Norman W. Robson

Person

Hopewell Junction, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Charge trap memory devices
- Patent number 11,367,734
- Issue date Jun 21, 2022
- GLOBALFOUNDRIES U.S. Inc.
- Faraz Khan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Program and erase memory structures
- Patent number 10,685,705
- Issue date Jun 16, 2020
- GLOBALFOUNDRIES Inc.
- Faraz Khan
- G11 - INFORMATION STORAGE
Information Patent Grant
Signal monitoring of through-wafer vias using a multi-layer inductor
- Patent number 9,658,255
- Issue date May 23, 2017
- International Business Machines Corporation
- Mark A. DiRocco
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Signal monitoring of through-wafer vias using a multi-layer inductor
- Patent number 9,372,208
- Issue date Jun 21, 2016
- International Business Machines Corporation
- Mark A. DiRocco
- G01 - MEASURING TESTING
Information Patent Grant
Circuits for self-reconfiguration or intrinsic functional changes o...
- Patent number 9,194,912
- Issue date Nov 24, 2015
- International Business Machines Corporation
- Norman W. Robson
- G01 - MEASURING TESTING
Information Patent Grant
Physical design symmetry and integrated circuits enabling three dim...
- Patent number 9,029,234
- Issue date May 12, 2015
- International Business Machines Corporation
- John Matthew Safran
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Through-silicon-via with sacrificial dielectric line
- Patent number 8,975,910
- Issue date Mar 10, 2015
- International Business Machines Corporation
- Troy L. Graves-Abe
- G01 - MEASURING TESTING
Information Patent Grant
Electrically programmable fuse using anisometric contacts and fabri...
- Patent number 8,629,049
- Issue date Jan 14, 2014
- International Business Machines Corporation
- Chandrasekharan Kothandaraman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Retention based intrinsic fingerprint identification featuring a fu...
- Patent number 8,590,010
- Issue date Nov 19, 2013
- International Business Machines Corporation
- Daniel J. Fainstein
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Secure anti-fuse with low voltage programming through localized dif...
- Patent number 8,569,755
- Issue date Oct 29, 2013
- International Business Machines Corporation
- Yan Zun Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrically programmable fuse using anisometric contacts and fabri...
- Patent number 8,519,507
- Issue date Aug 27, 2013
- International Business Machines Corporation
- Chandrasekharan Kothandaraman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Secure anti-fuse with low voltage programming through localized dif...
- Patent number 8,350,264
- Issue date Jan 8, 2013
- International Businesss Machines Corporation
- Yan Zun Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metal gate integration structure and method including metal fuse, a...
- Patent number 8,159,040
- Issue date Apr 17, 2012
- International Business Machines Corporation
- Douglas D. Coolbaugh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metal gate compatible electrical antifuse
- Patent number 8,004,060
- Issue date Aug 23, 2011
- International Business Machines Corporation
- Deok-kee Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Using a partial metal level mask for early test results
- Patent number 7,111,257
- Issue date Sep 19, 2006
- International Business Machines Corporation
- Norman W. Robson
- G01 - MEASURING TESTING
Information Patent Grant
Repair of address-specific leakage
- Patent number 6,957,372
- Issue date Oct 18, 2005
- International Business Machines Corporation
- John Edward Barth, Jr.
- G11 - INFORMATION STORAGE
Information Patent Grant
Multiple trip point fuse latch device and method
- Patent number 6,882,202
- Issue date Apr 19, 2005
- Infineon Technologies AG
- Gunther Lehmann
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
FAN-OUT CO-PACKAGED INTEGRATED SYSTEMS INCLUDING A PHOTONIC INTEGRA...
- Publication number 20250076575
- Publication date Mar 6, 2025
- GLOBALFOUNDRIES U.S. Inc.
- Jae Kyu Cho
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHOTONICS CHIP STRUCTURES INCLUDING A LIGHT SOURCE AND AN EDGE COUPLER
- Publication number 20240369760
- Publication date Nov 7, 2024
- GLOBALFOUNDRIES U.S. Inc.
- Arpan Dasgupta
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
OPTICAL INPUT/OUTPUT INTERFACES BETWEEN PHOTONICS CHIPS
- Publication number 20240329308
- Publication date Oct 3, 2024
- GLOBALFOUNDRIES U.S. Inc.
- Arpan Dasgupta
- G02 - OPTICS
Information Patent Application
IDENTIFICATION SYSTEM
- Publication number 20240184045
- Publication date Jun 6, 2024
- GLOBALFOUNDRIES U.S. Inc.
- Arpan DASGUPTA
- G02 - OPTICS
Information Patent Application
CHARGE TRAP MEMORY DEVICES
- Publication number 20210242230
- Publication date Aug 5, 2021
- GLOBALFOUNDRIES U.S. Inc.
- Faraz KHAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROGRAM AND ERASE MEMORY STRUCTURES
- Publication number 20200035295
- Publication date Jan 30, 2020
- GLOBALFOUNDRIES INC.
- Faraz KHAN
- G11 - INFORMATION STORAGE
Information Patent Application
SIGNAL MONITORING OF THROUGH-WAFER VIAS USING A MULTI-LAYER INDUCTOR
- Publication number 20150362534
- Publication date Dec 17, 2015
- International Business Machines Corporation
- Mark A. DiRocco
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL MONITORING OF THROUGH-WAFER VIAS USING A MULTI-LAYER INDUCTOR
- Publication number 20150185273
- Publication date Jul 2, 2015
- International Business Machines Corporation
- Mark A. DiRocco
- G01 - MEASURING TESTING
Information Patent Application
CIRCUITS FOR SELF-RECONFIGURATION OR INTRINSIC FUNCTIONAL CHANGES O...
- Publication number 20140145750
- Publication date May 29, 2014
- International Business Machines Corporation
- Norman W. Robson
- G01 - MEASURING TESTING
Information Patent Application
PHYSICAL DESIGN SYMMETRY AND INTEGRATED CIRCUITS ENABLING THREE DIM...
- Publication number 20130307159
- Publication date Nov 21, 2013
- International Business Machines Corporation
- John Matthew Safran
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THROUGH-SILICON-VIA WITH SACRIFICIAL DIELECTRIC LINE
- Publication number 20130285694
- Publication date Oct 31, 2013
- International Business Machines Corporation
- Troy L. Graves-Abe
- G01 - MEASURING TESTING
Information Patent Application
Retention Based Intrinsic Fingerprint Identification Featuring A Fu...
- Publication number 20130133031
- Publication date May 23, 2013
- International Business Machines Corporation
- Daniel J. Fainstein
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SECURE ANTI-FUSE WITH LOW VOLTAGE PROGRAMMING THROUGH LOCALIZED DIF...
- Publication number 20130063202
- Publication date Mar 14, 2013
- International Business Machines Corporation
- Yan Zun Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRICALLY PROGRAMMABLE FUSE USING ANISOMETRIC CONTACTS AND FABRI...
- Publication number 20120171857
- Publication date Jul 5, 2012
- International Business Machines Corporation
- CHANDRASEKHARAN KOTHANDARAMAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SECURE ANTI-FUSE WITH LOW VOLTAGE PROGRAMMING THROUGH LOCALIZED DIF...
- Publication number 20120012977
- Publication date Jan 19, 2012
- International Business Machines Corporation
- Yan Zun Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRICALLY PROGRAMMABLE FUSE USING ANISOMETRIC CONTACTS AND FABRI...
- Publication number 20100327399
- Publication date Dec 30, 2010
- International Business Machines Corporation
- CHANDRASEKHARAN KOTHANDARAMAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METAL GATE INTEGRATION STRUCTURE AND METHOD INCLUDING METAL FUSE, A...
- Publication number 20090283840
- Publication date Nov 19, 2009
- International Business Machines Corporation
- Douglas D. Coolbaugh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM FOR POWER PERFORMANCE OPTIMIZATION OF MULTICORE PROCESSOR CHIP
- Publication number 20090267179
- Publication date Oct 29, 2009
- International Business Machines Corporation
- Subramanian S. Iyer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METAL GATE COMPATIBLE ELECTRICAL ANTIFUSE
- Publication number 20090141533
- Publication date Jun 4, 2009
- International Business Machines Corporation
- Deok-kee Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
USING A PARTIAL METAL LEVEL MASK FOR EARLY TEST RESULTS
- Publication number 20050060681
- Publication date Mar 17, 2005
- International Business Machines Corporation
- Norman W. Robson
- G01 - MEASURING TESTING
Information Patent Application
Multiple trip point fuse latch device and method
- Publication number 20040140835
- Publication date Jul 22, 2004
- Gunther Lehmann
- G11 - INFORMATION STORAGE
Information Patent Application
Repair of address-specific leakage
- Publication number 20040039535
- Publication date Feb 26, 2004
- International Business Machines Corporation
- John Edward Barth,
- G11 - INFORMATION STORAGE

Norman W. Robson

Person

Patents Grantslast 30 patents

Charge trap memory devices

Program and erase memory structures

Signal monitoring of through-wafer vias using a multi-layer inductor

Signal monitoring of through-wafer vias using a multi-layer inductor

Circuits for self-reconfiguration or intrinsic functional changes o...

Physical design symmetry and integrated circuits enabling three dim...

Through-silicon-via with sacrificial dielectric line

Electrically programmable fuse using anisometric contacts and fabri...

Retention based intrinsic fingerprint identification featuring a fu...

Secure anti-fuse with low voltage programming through localized dif...

Electrically programmable fuse using anisometric contacts and fabri...

Secure anti-fuse with low voltage programming through localized dif...

Metal gate integration structure and method including metal fuse, a...

Metal gate compatible electrical antifuse

Using a partial metal level mask for early test results

Repair of address-specific leakage

Multiple trip point fuse latch device and method

Patents Applicationslast 30 patents

FAN-OUT CO-PACKAGED INTEGRATED SYSTEMS INCLUDING A PHOTONIC INTEGRA...

PHOTONICS CHIP STRUCTURES INCLUDING A LIGHT SOURCE AND AN EDGE COUPLER

OPTICAL INPUT/OUTPUT INTERFACES BETWEEN PHOTONICS CHIPS

IDENTIFICATION SYSTEM

CHARGE TRAP MEMORY DEVICES

PROGRAM AND ERASE MEMORY STRUCTURES

SIGNAL MONITORING OF THROUGH-WAFER VIAS USING A MULTI-LAYER INDUCTOR

SIGNAL MONITORING OF THROUGH-WAFER VIAS USING A MULTI-LAYER INDUCTOR

CIRCUITS FOR SELF-RECONFIGURATION OR INTRINSIC FUNCTIONAL CHANGES O...

PHYSICAL DESIGN SYMMETRY AND INTEGRATED CIRCUITS ENABLING THREE DIM...

THROUGH-SILICON-VIA WITH SACRIFICIAL DIELECTRIC LINE

Retention Based Intrinsic Fingerprint Identification Featuring A Fu...

SECURE ANTI-FUSE WITH LOW VOLTAGE PROGRAMMING THROUGH LOCALIZED DIF...

ELECTRICALLY PROGRAMMABLE FUSE USING ANISOMETRIC CONTACTS AND FABRI...

SECURE ANTI-FUSE WITH LOW VOLTAGE PROGRAMMING THROUGH LOCALIZED DIF...

ELECTRICALLY PROGRAMMABLE FUSE USING ANISOMETRIC CONTACTS AND FABRI...

METAL GATE INTEGRATION STRUCTURE AND METHOD INCLUDING METAL FUSE, A...

SYSTEM FOR POWER PERFORMANCE OPTIMIZATION OF MULTICORE PROCESSOR CHIP

METAL GATE COMPATIBLE ELECTRICAL ANTIFUSE

USING A PARTIAL METAL LEVEL MASK FOR EARLY TEST RESULTS

Multiple trip point fuse latch device and method

Repair of address-specific leakage