Nobuyuki Moriwaki

Person

Kyoto, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor integrated circuit device and inspection method therefor
- Patent number 7,844,874
- Issue date Nov 30, 2010
- Panasonic Corporation
- Nobuyuki Moriwaki
- G01 - MEASURING TESTING
Information Patent Grant
Evaluation device for evaluating semiconductor device
- Patent number 6,927,594
- Issue date Aug 9, 2005
- Matsushita Electric Industrial Co., Ltd.
- Sugao Fujinaga
- G11 - INFORMATION STORAGE
Information Patent Grant
Reference potential generator and a semiconductor memory device hav...
- Patent number 6,067,265
- Issue date May 23, 2000
- Matsushita Electric Industrial Co., Ltd.
- Toshio Mukunoki
- G11 - INFORMATION STORAGE
Information Patent Grant
Ferroelectric semiconductor memory device
- Patent number 6,038,160
- Issue date Mar 14, 2000
- Matsushita Electronics Corporation
- Joji Nakane
- G11 - INFORMATION STORAGE
Information Patent Grant
Reference potential generator and a semiconductor memory device hav...
- Patent number 5,953,277
- Issue date Sep 14, 1999
- Matsushita Electric Industrial Co., Ltd.
- Toshio Mukunoki
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for operating a ferroelectric memory
- Patent number 5,898,608
- Issue date Apr 27, 1999
- Matsushita Electric Industrial Co., Ltd.
- Hiroshige Hirano
- G11 - INFORMATION STORAGE
Information Patent Grant
SRAM having load transistor formed above driver transistor
- Patent number 5,834,851
- Issue date Nov 10, 1998
- Hitachi, Ltd.
- Shuji Ikeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reference potential generator and a semiconductor memory device hav...
- Patent number 5,828,615
- Issue date Oct 27, 1998
- Matsushita Electric Industrial Co., Ltd.
- Toshio Mukunoki
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor integrated circuit device and process for fabricating...
- Patent number 5,767,554
- Issue date Jun 16, 1998
- Hitachi, Ltd.
- Shuji Ikeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ferroelectric memory devices and method for testing them
- Patent number 5,751,628
- Issue date May 12, 1998
- Matsushita Electronics Corporation
- Hiroshige Hirano
- G11 - INFORMATION STORAGE
Information Patent Grant
Process for fabricating a semiconductor integrated circuit device
- Patent number 5,731,219
- Issue date Mar 24, 1998
- Hitachi, Ltd.
- Shuji Ikeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process for fabricating a semiconductor integrated circuit device
- Patent number 5,700,704
- Issue date Dec 23, 1997
- Hitachi, Ltd.
- Shuji Ikeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ferroelectric memory device
- Patent number 5,675,530
- Issue date Oct 7, 1997
- Matsushita Electric Industrial Co., Ltd.
- Hiroshige Hirano
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor integrated circuit device and process for fabricating...
- Patent number 5,656,836
- Issue date Aug 12, 1997
- Hitachi, Ltd.
- Shuji Ikeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor integrated circuit device and process for fabricating...
- Patent number 5,652,457
- Issue date Jul 29, 1997
- Hitachi, Ltd.
- Shuji Ikeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor integrated circuit device and process for fabricating...
- Patent number 5,572,480
- Issue date Nov 5, 1996
- Hitachi Ltd.
- Shuji Ikeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory device including reverse and rewrite means
- Patent number 5,546,342
- Issue date Aug 13, 1996
- Matsushita Electric Industrial Co., Ltd.
- George Nakane
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device with redundant memory cell backup
- Patent number 5,523,974
- Issue date Jun 4, 1996
- Matsushita Electric Industrial Co., Ltd.
- Hiroshige Hirano
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device
- Patent number 5,515,312
- Issue date May 7, 1996
- Matsushita Electric Industrial Co., Ltd.
- Tetsuji Nakakuma
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device
- Patent number 5,467,302
- Issue date Nov 14, 1995
- Matsushita Electric Industrial Company, Ltd.
- Hiroshige Hirano
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor integrated circuit device having a compact arrangemen...
- Patent number 5,396,100
- Issue date Mar 7, 1995
- Hitachi, Ltd.
- Kohji Yamasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory device
- Patent number 5,392,234
- Issue date Feb 21, 1995
- Matsushita Electric Industrial Co., Ltd.
- Hiroshige Hirano
- G11 - INFORMATION STORAGE
Information Patent Grant
SRAM with dual word lines overlapping drive transistor gates
- Patent number 5,239,196
- Issue date Aug 24, 1993
- Shuji Ikeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High speed semiconductor memory having a direct-bypass signal path
- Patent number 5,146,427
- Issue date Sep 8, 1992
- Hitachi Ltd.
- Katsuro Sasaki
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device having flip-flop circuits
- Patent number 5,132,771
- Issue date Jul 21, 1992
- Hitachi, Ltd.
- Toshiaki Yamanaka
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device
- Patent number 5,025,422
- Issue date Jun 18, 1991
- Hitachi, Ltd.
- Nobuyuki Moriwaki
- G11 - INFORMATION STORAGE
Information Patent Grant
Static random-access memory having multilevel conductive layer
- Patent number 4,853,894
- Issue date Aug 1, 1989
- Hitachi, Ltd.
- Toshiaki Yamanaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory device and sense amplifier
- Patent number 4,841,486
- Issue date Jun 20, 1989
- Hitachi, Ltd.
- Osamu Minato
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device
- Patent number 4,797,717
- Issue date Jan 10, 1989
- Hitachi, Ltd.
- Koichiro Ishibashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory with automatic refresh means
- Patent number 4,747,082
- Issue date May 24, 1988
- Hitachi Ltd.
- Osamu Minato
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor integrated circuit device and inspection method therefor
- Publication number 20070234168
- Publication date Oct 4, 2007
- Nobuyuki Moriwaki
- G01 - MEASURING TESTING
Information Patent Application
Evaluation device for evaluating semiconductor device
- Publication number 20040257104
- Publication date Dec 23, 2004
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Sugao Fujinaga
- G11 - INFORMATION STORAGE

Nobuyuki Moriwaki

Person

Patents Grantslast 30 patents

Semiconductor integrated circuit device and inspection method therefor

Evaluation device for evaluating semiconductor device

Reference potential generator and a semiconductor memory device hav...

Ferroelectric semiconductor memory device

Reference potential generator and a semiconductor memory device hav...

Method for operating a ferroelectric memory

SRAM having load transistor formed above driver transistor

Reference potential generator and a semiconductor memory device hav...

Semiconductor integrated circuit device and process for fabricating...

Ferroelectric memory devices and method for testing them

Process for fabricating a semiconductor integrated circuit device

Process for fabricating a semiconductor integrated circuit device

Ferroelectric memory device

Semiconductor integrated circuit device and process for fabricating...

Semiconductor integrated circuit device and process for fabricating...

Semiconductor integrated circuit device and process for fabricating...

Semiconductor memory device including reverse and rewrite means

Semiconductor memory device with redundant memory cell backup

Semiconductor memory device

Semiconductor memory device

Semiconductor integrated circuit device having a compact arrangemen...

Semiconductor memory device

SRAM with dual word lines overlapping drive transistor gates

High speed semiconductor memory having a direct-bypass signal path

Semiconductor memory device having flip-flop circuits

Semiconductor memory device

Static random-access memory having multilevel conductive layer

Semiconductor memory device and sense amplifier

Semiconductor memory device

Semiconductor memory with automatic refresh means

Patents Applicationslast 30 patents

Semiconductor integrated circuit device and inspection method therefor

Evaluation device for evaluating semiconductor device