Number | Date | Country | Kind |
---|---|---|---|
9-273157 | Oct 1997 | JP |
Number | Date | Country |
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0 197 196 | Oct 1986 | EP |
Entry |
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“A High-Impedance Probe Based on Electro-Optic Sampling” Proceeding of the 15th Meeting on Lightwave Technology, May 1995, pp. 123-129. |
“A Novel High-Impedance Probe For Multi-Gigahertz Signal Measurement”; Mitsuru Shinagawa et al.; IEEE Transactions On Instrumentation and Measurement; vol. 45, No. 2, Apr. 1, 1996. |