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Norio Masuda
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Electronic component housing apparatus and electronic device
Patent number
10,856,445
Issue date
Dec 1, 2020
NEC Network and Sensor Systems, Ltd.
Masahiro Murakami
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Electronic component housing apparatus and electronic device
Patent number
10,506,742
Issue date
Dec 10, 2019
NEC Network and Sensor Systems, Ltd.
Masahiro Murakami
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Loop element and noise analyzer
Patent number
8,704,531
Issue date
Apr 22, 2014
NEC Corporation
Norio Masuda
G01 - MEASURING TESTING
Information
Patent Grant
Electric field/magnetic field sensors and methods of fabricating th...
Patent number
8,519,323
Issue date
Aug 27, 2013
NEC Corporation
Masafumi Nakada
G01 - MEASURING TESTING
Information
Patent Grant
Electromagnetic field distribution measurement apparatus
Patent number
8,447,539
Issue date
May 21, 2013
NEC Corporation
Norio Masuda
G01 - MEASURING TESTING
Information
Patent Grant
Electric field sensor, magnetic field sensor, electromagnetic field...
Patent number
8,233,753
Issue date
Jul 31, 2012
NEC Corporation
Mizuki Iwanami
G01 - MEASURING TESTING
Information
Patent Grant
Electric field sensor and method for fabricating the same
Patent number
8,153,955
Issue date
Apr 10, 2012
NEC Corporation
Masafumi Nakada
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic field sensor
Patent number
7,362,098
Issue date
Apr 22, 2008
NEC Corporation
Noriaki Ando
G01 - MEASURING TESTING
Information
Patent Grant
Electronic apparatus
Patent number
6,882,542
Issue date
Apr 19, 2005
NEC Corporation
Naoya Tamaki
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Radio frequency circuit module on multi-layer substrate
Patent number
6,847,276
Issue date
Jan 25, 2005
NEC Corporation
Naoya Tamaki
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Radio frequency circuit module on multi-layer substrate
Patent number
6,842,093
Issue date
Jan 11, 2005
NEC Corporation
Naoya Tamaki
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Magnetic field detector having a dielectric looped face
Patent number
6,750,648
Issue date
Jun 15, 2004
NEC Corporation
Naoya Tamaki
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device evaluation apparatus and semiconductor device...
Patent number
6,661,243
Issue date
Dec 9, 2003
NEC Corporation
Naoya Tamaki
G01 - MEASURING TESTING
Information
Patent Grant
Radio frequency circuit module on multi-layer substrate
Patent number
6,661,318
Issue date
Dec 9, 2003
NEC Corporation
Naoya Tamaki
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Triplate striplines used in a high-frequency circuit and a shielded...
Patent number
6,396,264
Issue date
May 28, 2002
NEC Corporation
Naoya Tamaki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Magnetic field sensor and system for measuring a magnetic field inc...
Patent number
6,320,376
Issue date
Nov 20, 2001
NEC Corporation
Naoya Tamaki
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device evaluation apparatus and semiconductor device...
Patent number
6,300,779
Issue date
Oct 9, 2001
NEC Corporation
Naoya Tamaki
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device evaluation apparatus
Patent number
6,281,697
Issue date
Aug 28, 2001
NEC Corporation
Norio Masuda
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic field sensor
Patent number
6,163,150
Issue date
Dec 19, 2000
NEC Corporation
Naoya Tamaki
G01 - MEASURING TESTING
Information
Patent Grant
Waveform analyzer
Patent number
5,784,285
Issue date
Jul 21, 1998
NEC Corporation
Naoya Tamaki
G01 - MEASURING TESTING
Information
Patent Grant
Rack for mounting electronic apparatuses
Patent number
5,683,001
Issue date
Nov 4, 1997
NEC Corporation
Norio Masuda
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Bidimensional electromagnetic emission level monitoring equipment
Patent number
5,300,879
Issue date
Apr 5, 1994
NEC Corporation
Norio Masuda
G01 - MEASURING TESTING
Information
Patent Grant
Electromagnetic shielding member and electromagnetic shielding case
Patent number
5,160,806
Issue date
Nov 3, 1992
NEC Corporation
Takashi Harada
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Method and apparatus for transforming a bit-reversed order vector i...
Patent number
4,916,649
Issue date
Apr 10, 1990
NEC Corporation
Jun-Ichi Yorozu
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD FOR EVALUATING EXCRETION OF SUBSTANCE OF INTEREST BY HUMAN H...
Publication number
20240183843
Publication date
Jun 6, 2024
JSR Corporation
Norio MASUDA
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Application
METHOD FOR CULTURING HUMAN HEPATIC PARENCHYMAL CELL, CULTURED HUMAN...
Publication number
20240084260
Publication date
Mar 14, 2024
KEIO UNIVERSITY
Norio MASUDA
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Application
PROLIFERATIVE LIVER ORGANOID, METABOLICALLY ACTIVATED LIVER ORGANOI...
Publication number
20220298485
Publication date
Sep 22, 2022
JSR Corporation
Norio MASUDA
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Application
ELECTRONIC COMPONENT HOUSING APPARATUS AND ELECTRONIC DEVICE
Publication number
20200060046
Publication date
Feb 20, 2020
NEC NETWORK AND SENSOR SYSTEMS, LTD.
Masahiro MURAKAMI
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
ELECTRONIC COMPONENT HOUSING APPARATUS AND ELECTRONIC DEVICE
Publication number
20180324981
Publication date
Nov 8, 2018
NEC Network and Sensor Systems, Ltd.
Masahiro MURAKAMI
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
COMMUNICATION DEVICE AND ELECTRONIC EQUIPMENT
Publication number
20120244804
Publication date
Sep 27, 2012
NETCOMSEC CO., LTD.
Norio MASUDA
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
ELECTRIC FIELD/MAGNETIC FIELD SENSORS AND METHODS OF FABRICATING TH...
Publication number
20120164321
Publication date
Jun 28, 2012
NEC Corporation
Masafumi Nakada
G01 - MEASURING TESTING
Information
Patent Application
IC PACKAGE
Publication number
20120086110
Publication date
Apr 12, 2012
Norio Masuda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
LOOP ELEMENT AND NOISE ANALYZER
Publication number
20100321035
Publication date
Dec 23, 2010
Norio Masuda
G01 - MEASURING TESTING
Information
Patent Application
ELECTROMAGNETIC FIELD DISTRIBUTION MEASUREMENT APPARATUS
Publication number
20100174497
Publication date
Jul 8, 2010
Norio Masuda
G01 - MEASURING TESTING
Information
Patent Application
ELECTRIC FIELD SENSOR, MAGNETIC FIELD SENSOR, ELECTROMAGNETIC FIELD...
Publication number
20090234619
Publication date
Sep 17, 2009
NEC Corporation
Mizuki Iwanami
G02 - OPTICS
Information
Patent Application
ELECTRIC FIELD/MAGNETIC FIELD SENSORS AND METHODS OF FABRICATING TH...
Publication number
20090224753
Publication date
Sep 10, 2009
NEC Corporation
Masafumi Nakada
G01 - MEASURING TESTING
Information
Patent Application
Magnetic Field Sensor
Publication number
20070216408
Publication date
Sep 20, 2007
Noriaki Ando
G01 - MEASURING TESTING
Information
Patent Application
Electronic apparatus
Publication number
20040057220
Publication date
Mar 25, 2004
NEC Corporation
Naoya Tamaki
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Radio frequency circuit module on multi-layer substrate
Publication number
20030218515
Publication date
Nov 27, 2003
NEC Corporation
Naoya Tamaki
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Radio frequency circuit module on multi-layer substrate
Publication number
20030206084
Publication date
Nov 6, 2003
NEC Corporation
Naoya Tamaki
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Semiconductor device evaluation apparatus and semiconductor device...
Publication number
20020017912
Publication date
Feb 14, 2002
NEC Corporation
Naoya Tamaki
G01 - MEASURING TESTING
Information
Patent Application
Radio frequency circuit module on multi-layer substrate
Publication number
20010042907
Publication date
Nov 22, 2001
NEC Corporation
Naoya Tamaki
H01 - BASIC ELECTRIC ELEMENTS