Norio ISHITSUKA

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Flow-rate measuring device
- Patent number 11,892,333
- Issue date Feb 6, 2024
- Hitachi Astemo, Ltd.
- Masatoshi Ogata
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor element and flow rate measurement device using same
- Patent number 11,268,841
- Issue date Mar 8, 2022
- Hitachi Astemo, Ltd.
- Norio Ishitsuka
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Physical quantity measurement device
- Patent number 11,112,287
- Issue date Sep 7, 2021
- Hitachi Automotive Systems, Ltd.
- Norio Ishitsuka
- G01 - MEASURING TESTING
Information Patent Grant
Thermal air flow meter
- Patent number 10,928,232
- Issue date Feb 23, 2021
- HITACHI AUTOMOTIVE SYSTEMS, LTD.
- Masatoshi Ogata
- G01 - MEASURING TESTING
Information Patent Grant
Flow meter
- Patent number 10,775,215
- Issue date Sep 15, 2020
- Hitachi Automotive Systems, Ltd.
- Akira Uenodan
- G01 - MEASURING TESTING
Information Patent Grant
Thermal type air flow sensor
- Patent number 10,386,216
- Issue date Aug 20, 2019
- Hitachi Automotive Systems, Ltd.
- Masatoshi Ogata
- G01 - MEASURING TESTING
Information Patent Grant
Thermal-type air flow meter
- Patent number 9,945,706
- Issue date Apr 17, 2018
- Hitachi Automotive Systems, Ltd.
- Masatoshi Ogata
- G01 - MEASURING TESTING
Information Patent Grant
Thermal air flow sensor
- Patent number 9,766,106
- Issue date Sep 19, 2017
- Hitachi Automotive Systems, Ltd.
- Norio Ishitsuka
- G01 - MEASURING TESTING
Information Patent Grant
Thermal air flow sensor
- Patent number 9,719,824
- Issue date Aug 1, 2017
- Hitachi Automotive Systems, Ltd.
- Norio Ishitsuka
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing thermal flow meter
- Patent number 9,523,595
- Issue date Dec 20, 2016
- Hitachi Automotive Systems, Ltd.
- Norio Ishitsuka
- G01 - MEASURING TESTING
Information Patent Grant
Thermal airlflow sensor
- Patent number 8,723,287
- Issue date May 13, 2014
- Hitachi Automotive Systems, Ltd.
- Norio Ishitsuka
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Semiconductor device with suppressed crystal defects in active areas
- Patent number 8,035,169
- Issue date Oct 11, 2011
- Renesas Electronics Corporation
- Hiroshi Ishida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dielectric material separated-type, high breakdown voltage semicond...
- Patent number 7,982,266
- Issue date Jul 19, 2011
- Hitachi, Ltd.
- Atsuo Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing a semiconductor device
- Patent number 7,674,668
- Issue date Mar 9, 2010
- Renesas Technology Corp.
- Norio Ishitsuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing a semiconductor integrated circuit device h...
- Patent number 7,524,729
- Issue date Apr 28, 2009
- Renesas Technology Corp.
- Kenji Kanamitsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and process for producing the same
- Patent number 7,402,473
- Issue date Jul 22, 2008
- Renesas Technology Corp.
- Norio Ishitsuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor integrated circuit device and a method of manufacturi...
- Patent number 7,397,104
- Issue date Jul 8, 2008
- Elpida Memory, Inc.
- Norio Suzuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and manufacturing method thereof
- Patent number 7,279,769
- Issue date Oct 9, 2007
- Renesas Technology Corp.
- Norio Ishitsuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and manufacturing method thereof
- Patent number 7,244,643
- Issue date Jul 17, 2007
- Hitachi, Ltd.
- Norio Ishitsuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and production method therefor
- Patent number 7,141,840
- Issue date Nov 28, 2006
- Renesas Technology Corp.
- Tomio Iwasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and manufacturing method of the same
- Patent number 7,084,477
- Issue date Aug 1, 2006
- Hitachi, Ltd.
- Norio Ishitsuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing a semiconductor integrated circuit device h...
- Patent number 6,967,141
- Issue date Nov 22, 2005
- Renesas Technology Corp.
- Kenji Kanamitsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and process for producing the same
- Patent number 6,881,646
- Issue date Apr 19, 2005
- Renesas Technology Corp.
- Norio Ishitsuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process for producing semiconductor device and semiconductor device...
- Patent number 6,858,515
- Issue date Feb 22, 2005
- Renesas Technology Corp.
- Norio Ishitsuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor integrated circuit device and method of manufacturing...
- Patent number 6,720,234
- Issue date Apr 13, 2004
- Hitachi, Ltd.
- Norio Suzuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having element isolation structure
- Patent number 6,635,945
- Issue date Oct 21, 2003
- Hitachi, Ltd.
- Norio Ishitsuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor integrated circuit device and method of manufacturing...
- Patent number 6,562,695
- Issue date May 13, 2003
- Hitachi, Ltd.
- Norio Suzuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and process for producing the sme
- Patent number 6,559,027
- Issue date May 6, 2003
- Hitachi, Ltd.
- Norio Ishitsuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor integrated circuit device and a method of manufacturi...
- Patent number 6,544,839
- Issue date Apr 8, 2003
- Hitachi, Ltd.
- Kenji Kanamitsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing semiconductor device
- Patent number 6,403,446
- Issue date Jun 11, 2002
- Hitachi, Ltd.
- Norio Ishitsuka
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Flow-Rate Measuring Device
- Publication number 20220082421
- Publication date Mar 17, 2022
- Hitachi Astemo, Ltd.
- Masatoshi OGATA
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor Element and Flow Rate Measurement Device Using Same
- Publication number 20210072059
- Publication date Mar 11, 2021
- Hitachi Automotive Systems, Ltd.
- Norio ISHITSUKA
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
PHYSICAL QUANTITY MEASUREMENT DEVICE
- Publication number 20200363247
- Publication date Nov 19, 2020
- Hitachi Automotive Systems, Ltd.
- Norio ISHITSUKA
- G01 - MEASURING TESTING
Information Patent Application
Seal Structure
- Publication number 20200248811
- Publication date Aug 6, 2020
- HITACHI AUTOMOTIVE SYSTEMS, LTD.
- Tetsuya FUKUYAMA
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Application
FLOW METER
- Publication number 20180306619
- Publication date Oct 25, 2018
- Hitachi Automotive Systems, Ltd.
- Akira UENODAN
- G01 - MEASURING TESTING
Information Patent Application
Thermal Air Flow Sensor
- Publication number 20170322062
- Publication date Nov 9, 2017
- Hitachi Automotive Systems, Ltd.
- Norio Ishitsuka
- G01 - MEASURING TESTING
Information Patent Application
Thermal Air Flow Meter
- Publication number 20170241820
- Publication date Aug 24, 2017
- Hitachi Automotive Systems, Ltd.
- Masatoshi OGATA
- G01 - MEASURING TESTING
Information Patent Application
THERMAL-TYPE AIR FLOW METER
- Publication number 20160161312
- Publication date Jun 9, 2016
- Hitachi Automotive Systems, Ltd.
- Masatoshi OGATA
- G01 - MEASURING TESTING
Information Patent Application
Method of Manufacturing Thermal Flow Meter
- Publication number 20160146652
- Publication date May 26, 2016
- Hitachi Automotive Systems, Ltd.
- Norio ISHITSUKA
- G01 - MEASURING TESTING
Information Patent Application
Thermal Type Air Flow Sensor
- Publication number 20160025539
- Publication date Jan 28, 2016
- Hitachi Automotive Systems, Ltd.
- Masatoshi OGATA
- G01 - MEASURING TESTING
Information Patent Application
Thermal Air Flow Sensor
- Publication number 20150300857
- Publication date Oct 22, 2015
- Hitachi Automotive Systems, Ltd.
- Norio ISHITSUKA
- G01 - MEASURING TESTING
Information Patent Application
Thermal Air Flow Sensor
- Publication number 20140284753
- Publication date Sep 25, 2014
- Hitachi Automotive Systems, Ltd.
- Norio Ishitsuka
- G01 - MEASURING TESTING
Information Patent Application
Thermal Airlflow Sensor
- Publication number 20130119504
- Publication date May 16, 2013
- Hitachi Automotive Systems, Ltd.
- Norio Ishitsuka
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
- Publication number 20100140711
- Publication date Jun 10, 2010
- Renesas Technology Corp.
- Norio ISHITSUKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND A METHOD OF MANUFACTURING THE SAME
- Publication number 20090134467
- Publication date May 28, 2009
- RENESAS TECHNOLOGY CORP.
- Hiroshi ISHIDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANUFACTURING A SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE H...
- Publication number 20090029524
- Publication date Jan 29, 2009
- Kenji Kanamitsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of manufacturing a semiconductor device
- Publication number 20080188043
- Publication date Aug 7, 2008
- Renesas Technology Corp.
- Norio Ishitsuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DIELECTRIC MATERIAL SEPARATED-TYPE, HIGH BREAKDOWN VOLTAGE SEMICOND...
- Publication number 20070210408
- Publication date Sep 13, 2007
- Atsuo Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and manufacturing method of the same
- Publication number 20060214254
- Publication date Sep 28, 2006
- Norio Ishitsuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and manufacturing method thereof
- Publication number 20050269662
- Publication date Dec 8, 2005
- Renesas Technology Corp.
- Norio Ishitsuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of manufacturing a semiconductor integrated circuit device h...
- Publication number 20050260820
- Publication date Nov 24, 2005
- Kenji Kanamitsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and process for producing the same
- Publication number 20050196935
- Publication date Sep 8, 2005
- Norio Ishitsuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and manufacturing method
- Publication number 20050121727
- Publication date Jun 9, 2005
- Norio Ishitsuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and production method therefor
- Publication number 20050079667
- Publication date Apr 14, 2005
- Tomio Iwasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of manufacturing a semiconductor integrated circuit device h...
- Publication number 20050014340
- Publication date Jan 20, 2005
- Kenji Kanamitsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor integrated circuit device and a method of manufacturi...
- Publication number 20040159883
- Publication date Aug 19, 2004
- Norio Suzuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Process for producing semiconductor device and semiconductor device...
- Publication number 20040077152
- Publication date Apr 22, 2004
- Norio Ishitsuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and manufacturing method of the same
- Publication number 20040058499
- Publication date Mar 25, 2004
- Norio Ishitsuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and process for producing the same
- Publication number 20030181020
- Publication date Sep 25, 2003
- Norio Ishitsuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor integrated circuit device and method of manufacturing...
- Publication number 20030148587
- Publication date Aug 7, 2003
- Norio Suzuki
- H01 - BASIC ELECTRIC ELEMENTS

Norio ISHITSUKA

Person

Patents Grantslast 30 patents

Flow-rate measuring device

Semiconductor element and flow rate measurement device using same

Physical quantity measurement device

Thermal air flow meter

Flow meter

Thermal type air flow sensor

Thermal-type air flow meter

Thermal air flow sensor

Thermal air flow sensor

Method of manufacturing thermal flow meter

Thermal airlflow sensor

Semiconductor device with suppressed crystal defects in active areas

Dielectric material separated-type, high breakdown voltage semicond...

Method of manufacturing a semiconductor device

Method of manufacturing a semiconductor integrated circuit device h...

Semiconductor device and process for producing the same

Semiconductor integrated circuit device and a method of manufacturi...

Semiconductor device and manufacturing method thereof

Semiconductor device and manufacturing method thereof

Semiconductor device and production method therefor

Semiconductor device and manufacturing method of the same

Method of manufacturing a semiconductor integrated circuit device h...

Semiconductor device and process for producing the same

Process for producing semiconductor device and semiconductor device...

Semiconductor integrated circuit device and method of manufacturing...

Semiconductor device having element isolation structure

Semiconductor integrated circuit device and method of manufacturing...

Semiconductor device and process for producing the sme

Semiconductor integrated circuit device and a method of manufacturi...

Method for manufacturing semiconductor device

Patents Applicationslast 30 patents

Flow-Rate Measuring Device

Semiconductor Element and Flow Rate Measurement Device Using Same

PHYSICAL QUANTITY MEASUREMENT DEVICE

Seal Structure

FLOW METER

Thermal Air Flow Sensor

Thermal Air Flow Meter

THERMAL-TYPE AIR FLOW METER

Method of Manufacturing Thermal Flow Meter

Thermal Type Air Flow Sensor

Thermal Air Flow Sensor

Thermal Air Flow Sensor

Thermal Airlflow Sensor

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF

SEMICONDUCTOR DEVICE AND A METHOD OF MANUFACTURING THE SAME

METHOD OF MANUFACTURING A SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE H...

Method of manufacturing a semiconductor device

DIELECTRIC MATERIAL SEPARATED-TYPE, HIGH BREAKDOWN VOLTAGE SEMICOND...

Semiconductor device and manufacturing method of the same

Semiconductor device and manufacturing method thereof

Method of manufacturing a semiconductor integrated circuit device h...

Semiconductor device and process for producing the same

Semiconductor device and manufacturing method

Semiconductor device and production method therefor

Method of manufacturing a semiconductor integrated circuit device h...

Semiconductor integrated circuit device and a method of manufacturi...

Process for producing semiconductor device and semiconductor device...

Semiconductor device and manufacturing method of the same

Semiconductor device and process for producing the same

Semiconductor integrated circuit device and method of manufacturing...