Norimasa Nishimura

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Yokohama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Sample processing apparatus and method for removing charge on sampl...
- Patent number 6,507,029
- Issue date Jan 14, 2003
- Hitachi, Ltd.
- Norimasa Nishimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for observing or processing and analyzing usin...
- Patent number 6,476,387
- Issue date Nov 5, 2002
- Hitachi, Ltd.
- Norimasa Nishimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for inspecting or measuring a sample based on...
- Patent number 6,465,781
- Issue date Oct 15, 2002
- Hitachi, Ltd.
- Norimasa Nishimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and its apparatus for detecting a secondary electron beam im...
- Patent number 6,303,932
- Issue date Oct 16, 2001
- Hitachi, Ltd.
- Yuichi Hamamura
- H01 - BASIC ELECTRIC ELEMENTS