Noritada Sato

Person

Kanagawa, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor-based radiation-detector element
- Patent number 5,156,979
- Issue date Oct 20, 1992
- Fuji Electric Co., Ltd.
- Noritada Sato
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor-based radiation-detector element
- Patent number 5,019,886
- Issue date May 28, 1991
- Fuji Electric Co., Ltd.
- Noritada Sato
- G01 - MEASURING TESTING
Information Patent Grant
Radiation or light detecting semiconductor element containing heavi...
- Patent number 4,960,436
- Issue date Oct 2, 1990
- Fuji Electric Corporate Research & Development
- Noritada Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Novel semiconductor-based radiation detector
- Patent number 4,896,200
- Issue date Jan 23, 1990
- Fuji Electric Co., Ltd.
- Yasukazu Seki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device for detecting radiation
- Patent number 4,835,587
- Issue date May 30, 1989
- Fuji Electric Co., Ltd.
- Noritada Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multilayer semiconductor device having an amorphous carbon and sili...
- Patent number 4,768,072
- Issue date Aug 30, 1988
- Fuji Electric Corporate Research & Development Co., Ltd.
- Yasakazu Seki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process for forming crystalline films by glow discharge
- Patent number 4,762,803
- Issue date Aug 9, 1988
- Fuji Electric Co., Ltd.
- Noritada Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor radioactive ray detector
- Patent number 4,692,782
- Issue date Sep 8, 1987
- Fuji Electric Corporate Research & Development Co., Ltd.
- Yasukazu Seki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor radiation detector
- Patent number 4,689,649
- Issue date Aug 25, 1987
- Fuji Electric Company Ltd.
- Noritada Sato
- G01 - MEASURING TESTING
Information Patent Grant
Method for forming a protective film on a semiconductor body
- Patent number 4,627,991
- Issue date Dec 9, 1986
- Fuji Electric Corporate Research & Development Co., Ltd.
- Yasukazu Seki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for adding impurities to semiconductor base material
- Patent number 4,618,381
- Issue date Oct 21, 1986
- Fuji Electric Corporate Research & Development Ltd.
- Noritada Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor radiation detector
- Patent number 4,611,224
- Issue date Sep 9, 1986
- Fuji Electric Corporate Research & Development Co., Ltd.
- Yasukazu Seki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for diffusion of impurities
- Patent number 4,565,588
- Issue date Jan 21, 1986
- Fuji Electric Corporate Research and Development Ltd.
- Yasukazu Seki
- H01 - BASIC ELECTRIC ELEMENTS

Noritada Sato

Person

Patents Grantslast 30 patents

Semiconductor-based radiation-detector element

Semiconductor-based radiation-detector element

Radiation or light detecting semiconductor element containing heavi...

Novel semiconductor-based radiation detector

Semiconductor device for detecting radiation

Multilayer semiconductor device having an amorphous carbon and sili...

Process for forming crystalline films by glow discharge

Semiconductor radioactive ray detector

Semiconductor radiation detector

Method for forming a protective film on a semiconductor body

Method for adding impurities to semiconductor base material

Semiconductor radiation detector

Method for diffusion of impurities