| Number | Date | Country | Kind |
|---|---|---|---|
| 9-273157 | Oct 1997 | JP |
| Number | Date | Country |
|---|---|---|
| 0 197 196 | Oct 1986 | EP |
| Entry |
|---|
| “A High-Impedance Probe Based on Electro-Optic Sampling” Proceeding of the 15th Meeting on Lightwave Technology, May 1995, pp. 123-129. |
| “A Novel High-Impedance Probe For Multi-Gigahertz Signal Measurement”; Mitsuru Shinagawa et al.; IEEE Transactions On Instrumentation and Measurement; vol. 45, No. 2, Apr. 1, 1996. |