Oh-Nam Kwon

Person

People

Patents Grantslast 30 patents

Information Patent Grant
Method to improve crystalline regrowth
- Patent number 10,192,887
- Issue date Jan 29, 2019
- GLOBALFOUNDRIES Inc.
- Yun Y. Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Self-aligned nanotube structures
- Patent number 10,170,304
- Issue date Jan 1, 2019
- GLOBALFOUNDRIES Inc.
- Oh-Jung Kwon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure and method for hard mask removal on an SOI substrate with...
- Patent number 10,115,725
- Issue date Oct 30, 2018
- International Business Machines Corporation
- Oh-Jung Kwon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Capacitance monitoring using x-ray diffraction
- Patent number 10,008,421
- Issue date Jun 26, 2018
- International Business Machines Corporation
- Donghun Kang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Capacitance monitoring using X-ray diffraction
- Patent number 9,870,960
- Issue date Jan 16, 2018
- International Business Machines Corporation
- Donghun Kang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method to improve crystalline regrowth
- Patent number 9,853,055
- Issue date Dec 26, 2017
- GLOBALFOUNDRIES Inc.
- Yun Y. Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer stress control with backside patterning
- Patent number 9,269,607
- Issue date Feb 23, 2016
- GLOBALFOUNDRIES Inc.
- Edward Engbrecht
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Array and moat isolation structures and method of manufacture
- Patent number 9,240,452
- Issue date Jan 19, 2016
- GLOBALFOUNDRIES Inc.
- Naoyoshi Kusaba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thermally stable high-K tetragonal HFO2 layer within high aspect ra...
- Patent number 9,087,927
- Issue date Jul 21, 2015
- International Business Machines Corporation
- Michael P. Chudzik
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of fabricating isolated capacitors and structure thereof
- Patent number 8,963,283
- Issue date Feb 24, 2015
- International Business Machines Corporation
- Oh-Jung Kwon
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of fabricating isolated capacitors and structure thereof
- Patent number 8,940,617
- Issue date Jan 27, 2015
- International Business Machines Corporation
- Oh-Jung Kwon
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Thermally stable high-K tetragonal HFO2 layer within high aspect ra...
- Patent number 8,901,706
- Issue date Dec 2, 2014
- International Business Machines Corporation
- Michael P. Chudzik
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of fabricating isolated capacitors and structure thereof
- Patent number 8,716,776
- Issue date May 6, 2014
- International Business Machines Corporation
- Oh-Jung Kwon
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Array and moat isolation structures and method of manufacture
- Patent number 8,673,737
- Issue date Mar 18, 2014
- International Business Machines Corporation
- Naoyoshi Kusaba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of fabricating isolated capacitors and structure thereof
- Patent number 8,652,925
- Issue date Feb 18, 2014
- International Business Machines Corporation
- Oh-Jung Kwon
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Structure and method for forming isolation and buried plate for tre...
- Patent number 8,637,958
- Issue date Jan 28, 2014
- International Business Machines Corporation
- Abhishek Dube
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 8,633,520
- Issue date Jan 21, 2014
- Samsung Electronics Co., Ltd.
- Dong-Hee Yu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of fabricating an embedded polysilicon resistor and an embed...
- Patent number 8,377,790
- Issue date Feb 19, 2013
- International Business Machines Corporation
- Narasimhulu Kanike
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Enhanced capacitance deep trench capacitor for EDRAM
- Patent number 8,354,675
- Issue date Jan 15, 2013
- International Business Machines Corporation
- Oh-jung Kwon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure and method for forming isolation and buried plate for tre...
- Patent number 8,298,908
- Issue date Oct 30, 2012
- International Business Machines Corporation
- Abhishek Dube
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure and method for hard mask removal on an SOI substrate with...
- Patent number 8,293,625
- Issue date Oct 23, 2012
- International Business Machines Corporation
- Oh-Jung Kwon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of fabricating a deep trench (DT) metal-insulator-metal (MIM...
- Patent number 8,241,981
- Issue date Aug 14, 2012
- International Business Machines Corporation
- Rishikesh Krishnan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transistor formation using capping layer
- Patent number 8,030,196
- Issue date Oct 4, 2011
- Samsung Electronics Co., Ltd.
- Bong-Seok Seo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of silicide formation by adding graded amount of impurity du...
- Patent number 8,021,982
- Issue date Sep 20, 2011
- International Business Machines Corporation
- Oh-Jung Kwon
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Dual stress STI
- Patent number 7,927,968
- Issue date Apr 19, 2011
- International Business Machines Corporation
- Deok-kee Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming field effect transistors using diluted hydrofluor...
- Patent number 7,902,082
- Issue date Mar 8, 2011
- Samsung Electronics Co., Ltd.
- Sang Jine Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of forming field effect transistors having silicided source...
- Patent number 7,863,201
- Issue date Jan 4, 2011
- Samsung Electronics Co., Ltd.
- Yong-Kuk Jeong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor devices having recesses filled with semiconductor mat...
- Patent number 7,737,468
- Issue date Jun 15, 2010
- Infineon Technologies AG
- Jin-Ping Han
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of fabricating a bottle trench and a bottle trench capacitor
- Patent number 7,670,901
- Issue date Mar 2, 2010
- International Business Machines Corporation
- Oh-Jung Kwon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Self-aligned, silicided, trench-based DRAM/eDRAM processes with imp...
- Patent number 7,564,086
- Issue date Jul 21, 2009
- International Business Machines Corporation
- Oh-Jung Kwon
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CAPACITANCE MONITORING USING X-RAY DIFFRACTION
- Publication number 20180096904
- Publication date Apr 5, 2018
- International Business Machines Corporation
- Donghun Kang
- G01 - MEASURING TESTING
Information Patent Application
METHOD TO IMPROVE CRYSTALLINE REGROWTH
- Publication number 20180090516
- Publication date Mar 29, 2018
- GLOBALFOUNDRIES INC.
- Yun Y. Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD TO IMPROVE CRYSTALLINE REGROWTH
- Publication number 20170287942
- Publication date Oct 5, 2017
- GLOBALFOUNDRIES INC.
- Yun Y. Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CAPACITANCE MONITORING USING X-RAY DIFFRACTION
- Publication number 20160178679
- Publication date Jun 23, 2016
- International Business Machines Corporation
- Donghun Kang
- G01 - MEASURING TESTING
Information Patent Application
WAFER STRESS CONTROL WITH BACKSIDE PATTERNING
- Publication number 20150364362
- Publication date Dec 17, 2015
- International Business Machines Corporation
- Edward Engbrecht
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THERMALLY STABLE HIGH-K TETRAGONAL HFO2 LAYER WITHIN HIGH ASPECT RA...
- Publication number 20150044853
- Publication date Feb 12, 2015
- International Business Machines Corporation
- Michael P. Chudzik
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF FABRICATING ISOLATED CAPACITORS AND STRUCTURE THEREOF
- Publication number 20140210039
- Publication date Jul 31, 2014
- International Business Machines Corporation
- Oh-Jung KWON
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20140131815
- Publication date May 15, 2014
- Samsung Electronics Co., Ltd.
- Dong-Hee Yu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ARRAY AND MOAT ISOLATION STRUCTURES AND METHOD OF MANUFACTURE
- Publication number 20140124952
- Publication date May 8, 2014
- International Business Machines Corporation
- Naoyoshi KUSABA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Fabricating Isolated Capacitors and Structure Thereof
- Publication number 20140080281
- Publication date Mar 20, 2014
- International Business Machines Corporation
- Oh-Jung KWON
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THERMALLY STABLE HIGH-K TETRAGONAL HFO2 LAYER WITHIN HIGH ASPECT RA...
- Publication number 20130175665
- Publication date Jul 11, 2013
- International Business Machines Corporation
- Michael P. Chudzik
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ARRAY AND MOAT ISOLATION STRUCTURES AND METHOD OF MANUFACTURE
- Publication number 20130093043
- Publication date Apr 18, 2013
- International Business Machines Corporation
- Naoyoshi KUSABA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRUCTURE AND METHOD FOR FORMING ISOLATION AND BURIED PLATE FOR TRE...
- Publication number 20130009277
- Publication date Jan 10, 2013
- International Business Machines Corporation
- Abhishek Dube
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Fabricating Isolated Capacitors and Structure Thereof
- Publication number 20120267754
- Publication date Oct 25, 2012
- International Business Machines Corporation
- Oh-Jung KWON
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STRUCTURE AND METHOD FOR HARD MASK REMOVAL ON AN SOI SUBSTRATE WITH...
- Publication number 20120217621
- Publication date Aug 30, 2012
- International Business Machines Corporation
- Oh-Jung Kwon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF FABRICATING A DEEP TRENCH (DT) METAL-INSULATOR-METAL (MIM...
- Publication number 20120196424
- Publication date Aug 2, 2012
- International Business Machines Corporation
- Rishikesh Krishnan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF FABRICATION BODIES FOR AN EMBEDDED POLYSILICON RESISTOR A...
- Publication number 20120196423
- Publication date Aug 2, 2012
- International Business Machines Corporation
- Narasimhulu Kanike
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRUCTURE AND METHOD FOR HARD MASK REMOVAL ON AN SOI SUBSTRATE WITH...
- Publication number 20120181665
- Publication date Jul 19, 2012
- International Business Machines Corporation
- Oh-Jung Kwon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Device
- Publication number 20120098073
- Publication date Apr 26, 2012
- Dong-Hee Yu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Fabricating Isolated Capacitors and Structure Thereof
- Publication number 20120012971
- Publication date Jan 19, 2012
- International Business Machines Corporation
- Oh-Jung KWON
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ENHANCED CAPACITANCE DEEP TRENCH CAPACITOR FOR EDRAM
- Publication number 20110272702
- Publication date Nov 10, 2011
- International Business Machines Corporation
- Oh-jung Kwon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRUCTURE AND METHOD FOR FORMING ISOLATION AND BURIED PLATE FOR TRE...
- Publication number 20110193193
- Publication date Aug 11, 2011
- International Business Machines Corporation
- Abhishek Dube
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TRANSISTOR FORMATION USING CAPPING LAYER
- Publication number 20110171794
- Publication date Jul 14, 2011
- Bong-Seok Seo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF SILICIDE FORMATION BY ADDING GRADED AMOUNT OF IMPURITY DU...
- Publication number 20110070732
- Publication date Mar 24, 2011
- International Business Machines Corporation
- Oh-Jung Kwon
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Semiconductor Devices and Methods of Manufacturing Thereof
- Publication number 20100197100
- Publication date Aug 5, 2010
- Jin-Ping Han
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods of Forming Field Effect Transistors Having Silicided Source...
- Publication number 20090239344
- Publication date Sep 24, 2009
- SAMSUNG ELECTRONICS CO., LTD.
- Yong Kuk Jeong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Forming Field Effect Transistors Using Diluted Hydrofluor...
- Publication number 20090081840
- Publication date Mar 26, 2009
- SAMSUNG ELECTRONICS CO., LTD.
- Sang-jine Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPACER UNDERCUT FILLER, METHOD OF MANUFACTURE THEREOF AND ARTICLES...
- Publication number 20090057755
- Publication date Mar 5, 2009
- International Business Machines Corporation
- Thomas W. Dyer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF SILICIDE FORMATION FOR NANO STRUCTURES
- Publication number 20090029549
- Publication date Jan 29, 2009
- Oh-Jung Kwon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor devices and methods of manufacturing thereof
- Publication number 20080290370
- Publication date Nov 27, 2008
- Jin-Ping Han
- H01 - BASIC ELECTRIC ELEMENTS

Oh-Nam Kwon

Person

Patents Grantslast 30 patents

Method to improve crystalline regrowth

Self-aligned nanotube structures

Structure and method for hard mask removal on an SOI substrate with...

Capacitance monitoring using x-ray diffraction

Capacitance monitoring using X-ray diffraction

Method to improve crystalline regrowth

Wafer stress control with backside patterning

Array and moat isolation structures and method of manufacture

Thermally stable high-K tetragonal HFO2 layer within high aspect ra...

Method of fabricating isolated capacitors and structure thereof

Method of fabricating isolated capacitors and structure thereof

Thermally stable high-K tetragonal HFO2 layer within high aspect ra...

Method of fabricating isolated capacitors and structure thereof

Array and moat isolation structures and method of manufacture

Method of fabricating isolated capacitors and structure thereof

Structure and method for forming isolation and buried plate for tre...

Semiconductor device

Method of fabricating an embedded polysilicon resistor and an embed...

Enhanced capacitance deep trench capacitor for EDRAM

Structure and method for forming isolation and buried plate for tre...

Structure and method for hard mask removal on an SOI substrate with...

Method of fabricating a deep trench (DT) metal-insulator-metal (MIM...

Transistor formation using capping layer

Method of silicide formation by adding graded amount of impurity du...

Dual stress STI

Method of forming field effect transistors using diluted hydrofluor...

Methods of forming field effect transistors having silicided source...

Semiconductor devices having recesses filled with semiconductor mat...

Method of fabricating a bottle trench and a bottle trench capacitor

Self-aligned, silicided, trench-based DRAM/eDRAM processes with imp...

Patents Applicationslast 30 patents

CAPACITANCE MONITORING USING X-RAY DIFFRACTION

METHOD TO IMPROVE CRYSTALLINE REGROWTH

METHOD TO IMPROVE CRYSTALLINE REGROWTH

CAPACITANCE MONITORING USING X-RAY DIFFRACTION

WAFER STRESS CONTROL WITH BACKSIDE PATTERNING

THERMALLY STABLE HIGH-K TETRAGONAL HFO2 LAYER WITHIN HIGH ASPECT RA...

METHOD OF FABRICATING ISOLATED CAPACITORS AND STRUCTURE THEREOF

SEMICONDUCTOR DEVICE

ARRAY AND MOAT ISOLATION STRUCTURES AND METHOD OF MANUFACTURE

Method of Fabricating Isolated Capacitors and Structure Thereof

THERMALLY STABLE HIGH-K TETRAGONAL HFO2 LAYER WITHIN HIGH ASPECT RA...

ARRAY AND MOAT ISOLATION STRUCTURES AND METHOD OF MANUFACTURE

STRUCTURE AND METHOD FOR FORMING ISOLATION AND BURIED PLATE FOR TRE...

Method of Fabricating Isolated Capacitors and Structure Thereof

STRUCTURE AND METHOD FOR HARD MASK REMOVAL ON AN SOI SUBSTRATE WITH...

METHOD OF FABRICATING A DEEP TRENCH (DT) METAL-INSULATOR-METAL (MIM...

METHOD OF FABRICATION BODIES FOR AN EMBEDDED POLYSILICON RESISTOR A...

STRUCTURE AND METHOD FOR HARD MASK REMOVAL ON AN SOI SUBSTRATE WITH...

Semiconductor Device

Method of Fabricating Isolated Capacitors and Structure Thereof

ENHANCED CAPACITANCE DEEP TRENCH CAPACITOR FOR EDRAM

STRUCTURE AND METHOD FOR FORMING ISOLATION AND BURIED PLATE FOR TRE...

TRANSISTOR FORMATION USING CAPPING LAYER

METHOD OF SILICIDE FORMATION BY ADDING GRADED AMOUNT OF IMPURITY DU...

Semiconductor Devices and Methods of Manufacturing Thereof

Methods of Forming Field Effect Transistors Having Silicided Source...

Method of Forming Field Effect Transistors Using Diluted Hydrofluor...

SPACER UNDERCUT FILLER, METHOD OF MANUFACTURE THEREOF AND ARTICLES...

METHOD OF SILICIDE FORMATION FOR NANO STRUCTURES

Semiconductor devices and methods of manufacturing thereof