Nobumi Kodama

Person

Kawasaki, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor memory and burn-in test method of semiconductor memory
- Patent number 7,200,059
- Issue date Apr 3, 2007
- Fujitsu Limited
- Shinya Fujioka
- G11 - INFORMATION STORAGE
Information Patent Grant
Test apparatus for semiconductor device
- Patent number 7,107,504
- Issue date Sep 12, 2006
- Fujitsu Limited
- Masahiro Sato
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device having common driver circuits for plura...
- Patent number 4,896,302
- Issue date Jan 23, 1990
- Fujitsu Limited
- Kimiaki Sato
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device with a detection circuit to detect word...
- Patent number 4,807,193
- Issue date Feb 21, 1989
- Fujitsu Limited
- Yoshihiro Takemae
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor dynamic memory device having improved refreshing
- Patent number 4,787,067
- Issue date Nov 22, 1988
- Fujitsu Limited
- Yoshihiro Takemae
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor integrated circuit having function for switching oper...
- Patent number 4,771,407
- Issue date Sep 13, 1988
- Fujitsu Limited
- Yoshihiro Takemae
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor integrated circuit having function for switching oper...
- Patent number 4,742,486
- Issue date May 3, 1988
- Fujitsu Limited
- Yoshihiro Takemae
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor memory device
- Patent number 4,740,926
- Issue date Apr 26, 1988
- Fujitsu Limited
- Yoshihiro Takemae
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device having a circuit for compensating for d...
- Patent number 4,716,549
- Issue date Dec 29, 1987
- Fujitsu Limited
- Masao Nakano
- G11 - INFORMATION STORAGE
Information Patent Grant
Booster circuit
- Patent number 4,704,706
- Issue date Nov 3, 1987
- Fujitsu Limited
- Masao Nakano
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor memory and burn-in test method of semiconductor memory
- Publication number 20060291307
- Publication date Dec 28, 2006
- FUJITSU LIMITED
- Shinya Fujioka
- G11 - INFORMATION STORAGE
Information Patent Application
Test apparatus for semiconductor device
- Publication number 20030002365
- Publication date Jan 2, 2003
- FUJITSU LIMITED
- Masahiro Sato
- G11 - INFORMATION STORAGE

Nobumi Kodama

Person

Patents Grantslast 30 patents

Semiconductor memory and burn-in test method of semiconductor memory

Test apparatus for semiconductor device

Semiconductor memory device having common driver circuits for plura...

Semiconductor memory device with a detection circuit to detect word...

Semiconductor dynamic memory device having improved refreshing

Semiconductor integrated circuit having function for switching oper...

Semiconductor integrated circuit having function for switching oper...

Semiconductor memory device

Semiconductor memory device having a circuit for compensating for d...

Booster circuit

Patents Applicationslast 30 patents

Semiconductor memory and burn-in test method of semiconductor memory

Test apparatus for semiconductor device