Oksana Kryachek

Person

San Francisco, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Probe system for QFP integrated circuit device test tooling
- Patent number 11,906,550
- Issue date Feb 20, 2024
- Essai, Inc.
- Nasser Barabi
- G01 - MEASURING TESTING
Information Patent Grant
Contactor with angled depressible probes in shifted bores
- Patent number 11,378,588
- Issue date Jul 5, 2022
- Essai, Inc.
- Nasser Barabi
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit device test tooling with dual angle cavities
- Patent number 11,293,976
- Issue date Apr 5, 2022
- Essai, Inc.
- Nasser Barabi
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for conforming device testers to integrated cir...
- Patent number 10,908,207
- Issue date Feb 2, 2021
- Essai, Inc.
- Nasser Barabi
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Contactor with angled depressible probes
- Patent number 10,481,175
- Issue date Nov 19, 2019
- Essai, Inc.
- Nasser Barabi
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for conforming test tooling to integrated circu...
- Patent number 10,126,356
- Issue date Nov 13, 2018
- Essai, Inc.
- Nasser Barabi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for conforming test tooling to integrated circu...
- Patent number 9,804,223
- Issue date Oct 31, 2017
- Essai, Inc.
- Nasser Barabi
- G01 - MEASURING TESTING
Information Patent Grant
Contactor with angled spring probes
- Patent number 9,766,268
- Issue date Sep 19, 2017
- Essai, Inc.
- Nasser Barabi
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for conforming test tooling to integrated circu...
- Patent number 9,557,373
- Issue date Jan 31, 2017
- Essai, Inc.
- Nasser Barabi
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for conforming test tooling to integrated circu...
- Patent number 9,494,642
- Issue date Nov 15, 2016
- Essai, Inc.
- Nasser Barabi
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for conforming device testers to integrated cir...
- Patent number 9,383,406
- Issue date Jul 5, 2016
- Essai, Inc.
- Nasser Barabi
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for conforming test tooling to integrated circu...
- Patent number 9,279,852
- Issue date Mar 8, 2016
- Essai, Inc.
- Nasser Barabi
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for conforming test tooling to integrated circu...
- Patent number 9,229,049
- Issue date Jan 5, 2016
- Essai, Inc.
- Nasser Barabi
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for conforming device testers to integrated cir...
- Patent number 9,007,080
- Issue date Apr 14, 2015
- Essai, Inc.
- Nasser Barabi
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for conforming device testers to integrated cir...
- Patent number 8,981,802
- Issue date Mar 17, 2015
- Essai, Inc.
- Nasser Barabi
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for thermal control of integrated circuits duri...
- Patent number 8,653,842
- Issue date Feb 18, 2014
- Essai, Inc.
- Nasser Barabi
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Grant
Spring contact pin for an ic test socket and the like
- Patent number 8,493,085
- Issue date Jul 23, 2013
- Essai, Inc.
- Nasser Barabi
- G01 - MEASURING TESTING
Information Patent Grant
Chip actuator cover assembly
- Patent number 7,651,340
- Issue date Jan 26, 2010
- Essai, Inc.
- Nasser Barabi
- G01 - MEASURING TESTING
Information Patent Grant
Contactor nest for an IC device and method
- Patent number 7,583,097
- Issue date Sep 1, 2009
- Essai, Inc.
- Nasser Barabi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CONTACTOR WITH ANGLED DEPRESSIBLE PROBES IN SHIFTED BORES
- Publication number 20220413010
- Publication date Dec 29, 2022
- ESSAI, INC.
- Nasser Barabi
- G01 - MEASURING TESTING
Information Patent Application
PROBE SYSTEM FOR QFP INTEGRATED CIRCUIT DEVICE TEST TOOLING
- Publication number 20220349918
- Publication date Nov 3, 2022
- ESSAI, INC.
- Nasser Barabi
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT DEVICE TEST TOOLING WITH DUAL ANGLE CAVITIES
- Publication number 20220099733
- Publication date Mar 31, 2022
- ESSAI, INC.
- Nasser Barabi
- G01 - MEASURING TESTING
Information Patent Application
CONTACTOR WITH ANGLED DEPRESSIBLE PROBES IN SHIFTED BORES
- Publication number 20210102972
- Publication date Apr 8, 2021
- ESSAI, INC.
- Nasser Barabi
- G01 - MEASURING TESTING
Information Patent Application
CONTACTOR WITH ANGLED DEPRESSIBLE PROBES
- Publication number 20200225264
- Publication date Jul 16, 2020
- ESSAI, INC.
- Nasser Barabi
- G01 - MEASURING TESTING
Information Patent Application
CONTACTOR WITH ANGLED DEPRESSIBLE PROBES
- Publication number 20180172730
- Publication date Jun 21, 2018
- ESSAI, INC.
- Nasser Barabi
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Conforming Device Testers to Integrated Cir...
- Publication number 20170030964
- Publication date Feb 2, 2017
- ESSAI, INC.
- Nasser Barabi
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR CONFORMING TEST TOOLING TO INTEGRATED CIRCU...
- Publication number 20160313390
- Publication date Oct 27, 2016
- ESSAI, INC.
- Nasser Barabi
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Application
SYSTEMS AND METHODS FOR CONFORMING TEST TOOLING TO INTEGRATED CIRCU...
- Publication number 20150309114
- Publication date Oct 29, 2015
- ESSAI, INC.
- Nasser Barabi
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Conforming Device Testers to Integrated Cir...
- Publication number 20150109009
- Publication date Apr 23, 2015
- ESSAI, INC.
- Nasser Barabi
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR CONFORMING TEST TOOLING TO INTEGRATED CIRCU...
- Publication number 20150022226
- Publication date Jan 22, 2015
- ESSAI, INC.
- Nasser Barabi
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR CONFORMING TEST TOOLING TO INTEGRATED CIRCU...
- Publication number 20140232426
- Publication date Aug 21, 2014
- ESSAI, INC.
- Nasser Barabi
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR CONFORMING TEST TOOLING TO INTEGRATED CIRCU...
- Publication number 20140055154
- Publication date Feb 27, 2014
- ESSAI, INC.
- Nasser Barabi
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR CONFORMING TEST TOOLING TO INTEGRATED CIRCU...
- Publication number 20140021972
- Publication date Jan 23, 2014
- ESSAI, INC.
- Nasser Barabi
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR CONFORMING TEST TOOLING TO INTEGRATED CIRC...
- Publication number 20140015556
- Publication date Jan 16, 2014
- Nasser Barabi
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Conforming Device Testers to Integrated Cir...
- Publication number 20130271170
- Publication date Oct 17, 2013
- Nasser Barabi
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Conforming Device Testers to Integrated Cir...
- Publication number 20130021049
- Publication date Jan 24, 2013
- Nasser Barabi
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Thermal Control of Integrated Circuits Duri...
- Publication number 20110214843
- Publication date Sep 8, 2011
- Nasser Barabi
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Application
SPRING CONTACT PIN FOR AN IC TEST SOCKET AND THE LIKE
- Publication number 20100277191
- Publication date Nov 4, 2010
- ESSAI, INC.
- Nasser Barabi
- G01 - MEASURING TESTING
Information Patent Application
Contactor nest for an IC device and method
- Publication number 20080265924
- Publication date Oct 30, 2008
- Nasser Barabi
- G01 - MEASURING TESTING
Information Patent Application
Chip actuator cover assembly
- Publication number 20080207037
- Publication date Aug 28, 2008
- Nasser Barabi
- G01 - MEASURING TESTING
Information Patent Application
Contactor with angled spring probes
- Publication number 20080150569
- Publication date Jun 26, 2008
- Nasser Barabi
- G01 - MEASURING TESTING
Information Patent Application
Spring contact pin for an IC chip tester
- Publication number 20070018666
- Publication date Jan 25, 2007
- Nasser Barabi
- G01 - MEASURING TESTING

Oksana Kryachek

Person

Patents Grantslast 30 patents

Probe system for QFP integrated circuit device test tooling

Contactor with angled depressible probes in shifted bores

Integrated circuit device test tooling with dual angle cavities

Systems and methods for conforming device testers to integrated cir...

Contactor with angled depressible probes

Systems and methods for conforming test tooling to integrated circu...

Systems and methods for conforming test tooling to integrated circu...

Contactor with angled spring probes

Systems and methods for conforming test tooling to integrated circu...

Systems and methods for conforming test tooling to integrated circu...

Systems and methods for conforming device testers to integrated cir...

Systems and methods for conforming test tooling to integrated circu...

Systems and methods for conforming test tooling to integrated circu...

Systems and methods for conforming device testers to integrated cir...

Systems and methods for conforming device testers to integrated cir...

Systems and methods for thermal control of integrated circuits duri...

Spring contact pin for an ic test socket and the like

Chip actuator cover assembly

Contactor nest for an IC device and method

Patents Applicationslast 30 patents

CONTACTOR WITH ANGLED DEPRESSIBLE PROBES IN SHIFTED BORES

PROBE SYSTEM FOR QFP INTEGRATED CIRCUIT DEVICE TEST TOOLING

INTEGRATED CIRCUIT DEVICE TEST TOOLING WITH DUAL ANGLE CAVITIES

CONTACTOR WITH ANGLED DEPRESSIBLE PROBES IN SHIFTED BORES

CONTACTOR WITH ANGLED DEPRESSIBLE PROBES

CONTACTOR WITH ANGLED DEPRESSIBLE PROBES

Systems and Methods for Conforming Device Testers to Integrated Cir...

SYSTEMS AND METHODS FOR CONFORMING TEST TOOLING TO INTEGRATED CIRCU...

SYSTEMS AND METHODS FOR CONFORMING TEST TOOLING TO INTEGRATED CIRCU...

Systems and Methods for Conforming Device Testers to Integrated Cir...

SYSTEMS AND METHODS FOR CONFORMING TEST TOOLING TO INTEGRATED CIRCU...

SYSTEMS AND METHODS FOR CONFORMING TEST TOOLING TO INTEGRATED CIRCU...

SYSTEMS AND METHODS FOR CONFORMING TEST TOOLING TO INTEGRATED CIRCU...

SYSTEMS AND METHODS FOR CONFORMING TEST TOOLING TO INTEGRATED CIRCU...

SYSTEMS AND METHODS FOR CONFORMING TEST TOOLING TO INTEGRATED CIRC...

Systems and Methods for Conforming Device Testers to Integrated Cir...

Systems and Methods for Conforming Device Testers to Integrated Cir...

Systems and Methods for Thermal Control of Integrated Circuits Duri...

SPRING CONTACT PIN FOR AN IC TEST SOCKET AND THE LIKE

Contactor nest for an IC device and method

Chip actuator cover assembly

Contactor with angled spring probes

Spring contact pin for an IC chip tester