Norio Hasegawa

Person

Nishitama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Spectrum measuring device and spectrum measuring method
- Patent number 11,391,630
- Issue date Jul 19, 2022
- Azbil Corporation
- Norio Hasegawa
- G01 - MEASURING TESTING
Information Patent Grant
Cell survival rate determining device
- Patent number 10,870,828
- Issue date Dec 22, 2020
- AZBIL CORPORATION
- Norio Hasegawa
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Cell survival rate determining device and cell survival rate determ...
- Patent number 10,627,337
- Issue date Apr 21, 2020
- AZBIL CORPORATION
- Norio Hasegawa
- G01 - MEASURING TESTING
Information Patent Grant
Pattern measurement device, and computer program for measuring pattern
- Patent number 10,545,018
- Issue date Jan 28, 2020
- Hitachi High-Technologies Corporation
- Satoru Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern-measuring apparatus and semiconductor-measuring system
- Patent number 10,445,875
- Issue date Oct 15, 2019
- Hitachi High-Technologies Corporation
- Yasutaka Toyoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fluorescent particle measuring method
- Patent number 10,302,548
- Issue date May 28, 2019
- Azbil Corporation
- Norio Hasegawa
- G01 - MEASURING TESTING
Information Patent Grant
Pattern-measuring apparatus and semiconductor-measuring system
- Patent number 9,990,708
- Issue date Jun 5, 2018
- Hitachi High-Technologies Corporation
- Yasutaka Toyoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern measurement device, evaluation method of polymer compounds...
- Patent number 9,589,343
- Issue date Mar 7, 2017
- Hitachi High-Technologies Corporation
- Miki Isawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Phase shift mask, method of forming asymmetric pattern, method of m...
- Patent number 9,390,934
- Issue date Jul 12, 2016
- Hitachi High-Technologies Corporation
- Kazuyuki Kakuta
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Pattern dimension measurement method and charged particle beam appa...
- Patent number 9,297,649
- Issue date Mar 29, 2016
- Hitachi High-Technologies Corporation
- Hiroki Kawada
- G01 - MEASURING TESTING
Information Patent Grant
Image processing apparatus
- Patent number 9,183,622
- Issue date Nov 10, 2015
- Hitachi High-Technologies Corporation
- Yasutaka Toyoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern measuring apparatus
- Patent number 9,024,272
- Issue date May 5, 2015
- Hitachi High-Technologies Corporation
- Kei Sakai
- G01 - MEASURING TESTING
Information Patent Grant
Estimating shape based on comparison between actual waveform and li...
- Patent number 8,671,366
- Issue date Mar 11, 2014
- Hitachi High-Technologies Corporation
- Maki Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for pattern position and overlay measurement
- Patent number 8,148,682
- Issue date Apr 3, 2012
- Hitachi, Ltd.
- Shoji Hotta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Transmitter
- Patent number 8,085,870
- Issue date Dec 27, 2011
- Hitachi Kokusai Electric Inc.
- Takashi Okada
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Transmitter
- Patent number 7,974,581
- Issue date Jul 5, 2011
- Hitachi Kokusai Electric, Inc.
- Takashi Okada
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Transmitter
- Patent number 7,529,316
- Issue date May 5, 2009
- Hitachi Kokusai Electric Inc.
- Norio Hasegawa
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Transmitter for suppressing a variation in input level of a multica...
- Patent number 7,489,907
- Issue date Feb 10, 2009
- Hitachi Kokusai Electric Inc.
- Norio Hasegawa
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Manufacturing method of semiconductor integrated circuit device
- Patent number 7,387,867
- Issue date Jun 17, 2008
- Hitachi, Ltd.
- Norio Hasegawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of fabricating a semiconductor integrated circuit that inclu...
- Patent number 7,361,530
- Issue date Apr 22, 2008
- Renesas Technology Corporation
- Tsuneo Terasawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fabrication method of semiconductor integrated circuit device and m...
- Patent number 7,252,910
- Issue date Aug 7, 2007
- Renesas Technology Corp.
- Norio Hasegawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of fabricating a semiconductor integrated circuit that inclu...
- Patent number 7,205,222
- Issue date Apr 17, 2007
- Renesas Technology Corp.
- Tsuneo Terasawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing semiconductor integrated circuit devices
- Patent number 7,172,853
- Issue date Feb 6, 2007
- Renesas Technology Corp.
- Norio Hasegawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of manufacturing semiconductor integrated circuit device opt...
- Patent number 7,125,651
- Issue date Oct 24, 2006
- Renesas Technology Corp.
- Norio Hasegawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Photomask and pattern forming method employing the same
- Patent number 7,115,344
- Issue date Oct 3, 2006
- Renesas Technology Corp.
- Norio Hasegawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Semiconductor integrated circuit device and manufacturing method th...
- Patent number 7,042,038
- Issue date May 9, 2006
- Hitachi, Ltd.
- Makoto Yoshida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Manufacturing method of semiconductor integrated circuit device
- Patent number 7,001,712
- Issue date Feb 21, 2006
- Renesas Technology Corp.
- Akira Imai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing integrated circuit
- Patent number 6,958,292
- Issue date Oct 25, 2005
- Renesas Technology Corp.
- Norio Hasegawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fabrication method of semiconductor integrated circuit device and mask
- Patent number 6,939,649
- Issue date Sep 6, 2005
- Renesas Technology Corp.
- Shoji Hotta
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of manufacturing integrated circuit
- Patent number 6,936,406
- Issue date Aug 30, 2005
- Renesas Technology Corp.
- Norio Hasegawa
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
DEVICE OF MEASURING AMOUNT OF LIPID ACCUMULATION IN MICROALGAE AND...
- Publication number 20220010260
- Publication date Jan 13, 2022
- AZBIL CORPORATION
- Norio HASEGAWA
- G01 - MEASURING TESTING
Information Patent Application
SPECTRUM MEASURING DEVICE AND SPECTRUM MEASURING METHOD
- Publication number 20210181024
- Publication date Jun 17, 2021
- AZBIL CORPORATION
- Norio Hasegawa
- G01 - MEASURING TESTING
Information Patent Application
CELL SURVIVAL RATE DETERMINING DEVICE
- Publication number 20180312797
- Publication date Nov 1, 2018
- AZBIL CORPORATION
- Norio HASEGAWA
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
CELL SURVIVAL RATE DETERMINING DEVICE AND CELL SURVIVAL RATE DETERM...
- Publication number 20180306703
- Publication date Oct 25, 2018
- AZBIL CORPORATION
- Norio Hasegawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Pattern-Measuring Apparatus and Semiconductor-Measuring System
- Publication number 20180247400
- Publication date Aug 30, 2018
- Hitachi High-Technologies Corporation
- Yasutaka TOYODA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FLUORESCENT PARTICLE MEASURING METHOD
- Publication number 20170059470
- Publication date Mar 2, 2017
- AZBIL CORPORATION
- Norio HASEGAWA
- G01 - MEASURING TESTING
Information Patent Application
Pattern Measurement Device, and Computer Program for Measuring Pattern
- Publication number 20160320182
- Publication date Nov 3, 2016
- Hitachi High-Technologies Corporation
- Satoru YAMAGUCHI
- G01 - MEASURING TESTING
Information Patent Application
Pattern-Measuring Apparatus and Semiconductor-Measuring System
- Publication number 20160005157
- Publication date Jan 7, 2016
- Hitachi High-Technologies Corporation
- Yasutaka TOYODA
- G01 - MEASURING TESTING
Information Patent Application
Pattern Measurement Device, Evaluation Method of Polymer Compounds...
- Publication number 20150243008
- Publication date Aug 27, 2015
- Hitachi High-Technologies Corporation
- Miki Isawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PHASE SHIFT MASK, METHOD OF FORMING ASYMMETRIC PATTERN, METHOD OF M...
- Publication number 20140302679
- Publication date Oct 9, 2014
- Hitachi High-Technologies Corporation
- Kazuyuki Kakuta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICROORGANISM DETECTING APPARATUS AND MICROORGANISM DETECTING METHOD
- Publication number 20140255980
- Publication date Sep 11, 2014
- AZBIL CORPORATION
- Norio HASEGAWA
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
DIFFRACTION GRATING MANUFACTURING METHOD, SPECTROPHOTOMETER, AND SE...
- Publication number 20140092384
- Publication date Apr 3, 2014
- Hitachi High-Technologies Corporation
- Yoshisada Ebata
- G02 - OPTICS
Information Patent Application
MICROORGANISM DETECTING APPARATUS CALIBRATION METHOD AND MICROORGAN...
- Publication number 20140077100
- Publication date Mar 20, 2014
- AZBIL CORPORATION
- Norio Hasegawa
- G01 - MEASURING TESTING
Information Patent Application
PATTERN DIMENSION MEASUREMENT METHOD AND CHARGED PARTICLE BEAM APPA...
- Publication number 20140048706
- Publication date Feb 20, 2014
- Hitachi High-Technologies Corporation
- Hiroki Kawada
- G01 - MEASURING TESTING
Information Patent Application
IMAGE PROCESSING APPARATUS AND COMPUTER PROGRAM
- Publication number 20130279793
- Publication date Oct 24, 2013
- Hitachi High-Technologies Corporation
- Yasutaka Toyoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MICROORGANISM DETECTING APPARATUS CALIBRATION METHOD AND MICROORGAN...
- Publication number 20130161536
- Publication date Jun 27, 2013
- AZBIL CORPORATION
- Norio Hasegawa
- G01 - MEASURING TESTING
Information Patent Application
MANAGING APPARATUS OF SEMICONDUCTOR MANUFACTURING APPARATUS AND COM...
- Publication number 20130150998
- Publication date Jun 13, 2013
- Hitachi High-Technologies Corporation
- Ryoichi Matsuoka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Pattern Measuring Apparatus and Computer Program
- Publication number 20120267528
- Publication date Oct 25, 2012
- Hitachi High-Technologies Corporation
- Kei Sakai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Pattern Shape Estimation Method and Pattern Measuring Device
- Publication number 20120151428
- Publication date Jun 14, 2012
- Hitachi High-Technologies Corporation
- Maki Tanaka
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Pattern Position and Overlay Measurement
- Publication number 20110155904
- Publication date Jun 30, 2011
- Hitachi, Ltd.
- Shoji HOTTA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Transmitter
- Publication number 20090245414
- Publication date Oct 1, 2009
- Takashi Okada
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Transmitter
- Publication number 20080200126
- Publication date Aug 21, 2008
- Takashi Okada
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Photomask and pattern forming method employing the same
- Publication number 20080057408
- Publication date Mar 6, 2008
- RENESAS TECHNOLOGY CORP.
- Norio Hasegawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method of fabricating a semiconductor integrated circuit that inclu...
- Publication number 20070155052
- Publication date Jul 5, 2007
- RENESAS TECHNOLOGY CORP.
- Tsuneo Terasawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method of manufacturing semiconductor integrated circuit devices
- Publication number 20070128556
- Publication date Jun 7, 2007
- Norio Hasegawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SOLDERING METHOD
- Publication number 20070051777
- Publication date Mar 8, 2007
- TAMURA CORPORATION
- Takahito Yamaguchi
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Transmitter
- Publication number 20060189282
- Publication date Aug 24, 2006
- Norio Hasegawa
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Method of fabrication of semiconductor integrated circuit device an...
- Publication number 20060110667
- Publication date May 25, 2006
- Norio Hasegawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method of manufacturing a semiconductor device
- Publication number 20050277065
- Publication date Dec 15, 2005
- Norio Hasegawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Semiconductor device manufacturing method
- Publication number 20050208427
- Publication date Sep 22, 2005
- Katsuya Hayano
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Norio Hasegawa

Person

Patents Grantslast 30 patents

Spectrum measuring device and spectrum measuring method

Cell survival rate determining device

Cell survival rate determining device and cell survival rate determ...

Pattern measurement device, and computer program for measuring pattern

Pattern-measuring apparatus and semiconductor-measuring system

Fluorescent particle measuring method

Pattern-measuring apparatus and semiconductor-measuring system

Pattern measurement device, evaluation method of polymer compounds...

Phase shift mask, method of forming asymmetric pattern, method of m...

Pattern dimension measurement method and charged particle beam appa...

Image processing apparatus

Pattern measuring apparatus

Estimating shape based on comparison between actual waveform and li...

Method and apparatus for pattern position and overlay measurement

Transmitter

Transmitter

Transmitter

Transmitter for suppressing a variation in input level of a multica...

Manufacturing method of semiconductor integrated circuit device

Method of fabricating a semiconductor integrated circuit that inclu...

Fabrication method of semiconductor integrated circuit device and m...

Method of fabricating a semiconductor integrated circuit that inclu...

Method of manufacturing semiconductor integrated circuit devices

Method of manufacturing semiconductor integrated circuit device opt...

Photomask and pattern forming method employing the same

Semiconductor integrated circuit device and manufacturing method th...

Manufacturing method of semiconductor integrated circuit device

Method of manufacturing integrated circuit

Fabrication method of semiconductor integrated circuit device and mask

Method of manufacturing integrated circuit

Patents Applicationslast 30 patents

DEVICE OF MEASURING AMOUNT OF LIPID ACCUMULATION IN MICROALGAE AND...

SPECTRUM MEASURING DEVICE AND SPECTRUM MEASURING METHOD

CELL SURVIVAL RATE DETERMINING DEVICE

CELL SURVIVAL RATE DETERMINING DEVICE AND CELL SURVIVAL RATE DETERM...

Pattern-Measuring Apparatus and Semiconductor-Measuring System

FLUORESCENT PARTICLE MEASURING METHOD

Pattern Measurement Device, and Computer Program for Measuring Pattern

Pattern-Measuring Apparatus and Semiconductor-Measuring System

Pattern Measurement Device, Evaluation Method of Polymer Compounds...

PHASE SHIFT MASK, METHOD OF FORMING ASYMMETRIC PATTERN, METHOD OF M...

MICROORGANISM DETECTING APPARATUS AND MICROORGANISM DETECTING METHOD

DIFFRACTION GRATING MANUFACTURING METHOD, SPECTROPHOTOMETER, AND SE...

MICROORGANISM DETECTING APPARATUS CALIBRATION METHOD AND MICROORGAN...

PATTERN DIMENSION MEASUREMENT METHOD AND CHARGED PARTICLE BEAM APPA...

IMAGE PROCESSING APPARATUS AND COMPUTER PROGRAM

MICROORGANISM DETECTING APPARATUS CALIBRATION METHOD AND MICROORGAN...

MANAGING APPARATUS OF SEMICONDUCTOR MANUFACTURING APPARATUS AND COM...

Pattern Measuring Apparatus and Computer Program

Pattern Shape Estimation Method and Pattern Measuring Device

Method and Apparatus for Pattern Position and Overlay Measurement

Transmitter

Transmitter

Photomask and pattern forming method employing the same

Method of fabricating a semiconductor integrated circuit that inclu...

Method of manufacturing semiconductor integrated circuit devices

SOLDERING METHOD

Transmitter

Method of fabrication of semiconductor integrated circuit device an...

Method of manufacturing a semiconductor device

Semiconductor device manufacturing method