Osam Ohba

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor integrated circuit device having a test circuit
- Patent number 5,764,654
- Issue date Jun 9, 1998
- Fujitsu Limited
- Osam Ohba
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for manufacturing a gate array integrated circuit device
- Patent number 4,584,653
- Issue date Apr 22, 1986
- Fujitsu Limited
- Samuel Chih
- G06 - COMPUTING CALCULATING COUNTING