Noriaki Arai

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Electron source, method for manufacturing the same, and electron be...
- Patent number 11,322,329
- Issue date May 3, 2022
- HITACHI HIGH-TECH CORPORATION
- Toshiaki Kusunoki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for separating cells, and device therefor
- Patent number 10,996,216
- Issue date May 4, 2021
- Toppan Printing Co., Ltd.
- Noriaki Arai
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Electron source and electron beam device using the same
- Patent number 10,707,046
- Issue date Jul 7, 2020
- HITACHI HIGH-TECH CORPORATION
- Toshiaki Kusunoki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Field emission electron source, method for manufacturing same, and...
- Patent number 10,586,674
- Issue date Mar 10, 2020
- Hitachi High-Technologies Corporation
- Toshiaki Kusunoki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam apparatus
- Patent number 10,522,319
- Issue date Dec 31, 2019
- Hitachi High-Technologies Corporation
- Keigo Kasuya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion source and ion beam device using same
- Patent number 9,640,360
- Issue date May 2, 2017
- Hitachi High-Technologies Corporation
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam device
- Patent number 9,508,521
- Issue date Nov 29, 2016
- Hitachi High-Technologies Corporation
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gas field ion source and method for using same, ion beam device, an...
- Patent number 8,847,173
- Issue date Sep 30, 2014
- Hitachi High-Technologies Corporation
- Yoshimi Kawanami
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Charged particle beam apparatus with cleaning photo-irradiation app...
- Patent number 8,835,884
- Issue date Sep 16, 2014
- Hitachi High-Technologies Corporation
- Noriaki Arai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam device
- Patent number 8,779,380
- Issue date Jul 15, 2014
- Hitachi High-Technologies Corporation
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 8,698,080
- Issue date Apr 15, 2014
- Hitachi High-Technologies Corporation
- Noriaki Arai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam device
- Patent number 8,563,944
- Issue date Oct 22, 2013
- Hitachi High-Technologies Corporation
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion microscope
- Patent number 8,455,841
- Issue date Jun 4, 2013
- Hitachi High-Technologies Corporation
- Norihide Saho
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam device
- Patent number 8,263,943
- Issue date Sep 11, 2012
- Hitachi High-Technologies Corporation
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrode unit and charged particle beam device
- Patent number 8,153,966
- Issue date Apr 10, 2012
- Hitachi High-Technologies Corporation
- Noriaki Arai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam adjusting method and charged particle beam ap...
- Patent number 7,705,300
- Issue date Apr 27, 2010
- Hitachi High-Technologies Corporation
- Hidetoshi Morokuma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 7,566,872
- Issue date Jul 28, 2009
- Hitachi High-Technologies Corporation
- Ritsuo Fukaya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 7,459,681
- Issue date Dec 2, 2008
- Hitachi High-Technologies Corporation
- Noriaki Arai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and charged particle beam irradiati...
- Patent number 7,408,172
- Issue date Aug 5, 2008
- Hitachi High-Technologies Corporation
- Mitsugu Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam adjustment method and apparatus
- Patent number 7,381,951
- Issue date Jun 3, 2008
- Hitachi High-Technologies Corporation
- Takashi Doi
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Charged particle beam apparatus and charged particle beam irradiati...
- Patent number 7,282,722
- Issue date Oct 16, 2007
- Hitachi High-Technologies Corporation
- Mitsugu Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 6,979,821
- Issue date Dec 27, 2005
- Hitachi, Ltd.
- Naomasa Suzuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and charged particle beam irradiati...
- Patent number 6,956,211
- Issue date Oct 18, 2005
- Hitachi High-Technologies Corporation
- Mitsugu Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 6,555,819
- Issue date Apr 29, 2003
- Hitachi, Ltd.
- Naomasa Suzuki
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ION BEAM DEVICE AND EMITTER TIP MILLING METHOD
- Publication number 20240203682
- Publication date Jun 20, 2024
- HITACHI HIGH-TECH CORPORATION
- Shinichi MATSUBARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Source, Method of Manufacturing the Same, And Electron Bea...
- Publication number 20230317401
- Publication date Oct 5, 2023
- Hitachi High-Tech Corporation
- Toshiaki KUSUNOKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Gun and Charged Particle Beam System
- Publication number 20230178325
- Publication date Jun 8, 2023
- Hitachi High-Tech Corporation
- Masahiro FUKUTA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Source, Electron Beam Device, and Method for Manufacturing...
- Publication number 20220415603
- Publication date Dec 29, 2022
- Hitachi High-Tech Corporation
- Toshiaki KUSUNOKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON SOURCE, METHOD FOR MANUFACTURING THE SAME, AND ELECTRON BE...
- Publication number 20210327674
- Publication date Oct 21, 2021
- HITACHI HIGH-TECH CORPORATION
- Toshiaki KUSUNOKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Source and Electron Beam Device Using the Same
- Publication number 20190385809
- Publication date Dec 19, 2019
- Hitachi High-Technologies Corporation
- Toshiaki KUSUNOKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Beam Apparatus
- Publication number 20190237289
- Publication date Aug 1, 2019
- Hitachi High-Technologies Corporation
- Keigo KASUYA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF REPLACING LIQUID MEDIUM AND FLOW CHANNEL DEVICE FOR THE M...
- Publication number 20190126278
- Publication date May 2, 2019
- TOPPAN PRINTING CO., LTD.
- Noriaki ARAI
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
METHOD AND KIT FOR TARGET MOLECULE DETECTION
- Publication number 20190085385
- Publication date Mar 21, 2019
- TOPPAN PRINTING CO., LTD.
- Yoichi Makino
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
Field Emission Electron Source, Method for Manufacturing Same, and...
- Publication number 20190066966
- Publication date Feb 28, 2019
- Hitachi High-Technologies Corporation
- Toshiaki KUSUNOKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR SEPARATING CELLS, AND DEVICE THEREFOR
- Publication number 20180038876
- Publication date Feb 8, 2018
- Toppan Printing Co., Ltd.
- Noriaki ARAI
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
ION BEAM DEVICE
- Publication number 20170076902
- Publication date Mar 16, 2017
- Hitachi High-Technologies Corporation
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION BEAM DEVICE
- Publication number 20140319370
- Publication date Oct 30, 2014
- Hiroyasu SHICHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION SOURCE AND ION BEAM DEVICE USING SAME
- Publication number 20140299768
- Publication date Oct 9, 2014
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE EMISSION GUN AND CHARGED PARTICLE RAY APPARATUS
- Publication number 20130264496
- Publication date Oct 10, 2013
- Hitachi High-Technologies Corporation
- Noriaki Arai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GAS FIELD ION SOURCE AND METHOD FOR USING SAME, ION BEAM DEVICE, AN...
- Publication number 20130119252
- Publication date May 16, 2013
- Yoshimi Kawanami
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
ION BEAM DEVICE
- Publication number 20120319003
- Publication date Dec 20, 2012
- Hitachi High-Technologies Corporation
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE MICROSCOPE
- Publication number 20120217391
- Publication date Aug 30, 2012
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GAS FIELD IONIZATION ION SOURCE APPARATUS AND SCANNING CHARGED PART...
- Publication number 20120132802
- Publication date May 31, 2012
- Noriaki Arai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION MICROSCOPE
- Publication number 20120097863
- Publication date Apr 26, 2012
- Norihide Saho
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION BEAM DEVICE
- Publication number 20110266465
- Publication date Nov 3, 2011
- Hitachi High-Technologies Corporation
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION BEAM DEVICE
- Publication number 20110147609
- Publication date Jun 23, 2011
- Hitachi High-Technologies Corporation
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRODE UNIT AND CHARGED PARTICLE BEAM DEVICE
- Publication number 20110068265
- Publication date Mar 24, 2011
- Noriaki Arai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM ADJUSTING METHOD AND CHARGED PARTICLE BEAM AP...
- Publication number 20100181478
- Publication date Jul 22, 2010
- Hitachi High-Technologies Corporation
- Hidetoshi Morokuma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning electron microscope
- Publication number 20090065694
- Publication date Mar 12, 2009
- Noriaki Arai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS AND CHARGED PARTICLE BEAM IRRADIATI...
- Publication number 20080042074
- Publication date Feb 21, 2008
- Mitsugu Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning electron microscope
- Publication number 20070057183
- Publication date Mar 15, 2007
- Noriaki Arai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning electron microscope
- Publication number 20070045539
- Publication date Mar 1, 2007
- Ritsuo Fukaya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle beam adjustment method and apparatus
- Publication number 20060043293
- Publication date Mar 2, 2006
- Takashi Doi
- G01 - MEASURING TESTING
Information Patent Application
Charged particle beam apparatus and charged particle beam irradiati...
- Publication number 20050253083
- Publication date Nov 17, 2005
- Mitsugu Sato
- H01 - BASIC ELECTRIC ELEMENTS

Noriaki Arai

Person

Patents Grantslast 30 patents

Electron source, method for manufacturing the same, and electron be...

Method for separating cells, and device therefor

Electron source and electron beam device using the same

Field emission electron source, method for manufacturing same, and...

Electron beam apparatus

Ion source and ion beam device using same

Ion beam device

Gas field ion source and method for using same, ion beam device, an...

Charged particle beam apparatus with cleaning photo-irradiation app...

Ion beam device

Scanning electron microscope

Ion beam device

Ion microscope

Ion beam device

Electrode unit and charged particle beam device

Charged particle beam adjusting method and charged particle beam ap...

Scanning electron microscope

Scanning electron microscope

Charged particle beam apparatus and charged particle beam irradiati...

Charged particle beam adjustment method and apparatus

Charged particle beam apparatus and charged particle beam irradiati...

Scanning electron microscope

Charged particle beam apparatus and charged particle beam irradiati...

Scanning electron microscope

Patents Applicationslast 30 patents

ION BEAM DEVICE AND EMITTER TIP MILLING METHOD

Electron Source, Method of Manufacturing the Same, And Electron Bea...

Charged Particle Gun and Charged Particle Beam System

Electron Source, Electron Beam Device, and Method for Manufacturing...

ELECTRON SOURCE, METHOD FOR MANUFACTURING THE SAME, AND ELECTRON BE...

Electron Source and Electron Beam Device Using the Same

Electron Beam Apparatus

METHOD OF REPLACING LIQUID MEDIUM AND FLOW CHANNEL DEVICE FOR THE M...

METHOD AND KIT FOR TARGET MOLECULE DETECTION

Field Emission Electron Source, Method for Manufacturing Same, and...

METHOD FOR SEPARATING CELLS, AND DEVICE THEREFOR

ION BEAM DEVICE

ION BEAM DEVICE

ION SOURCE AND ION BEAM DEVICE USING SAME

CHARGED PARTICLE EMISSION GUN AND CHARGED PARTICLE RAY APPARATUS

GAS FIELD ION SOURCE AND METHOD FOR USING SAME, ION BEAM DEVICE, AN...

ION BEAM DEVICE

CHARGED PARTICLE MICROSCOPE

GAS FIELD IONIZATION ION SOURCE APPARATUS AND SCANNING CHARGED PART...

ION MICROSCOPE

ION BEAM DEVICE

ION BEAM DEVICE

ELECTRODE UNIT AND CHARGED PARTICLE BEAM DEVICE

CHARGED PARTICLE BEAM ADJUSTING METHOD AND CHARGED PARTICLE BEAM AP...

Scanning electron microscope

CHARGED PARTICLE BEAM APPARATUS AND CHARGED PARTICLE BEAM IRRADIATI...

Scanning electron microscope

Scanning electron microscope

Charged particle beam adjustment method and apparatus

Charged particle beam apparatus and charged particle beam irradiati...