Norbert Wirth

Person

Unterschleissheim, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Information containing means for memory modules and memory chips
- Patent number 7,260,671
- Issue date Aug 21, 2007
- Infineon Technologies AG
- Eric Cordes
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus for signaling that a predetermined time value has elapsed
- Patent number 7,116,737
- Issue date Oct 3, 2006
- Infineon Technologies AG
- Georg Erhard Eggers
- G11 - INFORMATION STORAGE
Information Patent Grant
On chip scrambling
- Patent number 6,826,111
- Issue date Nov 30, 2004
- Infineon Technologies AG
- Ralf Schneider
- G11 - INFORMATION STORAGE
Information Patent Grant
Configuration for identifying contact faults during the testing of...
- Patent number 6,693,447
- Issue date Feb 17, 2004
- Siemens Aktiengesellschaft
- Dominique Savignac
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit, test structure and method for testing integrate...
- Patent number 6,618,303
- Issue date Sep 9, 2003
- Infineon Technologies AG
- Arndt Gruber
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuit configuration and method for synchronization
- Patent number 6,556,486
- Issue date Apr 29, 2003
- Infineon Technologies AG
- Herbert Benzinger
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor module for burn-in test configuration
- Patent number 6,426,640
- Issue date Jul 30, 2002
- Infineon Technologies AG
- Norbert Wirth
- G01 - MEASURING TESTING
Information Patent Grant
Circuit configuration for generating digital signals
- Patent number 6,064,228
- Issue date May 16, 2000
- Siemens Aktiengesellschaft
- Christian Sichert
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Fuse refresh circuit
- Patent number 5,905,687
- Issue date May 18, 1999
- Siemens Aktiengesellschaft
- Rudiger Brede
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated semiconductor memory configuration
- Patent number 5,537,352
- Issue date Jul 16, 1996
- Siemens Aktiengesellschaft
- Willibald Meyer
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated semiconductor memory array and method for operating the...
- Patent number 5,329,493
- Issue date Jul 12, 1994
- Siemens Aktiengesellschaft
- Willibald Meyer
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Device and method for detecting the overheating of a semiconductor...
- Publication number 20050133785
- Publication date Jun 23, 2005
- Infineon Technologies AG
- Georg Eggers
- G01 - MEASURING TESTING
Information Patent Application
Integrated memory circuit having storage capacitors which can be wr...
- Publication number 20030156446
- Publication date Aug 21, 2003
- Herbert Benzinger
- G11 - INFORMATION STORAGE
Information Patent Application
Information containing means for memory modules and memory chips
- Publication number 20030081444
- Publication date May 1, 2003
- Eric Cordes
- G11 - INFORMATION STORAGE
Information Patent Application
Apparatus for signaling that a predetermined time value has elapsed
- Publication number 20030072399
- Publication date Apr 17, 2003
- George Erhard Eggers
- G04 - HOROLOGY
Information Patent Application
On chip scrambling
- Publication number 20030048672
- Publication date Mar 13, 2003
- Ralf Schneider
- G11 - INFORMATION STORAGE
Information Patent Application
Input circuit for an integrated memory
- Publication number 20020075748
- Publication date Jun 20, 2002
- Herbert Benzinger
- G11 - INFORMATION STORAGE
Information Patent Application
Circuit configuration and method for synchronization
- Publication number 20020071335
- Publication date Jun 13, 2002
- Herbert Benzinger
- G11 - INFORMATION STORAGE
Information Patent Application
Integrated circuit, test structure and method for testing integrate...
- Publication number 20020020854
- Publication date Feb 21, 2002
- Arndt Gruber
- G11 - INFORMATION STORAGE

Norbert Wirth

Person

Patents Grantslast 30 patents

Information containing means for memory modules and memory chips

Apparatus for signaling that a predetermined time value has elapsed

On chip scrambling

Configuration for identifying contact faults during the testing of...

Integrated circuit, test structure and method for testing integrate...

Circuit configuration and method for synchronization

Semiconductor module for burn-in test configuration

Circuit configuration for generating digital signals

Fuse refresh circuit

Integrated semiconductor memory configuration

Integrated semiconductor memory array and method for operating the...

Patents Applicationslast 30 patents

Device and method for detecting the overheating of a semiconductor...

Integrated memory circuit having storage capacitors which can be wr...

Information containing means for memory modules and memory chips

Apparatus for signaling that a predetermined time value has elapsed

On chip scrambling

Input circuit for an integrated memory

Circuit configuration and method for synchronization

Integrated circuit, test structure and method for testing integrate...