Paul Johannes L. Barends

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Oisterwijk, NL

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Patents Grantslast 30 patents

Information Patent Grant
Circuit probe for charged particle beam system
- Patent number 9,709,600
- Issue date Jul 18, 2017
- FEI Company
- Paul Johannes L. Barends
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Circuit Probe for Charged Particle Beam System
- Publication number 20150048815
- Publication date Feb 19, 2015
- FEI Company
- Paul Johannes L. Barends
- G01 - MEASURING TESTING