Osamu NAGANO

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Multibeam scanning apparatus and multibeam scanning method
- Patent number 11,569,061
- Issue date Jan 31, 2023
- Kioxia Corporation
- Osamu Nagano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Antitumor agent
- Patent number 11,376,266
- Issue date Jul 5, 2022
- Keio University
- Hideyuki Saya
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Defect inspection apparatus and defect inspection method
- Patent number 10,803,576
- Issue date Oct 13, 2020
- TOSHIBA MEMORY CORPORATION
- Kenji Wakisaka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 10,677,743
- Issue date Jun 9, 2020
- TOSHIBA MEMORY CORPORATION
- Keitarou Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Pattern inspection method using charged particle beam
- Patent number 10,309,913
- Issue date Jun 4, 2019
- TOSHIBA MEMORY CORPORATION
- Osamu Nagano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Signal processing method and signal processing apparatus
- Patent number 9,960,010
- Issue date May 1, 2018
- TOSHIBA MEMORY CORPORATION
- Motoki Kadowaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cancer stem cell proliferation inhibitor and intracellular active o...
- Patent number 9,814,707
- Issue date Nov 14, 2017
- Keio University
- Hideyuki Saya
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Defect inspection apparatus, defect inspection method, and semicond...
- Patent number 8,357,895
- Issue date Jan 22, 2013
- Kabushiki Kaisha Toshiba
- Osamu Nagano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern inspection method, pattern inspection apparatus and semicon...
- Patent number 8,121,390
- Issue date Feb 21, 2012
- Kabushiki Kaisha Toshiba
- Osamu Nagano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern inspection apparatus, pattern inspection method, and manufa...
- Patent number 8,090,186
- Issue date Jan 3, 2012
- Kabushiki Kaisha Toshiba
- Osamu Nagano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Reclining device
- Patent number 7,722,121
- Issue date May 25, 2010
- Shiroki Kogyo Co., Ltd.
- Hidehiko Fujioka
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Charged particle beam apparatus, defect correcting method, etching...
- Patent number 7,692,163
- Issue date Apr 6, 2010
- Kabushiki Kaisha Toshiba
- Osamu Nagano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Interconnection pattern inspection method, manufacturing method of...
- Patent number 7,640,138
- Issue date Dec 29, 2009
- Kabushiki Kaisha Toshiba
- Osamu Nagano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus, charged particle beam control meth...
- Patent number 7,491,945
- Issue date Feb 17, 2009
- Kabushiki Kaisha Toshiba
- Osamu Nagano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Flash memory and method for controlling the memory
- Patent number 7,487,286
- Issue date Feb 3, 2009
- Spansion LLC
- Osamu Nagano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged beam exposure apparatus, charged beam control method and ma...
- Patent number 7,304,320
- Issue date Dec 4, 2007
- Kabushiki Kaisha Toshiba
- Osamu Nagano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam lithography system, pattern drawing method, a...
- Patent number 7,109,501
- Issue date Sep 19, 2006
- Kabushiki Kaisha Toshiba
- Osamu Nagano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus, charged particle detection method,...
- Patent number 7,095,023
- Issue date Aug 22, 2006
- Kabushiki Kaisha Toshiba
- Osamu Nagano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Catalyst for use in catalytic oxidation or ammoxidation of propane...
- Patent number 7,087,551
- Issue date Aug 8, 2006
- Asahi Kasei Kabushiki Kaisha
- Satoru Komada
- C07 - ORGANIC CHEMISTRY
Information Patent Grant
Interconnection pattern inspection method, manufacturing method of...
- Patent number 7,047,154
- Issue date May 16, 2006
- Kabushiki Kaisha Toshiba
- Osamu Nagano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Oxide catalyst composition
- Patent number 7,012,039
- Issue date Mar 14, 2006
- ASAHI KASEI CHEMICALS CORPORATION
- Toru Watanabe
- C07 - ORGANIC CHEMISTRY
Information Patent Grant
Charged particle beam lithography system, lithography method using...
- Patent number 6,940,080
- Issue date Sep 6, 2005
- Kabushiki Kaisha Toshiba
- Osamu Nagano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam exposure system
- Patent number 6,815,698
- Issue date Nov 9, 2004
- Kabushiki Kaisha Toshiba
- Osamu Nagano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Eddy current loss measuring sensor, thickness measuring system, thi...
- Patent number 6,563,308
- Issue date May 13, 2003
- Kabushiki Kaisha Toshiba
- Osamu Nagano
- G01 - MEASURING TESTING
Information Patent Grant
Laser beam branching apparatus
- Patent number 6,008,469
- Issue date Dec 28, 1999
- Mitsubishi Denki Kabushiki Kaisha
- Atsuhiko Kawamura
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Laser machining apparatus with feed forward and feedback control
- Patent number 5,961,857
- Issue date Oct 5, 1999
- Mitsubishi Denki Kabushiki Kaisha
- Teiji Takahashi
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Laser machining apparatus and method of controlling same
- Patent number 5,841,096
- Issue date Nov 24, 1998
- Mitsubishi Denki Kabushiki Kaisha
- Teiji Takahashi
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method for producing methacrolein
- Patent number 5,728,894
- Issue date Mar 17, 1998
- Ashahi Kasei Kogyo Kabushiki Kaisha
- Osamu Nagano
- C07 - ORGANIC CHEMISTRY
Information Patent Grant
Pulse welding apparatus
- Patent number 5,726,419
- Issue date Mar 10, 1998
- Mitsubishi Denki Kabushiki Kaisha
- Yoichiro Tabata
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Ammoxidation catalyst composition, and process for producing acrylo...
- Patent number 5,658,842
- Issue date Aug 19, 1997
- Asahi Kasei Kogyo Kabushiki Kaisha
- Hideo Midorikawa
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL

Patents Applicationslast 30 patents

Information Patent Application
ANTITUMOR AGENT AND COMPOUNDING AGENT
- Publication number 20220347125
- Publication date Nov 3, 2022
- KEIO UNIVERSITY
- Hideyuki SAYA
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
MULTIBEAM SCANNING APPARATUS AND MULTIBEAM SCANNING METHOD
- Publication number 20220301814
- Publication date Sep 22, 2022
- KIOXIA Corporation
- Osamu NAGANO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION METHOD AND INSPECTION APPARATUS
- Publication number 20210043417
- Publication date Feb 11, 2021
- Kioxia Corporation
- Osamu NAGANO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANTITUMOR AGENT
- Publication number 20200261476
- Publication date Aug 20, 2020
- KEIO UNIVERSITY
- Hideyuki SAYA
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD
- Publication number 20190244336
- Publication date Aug 8, 2019
- Toshiba Memory Corporation
- Kenji WAKISAKA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN INSPECTION METHOD USING CHARGED PARTICLE BEAM
- Publication number 20180335396
- Publication date Nov 22, 2018
- Toshiba Memory Corporation
- Osamu NAGANO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CANCER STEM CELL PROLIFERATION INHIBITOR AND INTRACELLULAR ACTIVE O...
- Publication number 20170105984
- Publication date Apr 20, 2017
- KEIO UNIVERSITY
- Hideyuki SAYA
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD
- Publication number 20160093465
- Publication date Mar 31, 2016
- KABUSHIKI KAISHA TOSHIBA
- Osamu NAGANO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS, IMAGE ACQUIRING METHOD AND NON-TRA...
- Publication number 20150241369
- Publication date Aug 27, 2015
- KABUSHIKI KAISHA TOSHIBA
- Osamu NAGANO
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL PROCESSING METHOD AND SIGNAL PROCESSING APPARATUS
- Publication number 20130245989
- Publication date Sep 19, 2013
- Kabushiki Kaisha Toshiba
- Motoki KADOWAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEFECT INSPECTION APPARATUS, DEFECT INSPECTION METHOD, AND SEMICOND...
- Publication number 20100081217
- Publication date Apr 1, 2010
- Osamu Nagano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PATTERN INSPECTION APPARATUS, PATTERN INSPECTION METHOD, AND MANUFA...
- Publication number 20090252402
- Publication date Oct 8, 2009
- Osamu NAGANO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN INSPECTION METHOD, PATTERN INSPECTION APPARATUS AND SEMICON...
- Publication number 20090041334
- Publication date Feb 12, 2009
- Osamu NAGANO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Reclining Device
- Publication number 20080093903
- Publication date Apr 24, 2008
- SHIROKI KOGYO CO., LTD.
- Hidehiko Fujioka
- B60 - VEHICLES IN GENERAL
Information Patent Application
Charged particle beam apparatus, defect correcting method, etching...
- Publication number 20070187622
- Publication date Aug 16, 2007
- Osamu Nagano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Interconnection pattern inspection method, manufacturing method of...
- Publication number 20060167650
- Publication date Jul 27, 2006
- Kabushiki Kaisha Toshiba
- Osamu Nagano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged beam exposure apparatus, charged beam control method and ma...
- Publication number 20060108546
- Publication date May 25, 2006
- Osamu Nagano
- B82 - NANO-TECHNOLOGY
Information Patent Application
Charged particle beam apparatus, charged particle beam control meth...
- Publication number 20050199827
- Publication date Sep 15, 2005
- Osamu Nagano
- B82 - NANO-TECHNOLOGY
Information Patent Application
Flash memory and method for controlling the memory
- Publication number 20050166005
- Publication date Jul 28, 2005
- FUJITSU LIMITED
- Osamu Nagano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Charged particle beam apparatus, charged particle detection method,...
- Publication number 20050139789
- Publication date Jun 30, 2005
- Osamu Nagano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle beam lithography system, pattern drawing method, a...
- Publication number 20050109955
- Publication date May 26, 2005
- Osamu Nagano
- B82 - NANO-TECHNOLOGY
Information Patent Application
Oxide catalyst composition
- Publication number 20050032639
- Publication date Feb 10, 2005
- Toru Watanabe
- C07 - ORGANIC CHEMISTRY
Information Patent Application
Interconnection pattern inspection method, manufacturing method of...
- Publication number 20040196031
- Publication date Oct 7, 2004
- Osamu Nagano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle beam lithography system, lithography method using...
- Publication number 20040029046
- Publication date Feb 12, 2004
- Osamu Nagano
- B82 - NANO-TECHNOLOGY
Information Patent Application
Catalyst for use in catalytic oxidation or ammoxidation of propane...
- Publication number 20030088118
- Publication date May 8, 2003
- Satoru Komada
- C07 - ORGANIC CHEMISTRY
Information Patent Application
EDDY CURRENT LOSS MEASURING SENSOR, THICKNESS MEASURING SYSTEM, THI...
- Publication number 20030067298
- Publication date Apr 10, 2003
- Kabushiki Kaisha Toshiba
- Osamu Nagano
- G01 - MEASURING TESTING
Information Patent Application
Charged particle beam exposure system
- Publication number 20020033458
- Publication date Mar 21, 2002
- Osamu Nagano
- B82 - NANO-TECHNOLOGY

Osamu NAGANO

Person

Patents Grantslast 30 patents

Multibeam scanning apparatus and multibeam scanning method

Antitumor agent

Defect inspection apparatus and defect inspection method

Inspection apparatus and inspection method

Pattern inspection method using charged particle beam

Signal processing method and signal processing apparatus

Cancer stem cell proliferation inhibitor and intracellular active o...

Defect inspection apparatus, defect inspection method, and semicond...

Pattern inspection method, pattern inspection apparatus and semicon...

Pattern inspection apparatus, pattern inspection method, and manufa...

Reclining device

Charged particle beam apparatus, defect correcting method, etching...

Interconnection pattern inspection method, manufacturing method of...

Charged particle beam apparatus, charged particle beam control meth...

Flash memory and method for controlling the memory

Charged beam exposure apparatus, charged beam control method and ma...

Charged particle beam lithography system, pattern drawing method, a...

Charged particle beam apparatus, charged particle detection method,...

Catalyst for use in catalytic oxidation or ammoxidation of propane...

Interconnection pattern inspection method, manufacturing method of...

Oxide catalyst composition

Charged particle beam lithography system, lithography method using...

Charged particle beam exposure system

Eddy current loss measuring sensor, thickness measuring system, thi...

Laser beam branching apparatus

Laser machining apparatus with feed forward and feedback control

Laser machining apparatus and method of controlling same

Method for producing methacrolein

Pulse welding apparatus

Ammoxidation catalyst composition, and process for producing acrylo...

Patents Applicationslast 30 patents

ANTITUMOR AGENT AND COMPOUNDING AGENT

MULTIBEAM SCANNING APPARATUS AND MULTIBEAM SCANNING METHOD

INSPECTION METHOD AND INSPECTION APPARATUS

ANTITUMOR AGENT

DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD

PATTERN INSPECTION METHOD USING CHARGED PARTICLE BEAM

CANCER STEM CELL PROLIFERATION INHIBITOR AND INTRACELLULAR ACTIVE O...

DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD

CHARGED PARTICLE BEAM APPARATUS, IMAGE ACQUIRING METHOD AND NON-TRA...

SIGNAL PROCESSING METHOD AND SIGNAL PROCESSING APPARATUS

DEFECT INSPECTION APPARATUS, DEFECT INSPECTION METHOD, AND SEMICOND...

PATTERN INSPECTION APPARATUS, PATTERN INSPECTION METHOD, AND MANUFA...

PATTERN INSPECTION METHOD, PATTERN INSPECTION APPARATUS AND SEMICON...

Reclining Device

Charged particle beam apparatus, defect correcting method, etching...

Interconnection pattern inspection method, manufacturing method of...

Charged beam exposure apparatus, charged beam control method and ma...

Charged particle beam apparatus, charged particle beam control meth...

Flash memory and method for controlling the memory

Charged particle beam apparatus, charged particle detection method,...

Charged particle beam lithography system, pattern drawing method, a...

Oxide catalyst composition

Interconnection pattern inspection method, manufacturing method of...

Charged particle beam lithography system, lithography method using...

Catalyst for use in catalytic oxidation or ammoxidation of propane...

EDDY CURRENT LOSS MEASURING SENSOR, THICKNESS MEASURING SYSTEM, THI...

Charged particle beam exposure system