Osamu Fujii

Person

Yokohama-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Image sensor and manufacturing method thereof
- Patent number 9,484,382
- Issue date Nov 1, 2016
- Kabushiki Kaisha Toshiba
- Hiroshi Ohno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Solid-state image sensing device manufacturing method and solid-sta...
- Patent number 9,318,520
- Issue date Apr 19, 2016
- Kabushiki Kaisha Toshiba
- Osamu Fujii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image sensor that includes a boundary region formed between a logic...
- Patent number 9,281,328
- Issue date Mar 8, 2016
- Kabushiki Kaisha Toshiba
- Hiroshi Ohno
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Solid-state image sensing device manufacturing method and solid-sta...
- Patent number 9,123,834
- Issue date Sep 1, 2015
- Kabushiki Kaisha Toshiba
- Osamu Fujii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image sensor including an image-sensing element region and logic ci...
- Patent number 9,059,060
- Issue date Jun 16, 2015
- Kabushiki Kaisha Toshiba
- Hiroshi Ohno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Manufacturing system for semiconductor device capable of controllin...
- Patent number 8,735,181
- Issue date May 27, 2014
- Kabushiki Kaisha Toshiba
- Osamu Fujii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with epitaxial crystal layer embedded within s...
- Patent number 8,390,028
- Issue date Mar 5, 2013
- Kabushiki Kaisha Toshiba
- Osamu Fujii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and manufacturing method thereof
- Patent number 7,737,466
- Issue date Jun 15, 2010
- Kabushiki Kaisha Toshiba
- Kaoru Hiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 7,605,442
- Issue date Oct 20, 2009
- Kabushiki Kaisha Toshiba
- Osamu Fujii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Manufacturing method of partial SOI wafer, semiconductor device usi...
- Patent number 7,071,039
- Issue date Jul 4, 2006
- Kabushiki Kaisha Toshiba
- Hajime Nagano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having one of patterned SOI and SON structure
- Patent number 6,906,384
- Issue date Jun 14, 2005
- Kabushiki Kaisha Toshiba
- Takashi Yamada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Manufacturing method of partial SOI wafer, semiconductor device usi...
- Patent number 6,531,754
- Issue date Mar 11, 2003
- Kabushiki Kaisha Toshiba
- Hajime Nagano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of fabricating the same
- Patent number 6,414,373
- Issue date Jul 2, 2002
- Kabushiki Kaisha Toshiba
- Hiroaki Yamada
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SOLID-STATE IMAGE SENSING DEVICE MANUFACTURING METHOD AND SOLID-STA...
- Publication number 20150333092
- Publication date Nov 19, 2015
- KABUSHIKI KAISHA TOSHIBA
- Osamu Fujii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE SENSOR AND MANUFACTURING METHOD THEREOF
- Publication number 20150228688
- Publication date Aug 13, 2015
- KABUSHIKI KAISHA TOSHIBA
- Hiroshi OHNO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOLID-STATE IMAGE SENSING DEVICE MANUFACTURING METHOD AND SOLID-STA...
- Publication number 20140077271
- Publication date Mar 20, 2014
- Kabushiki Kaisha Toshiba
- Osamu Fujii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE SENSOR AND MANUFACTURING METHOD THEREOF
- Publication number 20130221474
- Publication date Aug 29, 2013
- Kabushiki Kaisha Toshiba
- Hiroshi OHNO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE SENSOR AND MANUFACTURING METHOD THEREOF
- Publication number 20130221196
- Publication date Aug 29, 2013
- Kabushiki Kaisha Toshiba
- Hiroshi OHNO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20120091505
- Publication date Apr 19, 2012
- Kabushiki Kaisha Toshiba
- Osamu Fujii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MANUFACTURING SYSTEM FOR SEMICONDUCTOR DEVICE CAPABLE OF CONTROLLIN...
- Publication number 20090114853
- Publication date May 7, 2009
- Kabushiki Kaisha Toshiba
- Osamu FUJII
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME
- Publication number 20090101987
- Publication date Apr 23, 2009
- Kabushiki Kaisha Toshiba
- Kaoru HIYAMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20090101945
- Publication date Apr 23, 2009
- Kabushiki Kaisha Toshiba
- Rie YAMAGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20090057777
- Publication date Mar 5, 2009
- Kabushiki Kaisha Toshiba
- Osamu Fujii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and manufacturing method thereof
- Publication number 20070290208
- Publication date Dec 20, 2007
- Kabushiki Kaisha Toshiba
- Kaoru Hiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device
- Publication number 20060091475
- Publication date May 4, 2006
- Kabushiki Kaisha Toshiba
- Osamu Fujii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and manufacturing method thereof
- Publication number 20050151163
- Publication date Jul 14, 2005
- Kabushiki Kaisha Toshiba
- Kaoru Hiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device having one of patterned SOI and SON structure
- Publication number 20030201512
- Publication date Oct 30, 2003
- Takashi Yamada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device having one of patterned SOI and SON structure
- Publication number 20030151112
- Publication date Aug 14, 2003
- Takashi Yamada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Manufacturing method of partial SOI wafer, semiconductor device usi...
- Publication number 20030146488
- Publication date Aug 7, 2003
- Hajime Nagano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Dangerous process/pattern detection system and method, danger detec...
- Publication number 20030014146
- Publication date Jan 16, 2003
- Kabushiki Kaisha Toshiba
- Osamu Fujii
- G05 - CONTROLLING REGULATING
Information Patent Application
Semiconductor device and method of fabricating the same
- Publication number 20010055859
- Publication date Dec 27, 2001
- Kabushiki Kaisha Toshiba
- Hiroaki Yamada
- H01 - BASIC ELECTRIC ELEMENTS

Osamu Fujii

Person

Patents Grantslast 30 patents

Image sensor and manufacturing method thereof

Solid-state image sensing device manufacturing method and solid-sta...

Image sensor that includes a boundary region formed between a logic...

Solid-state image sensing device manufacturing method and solid-sta...

Image sensor including an image-sensing element region and logic ci...

Manufacturing system for semiconductor device capable of controllin...

Semiconductor device with epitaxial crystal layer embedded within s...

Semiconductor device and manufacturing method thereof

Semiconductor device

Manufacturing method of partial SOI wafer, semiconductor device usi...

Semiconductor device having one of patterned SOI and SON structure

Manufacturing method of partial SOI wafer, semiconductor device usi...

Semiconductor device and method of fabricating the same

Patents Applicationslast 30 patents

SOLID-STATE IMAGE SENSING DEVICE MANUFACTURING METHOD AND SOLID-STA...

IMAGE SENSOR AND MANUFACTURING METHOD THEREOF

SOLID-STATE IMAGE SENSING DEVICE MANUFACTURING METHOD AND SOLID-STA...

IMAGE SENSOR AND MANUFACTURING METHOD THEREOF

IMAGE SENSOR AND MANUFACTURING METHOD THEREOF

SEMICONDUCTOR DEVICE

MANUFACTURING SYSTEM FOR SEMICONDUCTOR DEVICE CAPABLE OF CONTROLLIN...

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME

SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE

Semiconductor device and manufacturing method thereof

Semiconductor device

Semiconductor device and manufacturing method thereof

Semiconductor device having one of patterned SOI and SON structure

Semiconductor device having one of patterned SOI and SON structure

Manufacturing method of partial SOI wafer, semiconductor device usi...

Dangerous process/pattern detection system and method, danger detec...

Semiconductor device and method of fabricating the same