Nobuyuki Osakabe

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Kawagoe, JP

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Patents Grantslast 30 patents

Information Patent Grant
Specimen observation system for applying external magnetic field
- Patent number 6,838,675
- Issue date Jan 4, 2005
- Hitachi, Ltd.
- Ken Harada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Phase-contrast electron microscope and phase plate therefor
- Patent number 5,814,815
- Issue date Sep 29, 1998
- Hitachi, Ltd.
- Takao Matsumoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle guide apparatus and image viewing apparatus for ch...
- Patent number 5,811,805
- Issue date Sep 22, 1998
- Research Development Corporation of Japan
- Nobuyuki Osakabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron optical measurement apparatus
- Patent number 5,192,867
- Issue date Mar 9, 1993
- Hitachi, Ltd.
- Nobuyuki Osakabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reflection electron holography apparatus
- Patent number 4,998,788
- Issue date Mar 12, 1991
- Hitachi, Ltd.
- Nobuyuki Osakabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron holography apparatus
- Patent number 4,935,625
- Issue date Jun 19, 1990
- Hitachi, Ltd.
- Shuji Hasegawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Field emission type electron microscope using a multi-stage acceler...
- Patent number 4,642,461
- Issue date Feb 10, 1987
- Hitachi, Ltd.
- Junji Endo
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Magnetic field applying sample observing system
- Publication number 20040061066
- Publication date Apr 1, 2004
- Ken Harada
- H01 - BASIC ELECTRIC ELEMENTS