Orazio Pasquale Forlenza

Person

Hopewell Junction, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Diagnostic enhancement for multiple instances of identical structures
- Patent number 11,378,623
- Issue date Jul 5, 2022
- International Business Machines Corporation
- Steven Michael Douskey
- G11 - INFORMATION STORAGE
Information Patent Grant
Selective test pattern processor
- Patent number 9,274,173
- Issue date Mar 1, 2016
- International Business Machines Corporation
- Donato O. Forlenza
- G01 - MEASURING TESTING
Information Patent Grant
Selective test pattern processor
- Patent number 9,274,172
- Issue date Mar 1, 2016
- International Business Machines Corporation
- Donato O. Forlenza
- G01 - MEASURING TESTING
Information Patent Grant
Logic-built-in-self-test diagnostic method for root cause identific...
- Patent number 9,244,757
- Issue date Jan 26, 2016
- International Business Machines Corporation
- Donato O. Forlenza
- G01 - MEASURING TESTING
Information Patent Grant
Logic-built-in-self-test diagnostic method for root cause identific...
- Patent number 9,244,756
- Issue date Jan 26, 2016
- International Business Machines Corporation
- Donato O. Forlenza
- G01 - MEASURING TESTING
Information Patent Grant
Implementing diagnosis of transitional scan chain defects using log...
- Patent number 8,086,924
- Issue date Dec 27, 2011
- International Business Machines Corporation
- Donato Orazio Forlenza
- G01 - MEASURING TESTING
Information Patent Grant
Implementing isolation of VLSI scan chain using ABIST test patterns
- Patent number 8,065,575
- Issue date Nov 22, 2011
- International Business Machines Corporation
- Donato Orazio Forlenza
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for performing logic built-in self-testing of...
- Patent number 7,934,134
- Issue date Apr 26, 2011
- International Business Machines Corporation
- Donato O. Forlenza
- G01 - MEASURING TESTING
Information Patent Grant
AC ABIST diagnostic method, apparatus and program product
- Patent number 7,930,601
- Issue date Apr 19, 2011
- International Business Machines Corporation
- Joseph Eckelman
- G11 - INFORMATION STORAGE
Information Patent Grant
Verification of array built-in self-test (ABIST) design-for-test/de...
- Patent number 7,921,346
- Issue date Apr 5, 2011
- International Business Machines Corporation
- Donato Orazio Forlenza
- G11 - INFORMATION STORAGE
Information Patent Grant
Automated system and processing for expedient diagnosis of broken s...
- Patent number 7,908,532
- Issue date Mar 15, 2011
- International Business Machines Corporation
- Joseph Eckelman
- G01 - MEASURING TESTING
Information Patent Grant
implementing deterministic based broken scan chain diagnostics
- Patent number 7,475,308
- Issue date Jan 6, 2009
- International Business Machines Corporation
- Adrian C. Anderson
- G01 - MEASURING TESTING
Information Patent Grant
Method, apparatus, and computer program product for diagnosing a sc...
- Patent number 7,395,470
- Issue date Jul 1, 2008
- International Business Machines Corporation
- Todd M. Burdine
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for implementing deterministic based broken scan chain diagn...
- Patent number 7,395,469
- Issue date Jul 1, 2008
- International Business Machines Corporation
- Adrian C. Anderson
- G01 - MEASURING TESTING
Information Patent Grant
Method, apparatus, and computer program product for diagnosing a sc...
- Patent number 7,392,449
- Issue date Jun 24, 2008
- International Business Machines Corporation
- Todd M. Burdine
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for selective scan chain diagnostics
- Patent number 7,234,090
- Issue date Jun 19, 2007
- International Business Machines Corporation
- Charles J. Blasi
- G01 - MEASURING TESTING
Information Patent Grant
ABIST-assisted detection of scan chain defects
- Patent number 7,225,374
- Issue date May 29, 2007
- International Business Machines Corporation
- Todd Michael Burdine
- G01 - MEASURING TESTING
Information Patent Grant
Automated BIST test pattern sequence generator software system and...
- Patent number 7,117,415
- Issue date Oct 3, 2006
- International Business Machines Corporation
- Donato O. Forlenza
- G01 - MEASURING TESTING
Information Patent Grant
Look ahead scan chain diagnostic method
- Patent number 6,308,290
- Issue date Oct 23, 2001
- International Business Machines Corporation
- Orazio P. Forlenza
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
DIAGNOSTIC ENHANCEMENT FOR MULTIPLE INSTANCES OF IDENTICAL STRUCTURES
- Publication number 20220178996
- Publication date Jun 9, 2022
- International Business Machines Corporation
- Steven Michael DOUSKEY
- G11 - INFORMATION STORAGE
Information Patent Application
LOGIC-BUILT-IN-SELF-TEST DIAGNOSTIC METHOD FOR ROOT CAUSE IDENTIFIC...
- Publication number 20160033570
- Publication date Feb 4, 2016
- International Business Machines Corporation
- Donato O. Forlenza
- G01 - MEASURING TESTING
Information Patent Application
LOGIC-BUILT-IN-SELF-TEST DIAGNOSTIC METHOD FOR ROOT CAUSE IDENTIFIC...
- Publication number 20160033571
- Publication date Feb 4, 2016
- International Business Machines Corporation
- Donato O. Forlenza
- G01 - MEASURING TESTING
Information Patent Application
SELECTIVE TEST PATTERN PROCESSOR
- Publication number 20150113350
- Publication date Apr 23, 2015
- International Business Machines Corporation
- Donato O. Forlenza
- G01 - MEASURING TESTING
Information Patent Application
SELECTIVE TEST PATTERN PROCESSOR
- Publication number 20150113349
- Publication date Apr 23, 2015
- International Business Machines Corporation
- Donato O. Forlenza
- G01 - MEASURING TESTING
Information Patent Application
VERIFICATION OF ARRAY BUILT-IN SELF-TEST (ABIST) DESIGN-FOR-TEST/DE...
- Publication number 20100115337
- Publication date May 6, 2010
- Donato Orazio Forlenza
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Implementing Diagnosis of Transitional Scan Chain Defects Using LBI...
- Publication number 20100095177
- Publication date Apr 15, 2010
- International Business Machines Corporation
- Donato Orazio Forlenza
- G01 - MEASURING TESTING
Information Patent Application
Implementing Isolation of VLSI Scan Chain Using ABIST Test Patterns
- Publication number 20100095169
- Publication date Apr 15, 2010
- International Business Machines Corporation
- Donato Orazio Forlenza
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR PERFORMING LOGIC BUILT-IN SELF-TESTING OF...
- Publication number 20090307548
- Publication date Dec 10, 2009
- Donato O. Forlenza
- G01 - MEASURING TESTING
Information Patent Application
AC ABIST Diagnostic Method, Apparatus and Program Product
- Publication number 20090217112
- Publication date Aug 27, 2009
- International Business Machines Corporation
- Joseph Eckelman
- G11 - INFORMATION STORAGE
Information Patent Application
AC Scan Diagnostic Method and Apparatus Utilizing Functional Archit...
- Publication number 20090210761
- Publication date Aug 20, 2009
- Donato O. Forlenza
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Automated System and Processing for Expedient Diagnosis of Broken S...
- Publication number 20090210763
- Publication date Aug 20, 2009
- International Business Machines Corporation
- Joseph Eckelman
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS, AND COMPUTER PROGRAM PRODUCT FOR IMPLEMENTING DETERMINIS...
- Publication number 20080189583
- Publication date Aug 7, 2008
- International Business Machines Corporation
- Adrian C. Anderson
- G01 - MEASURING TESTING
Information Patent Application
METHOD, APPARATUS, AND COMPUTER PROGRAM PRODUCT FOR DIAGNOSING A SC...
- Publication number 20080091999
- Publication date Apr 17, 2008
- International Business Machines Corporation
- Todd M. BURDINE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STATIC AND DYNAMIC LEARNING TEST GENERATION METHOD
- Publication number 20070260926
- Publication date Nov 8, 2007
- International Business Machines Corporation
- Donato O. Forlenza
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method, apparatus, and computer program product for diagnosing a sc...
- Publication number 20070011523
- Publication date Jan 11, 2007
- International Business Machines Corporation
- Todd M. Burdine
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for selective scan chain diagnostics
- Publication number 20060048028
- Publication date Mar 2, 2006
- International Business Machines Corporation
- Charles J. Blasi
- G01 - MEASURING TESTING
Information Patent Application
Method, apparatus, and computer program product for implementing de...
- Publication number 20050229057
- Publication date Oct 13, 2005
- International Business Machines Corporation
- Adrian C. Anderson
- G01 - MEASURING TESTING
Information Patent Application
Automated bist test pattern sequence generator software system and...
- Publication number 20050160339
- Publication date Jul 21, 2005
- International Business Machines Corporation
- Donato O. Forlenza
- G01 - MEASURING TESTING
Information Patent Application
ABIST-assisted detection of scan chain defects
- Publication number 20050138514
- Publication date Jun 23, 2005
- International Business Machines Corporation
- Todd Michael Burdine
- G01 - MEASURING TESTING

Orazio Pasquale Forlenza

Person

Patents Grantslast 30 patents

Diagnostic enhancement for multiple instances of identical structures

Selective test pattern processor

Selective test pattern processor

Logic-built-in-self-test diagnostic method for root cause identific...

Logic-built-in-self-test diagnostic method for root cause identific...

Implementing diagnosis of transitional scan chain defects using log...

Implementing isolation of VLSI scan chain using ABIST test patterns

Method and apparatus for performing logic built-in self-testing of...

AC ABIST diagnostic method, apparatus and program product

Verification of array built-in self-test (ABIST) design-for-test/de...

Automated system and processing for expedient diagnosis of broken s...

implementing deterministic based broken scan chain diagnostics

Method, apparatus, and computer program product for diagnosing a sc...

Method for implementing deterministic based broken scan chain diagn...

Method, apparatus, and computer program product for diagnosing a sc...

Method and apparatus for selective scan chain diagnostics

ABIST-assisted detection of scan chain defects

Automated BIST test pattern sequence generator software system and...

Look ahead scan chain diagnostic method

Patents Applicationslast 30 patents

DIAGNOSTIC ENHANCEMENT FOR MULTIPLE INSTANCES OF IDENTICAL STRUCTURES

LOGIC-BUILT-IN-SELF-TEST DIAGNOSTIC METHOD FOR ROOT CAUSE IDENTIFIC...

LOGIC-BUILT-IN-SELF-TEST DIAGNOSTIC METHOD FOR ROOT CAUSE IDENTIFIC...

SELECTIVE TEST PATTERN PROCESSOR

SELECTIVE TEST PATTERN PROCESSOR

VERIFICATION OF ARRAY BUILT-IN SELF-TEST (ABIST) DESIGN-FOR-TEST/DE...

Implementing Diagnosis of Transitional Scan Chain Defects Using LBI...

Implementing Isolation of VLSI Scan Chain Using ABIST Test Patterns

METHOD AND APPARATUS FOR PERFORMING LOGIC BUILT-IN SELF-TESTING OF...

AC ABIST Diagnostic Method, Apparatus and Program Product

AC Scan Diagnostic Method and Apparatus Utilizing Functional Archit...

Automated System and Processing for Expedient Diagnosis of Broken S...

APPARATUS, AND COMPUTER PROGRAM PRODUCT FOR IMPLEMENTING DETERMINIS...

METHOD, APPARATUS, AND COMPUTER PROGRAM PRODUCT FOR DIAGNOSING A SC...

STATIC AND DYNAMIC LEARNING TEST GENERATION METHOD

Method, apparatus, and computer program product for diagnosing a sc...

Method and apparatus for selective scan chain diagnostics

Method, apparatus, and computer program product for implementing de...

Automated bist test pattern sequence generator software system and...

ABIST-assisted detection of scan chain defects