Norio Fukasawa

Person

Kawasaki, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Laser annealing method and laser annealing apparatus
- Patent number 8,357,620
- Issue date Jan 22, 2013
- Sony Corporation
- Katsuji Takagi
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Semiconductor device having a functional surface
- Patent number 7,586,185
- Issue date Sep 8, 2009
- Fujitsu Microelectronics Limited
- Norio Fukasawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of fabricating semiconductor device
- Patent number 7,556,985
- Issue date Jul 7, 2009
- Fujitsu Microelectronics Limited
- Norio Fukasawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having a ball grid array and a fabrication pro...
- Patent number 7,064,047
- Issue date Jun 20, 2006
- Fujitsu Limited
- Norio Fukasawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of fabricating a semiconductor device having a groove formed...
- Patent number 6,987,054
- Issue date Jan 17, 2006
- Fujitsu Limited
- Norio Fukasawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and mold for manufacturing semiconductor device, semiconduct...
- Patent number 6,881,611
- Issue date Apr 19, 2005
- Fujitsu Limited
- Norio Fukasawa
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Semiconductor device having a ball grid array and a fabrication pro...
- Patent number 6,784,542
- Issue date Aug 31, 2004
- Fujitsu Limited
- Norio Fukasawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having a ball grid array and a fabrication pro...
- Patent number 6,657,282
- Issue date Dec 2, 2003
- Fujitsu Limited
- Norio Fukasawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test method using semiconductor test apparatus
- Patent number 6,518,784
- Issue date Feb 11, 2003
- Fujitsu Limited
- Norio Fukasawa
- G01 - MEASURING TESTING
Information Patent Grant
Wafer level semiconductor device and method of manufacturing the same
- Patent number 6,515,347
- Issue date Feb 4, 2003
- Fujitsu Limited
- Yasuhiro Shinma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of producing semiconductor devices having easy separability...
- Patent number 6,511,620
- Issue date Jan 28, 2003
- Fujitsu Limited
- Toshimi Kawahara
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Semiconductor device having increased reliability and method of pro...
- Patent number 6,507,092
- Issue date Jan 14, 2003
- Fujitsu Limited
- Norio Fukasawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mold for fabricating semiconductor devices
- Patent number 6,471,501
- Issue date Oct 29, 2002
- Fujitsu Limited
- Yasuhiro Shinma
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Semiconductor device and method of production of the semiconductor...
- Patent number 6,469,370
- Issue date Oct 22, 2002
- Fujitsu Limited
- Toshimi Kawahara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having a ball grid array and a fabrication pro...
- Patent number 6,455,920
- Issue date Sep 24, 2002
- Fujitsu Limited
- Norio Fukasawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having improved electrical characteristics and...
- Patent number 6,437,432
- Issue date Aug 20, 2002
- Fujitsu Limited
- Masamitsu Ikumo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor inspection apparatus and inspection method using the...
- Patent number 6,388,461
- Issue date May 14, 2002
- Fujitsu Limited
- Norio Fukasawa
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor test apparatus and test method using the same
- Patent number 6,333,638
- Issue date Dec 25, 2001
- Fujitsu Limited
- Norio Fukasawa
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor inspection apparatus and inspection method using the...
- Patent number 6,246,249
- Issue date Jun 12, 2001
- Fujitsu Limited
- Norio Fukasawa
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device in which chip electrodes are connected to term...
- Patent number 6,013,944
- Issue date Jan 11, 2000
- Fujitsu Limited
- Susumu Moriya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device including pad portion for testing
- Patent number 5,767,528
- Issue date Jun 16, 1998
- Fujitsu Limited
- Yukinori Sumi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
HOLDING HEAD, FEEDING APPARATUS, FEEDING METHOD, IMPLEMENTING APPAR...
- Publication number 20150208560
- Publication date Jul 23, 2015
- SONY CORPORATION
- Shoichi Baba
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
LASER ANNEALING METHOD AND LASER ANNEALING APPARATUS
- Publication number 20100093112
- Publication date Apr 15, 2010
- SONY CORPORATION
- Katsuji Takagi
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Semiconductor device and a semiconductor device manufacturing method
- Publication number 20090291515
- Publication date Nov 26, 2009
- Fujitsu Microelectronics Limited
- Norio Fukasawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20080224333
- Publication date Sep 18, 2008
- FUJITSU LIMITED
- Norio Fukasawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and a semiconductor device manufacturing method
- Publication number 20060214294
- Publication date Sep 28, 2006
- FUJITSU LIMITED
- Norio Fukasawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of fabricating semiconductor device
- Publication number 20060030127
- Publication date Feb 9, 2006
- FUJITSU LIMITED
- Norio Fukasawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device having a ball grid array and a fabrication pro...
- Publication number 20040259346
- Publication date Dec 23, 2004
- FUJITSU LIMITED
- Norio Fukasawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device having a ball grid array and a fabrication pro...
- Publication number 20040012088
- Publication date Jan 22, 2004
- Fujitsu Limited,
- Norio Fukasawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device having an organic material layer and method fo...
- Publication number 20020127776
- Publication date Sep 12, 2002
- FUJITSU LIMITED
- Shinsuke Nakajo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device having a ball grid array and a fabrication pro...
- Publication number 20020089054
- Publication date Jul 11, 2002
- FUJITSU LIMITED
- Norio Fukasawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device having a ball grid array and a fabrication pro...
- Publication number 20020089040
- Publication date Jul 11, 2002
- FIJITSU LIMITED
- Norio Fukasawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor test apparatus and test method using the same
- Publication number 20020036509
- Publication date Mar 28, 2002
- FUJITSU LIMITED
- Norio Fukasawa
- G01 - MEASURING TESTING
Information Patent Application
Method and mold for manufacturing semiconductor device, semiconduct...
- Publication number 20020030258
- Publication date Mar 14, 2002
- FUJITSU LIMITED
- Norio Fukasawa
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
Semiconductor device having improved electrical characteristic and...
- Publication number 20010023981
- Publication date Sep 27, 2001
- Masamitsu Ikumo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE HAVING A BALL GRID ARRAY AND A FABRICATION PRO...
- Publication number 20010011772
- Publication date Aug 9, 2001
- FUJITSU LIMITED
- NORIO FUKASAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor inspection apparatus and inspection method using the...
- Publication number 20010010469
- Publication date Aug 2, 2001
- FUJITSU LIMITED
- Norio Fukasawa
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND MOLD FOR MANUFACTURING SEMICONDUCTOR DEVICE, SEMICONDUCT...
- Publication number 20010003049
- Publication date Jun 7, 2001
- NORIO FUKASAWA
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL

Norio Fukasawa

Person

Patents Grantslast 30 patents

Laser annealing method and laser annealing apparatus

Semiconductor device having a functional surface

Method of fabricating semiconductor device

Semiconductor device having a ball grid array and a fabrication pro...

Method of fabricating a semiconductor device having a groove formed...

Method and mold for manufacturing semiconductor device, semiconduct...

Semiconductor device having a ball grid array and a fabrication pro...

Semiconductor device having a ball grid array and a fabrication pro...

Test method using semiconductor test apparatus

Wafer level semiconductor device and method of manufacturing the same

Method of producing semiconductor devices having easy separability...

Semiconductor device having increased reliability and method of pro...

Mold for fabricating semiconductor devices

Semiconductor device and method of production of the semiconductor...

Semiconductor device having a ball grid array and a fabrication pro...

Semiconductor device having improved electrical characteristics and...

Semiconductor inspection apparatus and inspection method using the...

Semiconductor test apparatus and test method using the same

Semiconductor inspection apparatus and inspection method using the...

Semiconductor device in which chip electrodes are connected to term...

Semiconductor device including pad portion for testing

Patents Applicationslast 30 patents

HOLDING HEAD, FEEDING APPARATUS, FEEDING METHOD, IMPLEMENTING APPAR...

LASER ANNEALING METHOD AND LASER ANNEALING APPARATUS

Semiconductor device and a semiconductor device manufacturing method

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME

Semiconductor device and a semiconductor device manufacturing method

Method of fabricating semiconductor device

Semiconductor device having a ball grid array and a fabrication pro...

Semiconductor device having a ball grid array and a fabrication pro...

Semiconductor device having an organic material layer and method fo...

Semiconductor device having a ball grid array and a fabrication pro...

Semiconductor device having a ball grid array and a fabrication pro...

Semiconductor test apparatus and test method using the same

Method and mold for manufacturing semiconductor device, semiconduct...

Semiconductor device having improved electrical characteristic and...

SEMICONDUCTOR DEVICE HAVING A BALL GRID ARRAY AND A FABRICATION PRO...

Semiconductor inspection apparatus and inspection method using the...

METHOD AND MOLD FOR MANUFACTURING SEMICONDUCTOR DEVICE, SEMICONDUCT...