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Paul W. Rutkowski
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Morris Plains, NJ, US
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last 30 patents
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Patent Grant
Boundary scan cell
Patent number
5,490,151
Issue date
Feb 6, 1996
AT&T Corp.
William E. Feger
G01 - MEASURING TESTING
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Patent Grant
Pseudo-exhaustive self-test technique
Patent number
5,457,697
Issue date
Oct 10, 1995
AT&T IPM Corp.
John A. Malleo-Roach
G01 - MEASURING TESTING
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Patent Grant
Pseudo-exhaustive self-test technique
Patent number
5,187,712
Issue date
Feb 16, 1993
AT&T Bell Laboratories
John A. Malleo-Roach
G01 - MEASURING TESTING
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Patent Grant
Method and apparatus for generating control signals
Patent number
5,048,021
Issue date
Sep 10, 1991
AT&T Bell Laboratories
Najmi T. Jarwala
G01 - MEASURING TESTING