Norikazu MIZUOCHI

Person

Osaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Magnetic field measurement apparatus and magnetic field measurement...
- Patent number 12,140,648
- Issue date Nov 12, 2024
- Kyocera Document Solutions, Inc.
- Yoshiharu Yoshii
- G01 - MEASURING TESTING
Information Patent Grant
Excitation light irradiating apparatus and excitation light irradia...
- Patent number 12,066,392
- Issue date Aug 20, 2024
- Sumida Corporation
- Masateru Hashimoto
- G01 - MEASURING TESTING
Information Patent Grant
Measuring device and measuring method
- Patent number 11,988,729
- Issue date May 21, 2024
- Kyoto University
- Norikazu Mizuochi
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic field measurement apparatus and magnetic field measurement...
- Patent number 11,933,865
- Issue date Mar 19, 2024
- Sumida Corporation
- Yoshiharu Yoshii
- G01 - MEASURING TESTING
Information Patent Grant
Measurement apparatus and measurement method
- Patent number 11,808,831
- Issue date Nov 7, 2023
- SUMIDA CORPORATION
- David Ernst Herbschleb
- G01 - MEASURING TESTING
Information Patent Grant
High-frequency magnetic field generating device
- Patent number 11,668,778
- Issue date Jun 6, 2023
- Sumida Corporation
- Yoshiharu Yoshii
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic field measurement apparatus and magnetic field measurement...
- Patent number 11,619,687
- Issue date Apr 4, 2023
- Sumida Corporation
- Yoshiharu Yoshii
- G01 - MEASURING TESTING
Information Patent Grant
Sensor element, measuring device, method for manufacturing sensor e...
- Patent number 11,335,779
- Issue date May 17, 2022
- Kyoto University
- Norikazu Mizuochi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Magnetic field measurement apparatus and magnetic field measurement...
- Patent number 10,969,445
- Issue date Apr 6, 2021
- Sumida Corporation
- Yoshiharu Yoshii
- G01 - MEASURING TESTING
Information Patent Grant
High-frequency magnetic field generating device
- Patent number 10,921,413
- Issue date Feb 16, 2021
- Sumida Corporation
- Yoshiharu Yoshii
- G01 - MEASURING TESTING
Information Patent Grant
Diamond crystal, diamond devices, magnetic sensor, magnetic sensor...
- Patent number 10,324,142
- Issue date Jun 18, 2019
- Japan Science and Technology Agency
- Mutsuko Hatano
- C30 - CRYSTAL GROWTH

Patents Applicationslast 30 patents

Information Patent Application
DIGITIZING DEVICE AND DIGITIZING METHOD
- Publication number 20240418809
- Publication date Dec 19, 2024
- Sumida Corporation
- Yoshiharu YOSHII
- B82 - NANO-TECHNOLOGY
Information Patent Application
VOID DEFECT FORMING METHOD, DEVICE, AND DIAMOND MANUFACTURING METHOD
- Publication number 20240410083
- Publication date Dec 12, 2024
- KYOTO UNIVERSITY
- Norikazu MIZUOCHI
- C01 - INORGANIC CHEMISTRY
Information Patent Application
MEASUREMENT DEVICE AND MEASUREMENT METHOD
- Publication number 20240410843
- Publication date Dec 12, 2024
- Sumida Corporation
- Yoshiharu YOSHII
- G01 - MEASURING TESTING
Information Patent Application
PHASE DIFFERENCE MEASUREMENT DEVICE, MEASUREMENT METHOD, AND ELECTR...
- Publication number 20240377485
- Publication date Nov 14, 2024
- KYOTO UNIVERSITY
- Norikazu MIZUOCHI
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC FIELD MEASUREMENT APPARATUS AND MAGNETIC FIELD MEASUREMENT...
- Publication number 20240255594
- Publication date Aug 1, 2024
- Sumida Corporation
- Yoshiharu YOSHII
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC FIELD MEASUREMENT APPARATUS AND MAGNETIC FIELD MEASUREMENT...
- Publication number 20240255588
- Publication date Aug 1, 2024
- Sumida Corporation
- Shingo HAMADA
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE SENSITIVE PROBE
- Publication number 20240044722
- Publication date Feb 8, 2024
- DAICEL CORPORATION
- Masahiro NISHIKAWA
- G01 - MEASURING TESTING
Information Patent Application
HIGH-FREQUENCY MAGNETIC FIELD GENERATING DEVICE
- Publication number 20230258755
- Publication date Aug 17, 2023
- Sumida Corporation
- Yoshiharu YOSHII
- G01 - MEASURING TESTING
Information Patent Application
EXCITATION LIGHT IRRADIATING APPARATUS AND EXCITATION LIGHT IRRADIA...
- Publication number 20230194448
- Publication date Jun 22, 2023
- Sumida Corporation
- Masateru HASHIMOTO
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC FIELD MEASUREMENT APPARATUS AND MAGNETIC FIELD MEASUREMENT...
- Publication number 20230184853
- Publication date Jun 15, 2023
- Sumida Corporation
- Yoshiharu YOSHII
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC FIELD MEASUREMENT APPARATUS AND MAGNETIC FIELD MEASUREMENT...
- Publication number 20230051777
- Publication date Feb 16, 2023
- Sumida Corporation
- Yoshiharu YOSHII
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPARATUS AND MEASUREMENT METHOD
- Publication number 20220373628
- Publication date Nov 24, 2022
- Sumida Corporation
- David Ernst HERBSCHLEB
- G01 - MEASURING TESTING
Information Patent Application
MEASURING DEVICE AND MEASURING METHOD
- Publication number 20220349964
- Publication date Nov 3, 2022
- KYOTO UNIVERSITY
- Norikazu MIZUOCHI
- G01 - MEASURING TESTING
Information Patent Application
SENSOR ELEMENT, MEASUREMENT DEVICE, AND MEASUREMENT METHOD
- Publication number 20210396693
- Publication date Dec 23, 2021
- KYOTO UNIVERSITY
- Norikazu MIZUOCHI
- G01 - MEASURING TESTING
Information Patent Application
HIGH-FREQUENCY MAGNETIC FIELD GENERATING DEVICE
- Publication number 20210199744
- Publication date Jul 1, 2021
- Sumida Corporation
- Yoshiharu YOSHII
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC FIELD MEASUREMENT APPARATUS AND MAGNETIC FIELD MEASUREMENT...
- Publication number 20210190883
- Publication date Jun 24, 2021
- Sumida Corporation
- Yoshiharu YOSHII
- G01 - MEASURING TESTING
Information Patent Application
SENSOR ELEMENT, MEASURING DEVICE, METHOD FOR MANUFACTURING SENSOR E...
- Publication number 20200411646
- Publication date Dec 31, 2020
- KYOTO UNIVERSITY
- Norikazu MIZUOCHI
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
MAGNETIC FIELD MEASUREMENT APPARATUS AND MAGNETIC FIELD MEASUREMENT...
- Publication number 20200011939
- Publication date Jan 9, 2020
- Sumida Corporation
- Yoshiharu YOSHII
- G01 - MEASURING TESTING
Information Patent Application
HIGH-FREQUENCY MAGNETIC FIELD GENERATING DEVICE
- Publication number 20190079157
- Publication date Mar 14, 2019
- Sumida Corporation
- Yoshiharu YOSHII
- G01 - MEASURING TESTING
Information Patent Application
DIAMOND CRYSTAL, DIAMOND DEVICES, MAGNETIC SENSOR, MAGNETIC SENSOR...
- Publication number 20160334474
- Publication date Nov 17, 2016
- Japan Science and Technology Agency
- Mutsuko HATANO
- C30 - CRYSTAL GROWTH

Norikazu MIZUOCHI

Person

Patents Grantslast 30 patents

Magnetic field measurement apparatus and magnetic field measurement...

Excitation light irradiating apparatus and excitation light irradia...

Measuring device and measuring method

Magnetic field measurement apparatus and magnetic field measurement...

Measurement apparatus and measurement method

High-frequency magnetic field generating device

Magnetic field measurement apparatus and magnetic field measurement...

Sensor element, measuring device, method for manufacturing sensor e...

Magnetic field measurement apparatus and magnetic field measurement...

High-frequency magnetic field generating device

Diamond crystal, diamond devices, magnetic sensor, magnetic sensor...

Patents Applicationslast 30 patents

DIGITIZING DEVICE AND DIGITIZING METHOD

VOID DEFECT FORMING METHOD, DEVICE, AND DIAMOND MANUFACTURING METHOD

MEASUREMENT DEVICE AND MEASUREMENT METHOD

PHASE DIFFERENCE MEASUREMENT DEVICE, MEASUREMENT METHOD, AND ELECTR...

MAGNETIC FIELD MEASUREMENT APPARATUS AND MAGNETIC FIELD MEASUREMENT...

MAGNETIC FIELD MEASUREMENT APPARATUS AND MAGNETIC FIELD MEASUREMENT...

TEMPERATURE SENSITIVE PROBE

HIGH-FREQUENCY MAGNETIC FIELD GENERATING DEVICE

EXCITATION LIGHT IRRADIATING APPARATUS AND EXCITATION LIGHT IRRADIA...

MAGNETIC FIELD MEASUREMENT APPARATUS AND MAGNETIC FIELD MEASUREMENT...

MAGNETIC FIELD MEASUREMENT APPARATUS AND MAGNETIC FIELD MEASUREMENT...

MEASUREMENT APPARATUS AND MEASUREMENT METHOD

MEASURING DEVICE AND MEASURING METHOD

SENSOR ELEMENT, MEASUREMENT DEVICE, AND MEASUREMENT METHOD

HIGH-FREQUENCY MAGNETIC FIELD GENERATING DEVICE

MAGNETIC FIELD MEASUREMENT APPARATUS AND MAGNETIC FIELD MEASUREMENT...

SENSOR ELEMENT, MEASURING DEVICE, METHOD FOR MANUFACTURING SENSOR E...

MAGNETIC FIELD MEASUREMENT APPARATUS AND MAGNETIC FIELD MEASUREMENT...

HIGH-FREQUENCY MAGNETIC FIELD GENERATING DEVICE

DIAMOND CRYSTAL, DIAMOND DEVICES, MAGNETIC SENSOR, MAGNETIC SENSOR...