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Paul Moroz
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Marblehead, MA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Electron beam enhanced surface wave plasma source
Patent number
7,998,307
Issue date
Aug 16, 2011
Tokyo Electron Limited
Lee Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Radial line slot antenna having a conductive layer
Patent number
7,938,081
Issue date
May 10, 2011
Tokyo Electron Limited
Lee Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and system for arc suppression in a plasma processing system
Patent number
7,199,327
Issue date
Apr 3, 2007
Tokyo Electron Limited
Paul Moroz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Plasma chamber wall segment temperature control
Patent number
7,186,313
Issue date
Mar 6, 2007
Tokyo Electron Limited
Andrej S Mitrovic
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for rapid temperature change and control
Patent number
7,141,763
Issue date
Nov 28, 2006
Tokyo Electron Limited
Paul Moroz
F27 - FURNACES KILNS OVENS RETORTS
Information
Patent Grant
Method and apparatus for reducing substrate charging damage
Patent number
7,109,122
Issue date
Sep 19, 2006
Tokyo Electron Limited
Paul Moroz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus and method for determining clamping status of semiconduct...
Patent number
7,073,383
Issue date
Jul 11, 2006
Tokyo Electron Limited
William Jones
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for efficient temperature control using a cont...
Patent number
6,992,892
Issue date
Jan 31, 2006
Tokyo Electron Limited
Paul Moroz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Plasma processing apparatus for spatial control of dissociation and...
Patent number
6,887,341
Issue date
May 3, 2005
Tokyo Electron Limited
Eric J. Strang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Branching RF antennas and plasma processing apparatus
Patent number
6,868,800
Issue date
Mar 22, 2005
Tokyo Electron Limited
Paul Moroz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Plasma processing apparatus and method of controlling chemistry
Patent number
6,674,241
Issue date
Jan 6, 2004
Tokyo Electron Limited
Eric J. Strang
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
PLASMA PROCESSING APPARATUS
Publication number
20100307684
Publication date
Dec 9, 2010
TOKYO ELECTRON LIMITED
Ryosaku Ota
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Method and apparatus for temperature change and control
Publication number
20090095451
Publication date
Apr 16, 2009
TOKYO ELECTRON LIMITED
Paul Moroz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Radial line slot antenna having a conductive layer
Publication number
20080060760
Publication date
Mar 13, 2008
TOKYO ELECTRON LIMITED
Lee Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Electron beam enhanced surface wave plasma source
Publication number
20080060759
Publication date
Mar 13, 2008
TOKYO ELECTRON LIMITED
Lee Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Plasma chamber wall segment temperature control
Publication number
20070131650
Publication date
Jun 14, 2007
TOKYO ELECTRON LIMITED
Andrej S. Mitrovic
G05 - CONTROLLING REGULATING
Information
Patent Application
Plasma chamber wall segment temperature control
Publication number
20070113976
Publication date
May 24, 2007
TOKYO ELECTRON LIMITED
Andrej S. Mitrovic
G05 - CONTROLLING REGULATING
Information
Patent Application
Plasma chamber wall segment temperature control
Publication number
20070114206
Publication date
May 24, 2007
TOKYO ELECTRON LIMITED
Andrej S. Mitrovic
G05 - CONTROLLING REGULATING
Information
Patent Application
Method and apparatus for measuring plasma density in processing rea...
Publication number
20070074811
Publication date
Apr 5, 2007
Paul Moroz
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Method and apparatus for measuring plasma density in processing rea...
Publication number
20070075036
Publication date
Apr 5, 2007
Paul Moroz
G01 - MEASURING TESTING
Information
Patent Application
Intelligent system for detection of process status, process fault a...
Publication number
20060259198
Publication date
Nov 16, 2006
TOKYO ELECTRON LIMITED
Jozef Brcka
G05 - CONTROLLING REGULATING
Information
Patent Application
Method and system for arc suppression in a plasma processing system
Publication number
20060081564
Publication date
Apr 20, 2006
TOKYO ELECTRON LIMITED
Paul Moroz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Plasma processing system and method
Publication number
20060060303
Publication date
Mar 23, 2006
TOKYO ELECTRON LIMITED
Steven T. Fink
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method and system for substrate temperature profile control
Publication number
20060027169
Publication date
Feb 9, 2006
TOKYO ELECTRON LIMITED
Yuji Tsukamoto
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
Method and apparatus for temperature change and control
Publication number
20050229854
Publication date
Oct 20, 2005
TOKYO ELECTRON LIMITED
Paul Moroz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method and apparatus for rapid temperature change and control
Publication number
20050211694
Publication date
Sep 29, 2005
TOKYO ELECTRON LIMITED
Paul Moroz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method and apparatus for efficient temperature control using a cont...
Publication number
20050068736
Publication date
Mar 31, 2005
TOKYO ELECTRON LIMITED
Paul Moroz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Plasma chamber wall segment temperature control
Publication number
20040211660
Publication date
Oct 28, 2004
TOKYO ELECTRON LIMITED
Andrej S. Mitrovic
G05 - CONTROLLING REGULATING
Information
Patent Application
Hybrid plasma processing apparatus
Publication number
20040194890
Publication date
Oct 7, 2004
TOKYO ELECTRON LIMITED
Paul Moroz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Apparatus and method for determining clamping status of semiconduct...
Publication number
20040149041
Publication date
Aug 5, 2004
William Jones
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for reducing substrate charging damage
Publication number
20040104358
Publication date
Jun 3, 2004
TOKYO ELECTRON LIMITED
Paul Moroz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Plasma processing apparatus for spatial control of dissociation and...
Publication number
20030094238
Publication date
May 22, 2003
Eric J. Strang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Branching RF antennas and plasma processing apparatus
Publication number
20030062840
Publication date
Apr 3, 2003
TOKYO ELECTRON LIMITED
Paul Moroz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Plasma processing apparatus and method of controlling chemistry
Publication number
20030020411
Publication date
Jan 30, 2003
TOKYO ELECTRON LIMITED
Eric J. Strang
H01 - BASIC ELECTRIC ELEMENTS