Paul R. Unruh

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Oro Valley, AZ, US

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Patents Grantslast 30 patents

Information Patent Grant
Measurement of object deformation with optical profiler
- Patent number 7,283,250
- Issue date Oct 16, 2007
- Veeco Instruments, Inc.
- Joanna Schmit
- G01 - MEASURING TESTING
Information Patent Grant
Film thickness and boundary characterization by interferometric pro...
- Patent number 7,119,909
- Issue date Oct 10, 2006
- Veeco Instruments, Inc.
- Paul R. Unruh
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and Apparatus of Analyzing Sample Surface Data
- Publication number 20120265487
- Publication date Oct 18, 2012
- Bruker Nano, Inc.
- Emilio Yanine
- G01 - MEASURING TESTING
Information Patent Application
Film thickness and boundary characterization by interferometric pro...
- Publication number 20050280829
- Publication date Dec 22, 2005
- Paul R. Unruh
- G01 - MEASURING TESTING
Information Patent Application
Measurement of object deformation with optical profiler
- Publication number 20050157306
- Publication date Jul 21, 2005
- Joanna Schmit
- G01 - MEASURING TESTING