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Noriaki Okumiya
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Fujisawa, JP
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last 30 patents
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Patent Grant
SRAM-based semiconductor integrated circuit testing element
Patent number
6,445,002
Issue date
Sep 3, 2002
Kabushiki Kaisha Toshiba
Takehiro Hashimoto
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Semiconductor integrated circuit device, method of estimating failu...
Patent number
6,223,097
Issue date
Apr 24, 2001
Kabushiki Kaisha Toshiba
Takehiro Hashimoto
H01 - BASIC ELECTRIC ELEMENTS