
- G01 - MEASURING TESTING
Information Patent Grant
Multi-branched optical line testing apparatus
- Patent number 6,028,661
- Issue date Feb 22, 2000
- Ando Electric Co., Ltd.
- Takao Minami
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring optical attenuation using an optical time domai...
- Patent number 5,452,071
- Issue date Sep 19, 1995
- Ando Electric Co., Ltd.
- Nobuaki Takeuchi
- G01 - MEASURING TESTING
Information Patent Grant
High-power light pulse generating apparatus
- Patent number 5,309,455
- Issue date May 3, 1994
- Ando Electric Co., Ltd.
- Shoji Adachi
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL FIBER TEMPERATURE DISTRIBUTION MEASURING DEVICE
- Publication number 20160003687
- Publication date Jan 7, 2016
- YOKOGAWA ELECTRIC CORPORATION
- Nobuaki TAKEUCHI
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor testing apparatus
- Publication number 20020043979
- Publication date Apr 18, 2002
- ANDO ELECTRIC CO., LTD.
- Nobuaki Takeuchi
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor test apparatus
- Publication number 20020043987
- Publication date Apr 18, 2002
- ANDO ELECTRIC CO., LTD.
- Nobuaki Takeuchi
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor test apparatus
- Publication number 20020044474
- Publication date Apr 18, 2002
- ANDO ELECTRIC CO., LTD.
- Nobuaki Takeuchi
- G11 - INFORMATION STORAGE
Information Patent Application
Method for calibrating a semiconductor testing device, a semiconduc...
- Publication number 20020021137
- Publication date Feb 21, 2002
- ANDO ELECTRIC CO., LTD.
- Nobuaki Takeuchi
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor test apparatus
- Publication number 20010048527
- Publication date Dec 6, 2001
- ANDO ELECTRIC CO., LTD.
- Nobuaki Takeuchi
- G01 - MEASURING TESTING

Nobuaki Takeuchi

Person

Patents Grantslast 30 patents

Optical fiber temperature distribution measuring device

Semiconductor test apparatus

Electro-optic apparatus for measuring signal potentials

Semiconductor test apparatus with reduced power consumption and hea...

Semiconductor testing apparatus

Electro-optic sampling oscilloscope

Device and method for testing of multi-branch optical network

Integrated circuit tester

Semiconductor test apparatus

Apparatus for inspecting integrated circuits

Light receiving circuit for use in electro-optic sampling oscilloscope

Electro-optic sampling oscilloscope

Timing generation circuit for electro-optic sampling oscilloscope

Testing device for multistage multi-branch optical network

Timing generation circuit for an electro-optic oscilloscope

Oscilloscope utilizing probe with electro-optic crystal

Electro-optical oscilloscope with improved sampling

Electro-optic sampling oscilloscope

Signal processing circuit for electro-optic probe

Multi-branched optical line testing apparatus

Method of measuring optical attenuation using an optical time domai...

High-power light pulse generating apparatus

Patents Applicationslast 30 patents

OPTICAL FIBER TEMPERATURE DISTRIBUTION MEASURING DEVICE

Semiconductor testing apparatus

Semiconductor test apparatus

Semiconductor test apparatus

Method for calibrating a semiconductor testing device, a semiconduc...

Semiconductor test apparatus